SPRUHM8K December 2013 – May 2024 TMS320F28374D , TMS320F28375D , TMS320F28376D , TMS320F28377D , TMS320F28377D-EP , TMS320F28377D-Q1 , TMS320F28378D , TMS320F28379D , TMS320F28379D-Q1
The following sections describe the operational highlights and configuration options for the trip-zone submodule.
The trip-zone signals TZ1 to TZ6 (also collectively referred to as TZn) are active-low input signals. When one of these signals goes low, or when a DCAEVT1/2 or DCBEVT1/2 force happens based on the TZDCSEL register event selection, the indication is that a trip event has occurred. Each ePWM module can be individually configured to ignore or use each of the trip-zone signals or DC events. Which trip-zone signals or DC events are used by a particular ePWM module is determined by the TZSEL register for that specific ePWM module. The trip-zone signals can or cannot be synchronized to the ePWMclock (EPWMCLK) and digitally filtered within the GPIO MUX block. A minimum of 3*TBCLK low pulse width on TZn inputs is sufficient to trigger a fault condition on the ePWM module. If the pulse width is less than this, the trip condition cannot be latched by CBC or OST latches. The asynchronous trip makes sure that if clocks are missing for any reason, the outputs can still be tripped by a valid event present on TZn inputs. The GPIOs or peripherals must be appropriately configured. For more information, see the System Control and Interrupts chapter.
Each TZn input can be individually configured to provide either a cycle-by-cycle or one-shot trip event for an ePWM module. DCAEVT1 and DCBEVT1 events can be configured to directly trip an ePWM module or provide a one-shot trip event to the module. Likewise, DCAEVT2 and DCBEVT2 events can also be configured to directly trip an ePWM module or provide a cycle-by-cycle trip event to the module. This configuration is determined by the TZSEL[DCAEVT1/2], TZSEL[DCBEVT1/2], TZSEL[CBCn], and TZSEL[OSHTn] control bits (where n corresponds to the trip input), respectively.
When a cycle-by-cycle trip event occurs, the action specified in the TZCTL[TZA] and TZCTL[TZB] bits is carried out immediately on the EPWMxA and EPWMxB outputs. Table 15-12 lists some of the possible actions. Independent actions can be specified based on the occurrence of the event while the counter is counting up or while the counter is counting down by appropriately configuring bits in the TZCTL2 register. Actions specified in the TZCTL2 register take effect only when the ETZE bit in TZCTL2 is set.
Additionally, when a cycle-by-cycle trip event occurs, the cycle-by-cycle trip event flag (TZFLG[CBC]) is set and a EPWMx_TZINT interrupt is generated when enabled in the TZEINT register and interrupt controller. A corresponding flag for the event that caused the CBC event is also set in register TZCBCFLG.
If the CBC interrupt is enabled using the TZEINT register and DCAEVT2 or DCBEVT2 are selected as CBC trip sources using the TZSEL register, it is not necessary to also enable the DCAEVT2 or DCBEVT2 interrupts in the TZEINT register, as the DC events trigger interrupts through the CBC mechanism.
The specified condition on the inputs is automatically cleared based on the selection made with TZCLR[CBCPULSE] if the trip event is no longer present. Therefore, in this mode, the trip event is cleared or reset every PWM cycle. The TZFLG[CBC] and TZCBCFLG flag bits remain set until the flag bits are manually cleared by writing to the TZCLR[CBC] and TZCBCCLR flag bits. If the cycle-by-cycle trip event is still present when the TZFLG[CBC] and TZCBCFLG register bits are cleared, then these bits are again immediately set.
When a one-shot trip event occurs, the action specified in the TZCTL[TZA] and TZCTL[TZB] bits is carried out immediately on the EPWMxA and EPWMxB output. Table 15-12 lists some of the possible actions. Independent actions can be specified based on the occurrence of the event while the counter is counting up and while the counter is counting down by appropriately configuring bits in TZCTL2 register. Actions specified in TZCTL2 register take effect only when ETZE bit in TZCTL2 is set.
Additionally, when a one-shot trip event occurs, the one-shot trip event flag (TZFLG[OST]) is set and a EPWMx_TZINT interrupt is generated when enabled in the TZEINT register and interrupt controller. A corresponding flag for the event that caused the OST event is also set in register TZOSTFLG. The one-shot trip condition must be cleared manually by writing to the TZCLR[OST] bit. If desired, the TZOSTFLG register bit can be cleared by manually writing to the corresponding bit in the TZOSTCLR register.
If the one-shot interrupt is enabled using the TZEINT register and DCAEVT1 or DCBEVT1 are selected as OSHT trip sources using the TZSEL register, it is not necessary to also enable the DCAEVT1 or DCBEVT1 interrupts in the TZEINT register, as the DC events trigger interrupts through the OSHT mechanism.
A digital compare DCAEVT1/2 or DCBEVT1/2 event is generated based on a combination of the DCAH/DCAL and DCBH/DCBL signals as selected by the TZDCSEL register. The signals which source the DCAH/DCAL and DCBH/DCBL signals are selected using the DCTRIPSEL register and can be either trip zone input pins or analog comparator CMPSSx signals. For more information on the digital compare submodule signals, see Section 15.11.
When a digital compare event occurs, the action specified in the TZCTL[DCAEVT1/2] and TZCTL[DCBEVT1/2] bits is carried out immediately on the EPWMxA and EPWMxB output. Table 15-12 lists the possible actions. Independent actions can be specified based on the occurrence of the event while the counter is counting up and while the counter is counting down by appropriately configuring bits in TZCTLDCA and TZCTLDCB register. Actions specified in TZCTLDCA and TZCTLDCB registers take effect only when ETZE bit in TZCTL2 is set.
In addition, the relevant DC trip event flag (TZFLG[DCAEVT1/2] / TZFLG[DCBEVT1/2]) is set and a EPWMx_TZINT interrupt is generated when enabled in the TZEINT register and interrupt controller.
The specified condition on the pins is automatically cleared when the DC trip event is no longer present. The TZFLG[DCAEVT1/2] or TZFLG[DCBEVT1/2] flag bit remains set until the flag is manually cleared by writing to the TZCLR[DCAEVT1/2] or TZCLR[DCBEVT1/2] bit. If the DC trip event is still present when the TZFLG[DCAEVT1/2] or TZFLG[DCBEVT1/2] flag is cleared, then the flag is again immediately set.
The action taken when a trip event occurs can be configured individually for each of the ePWM output pins by way of the TZCTL, TZCTL2, TZCTLDCA, and TZCTLDCB register bit fields. Some of the possible actions, shown in Table 15-12, can be taken on a trip event.
TZCTL Register Bitfield Settings | EPWMxA and EPWMxB |
Comment |
---|---|---|
0,0 | High-Impedance | Tripped |
0,1 | Force to High State | Tripped |
1,0 | Force to Low State | Tripped |
1,1 | No Change | Do Nothing. No change is made to the output. |