SPRAD52 August 2022 AM2431 , AM2432 , AM2434 , AM6411 , AM6412 , AM6421 , AM6422 , AM6441 , AM6442
Calculating Useful Lifetimes of Embedded Processors provides a methodology for calculating the useful lifetime of TI embedded processors under power when used in electronic systems. It discusses the stages of reliability, the useful life period, and complementary metal-oxide semiconductor (CMOS) wear-out mechanisms. The primary wear-out mechanism discussed in the application note was electro-migration.
As each semiconductor process node is unique, some wear-out mechanism may affect the estimated lifetime of the devices in different ways.
For the AM64x/AM243x, the following CMOS wear-out mechanisms were evaluated to extend the estimated operational lifetime of the device:
The guidelines detailed in the next section were generated as a result of that evaluation.