SPRUHX5I August 2014 – May 2024 TMS320F28374S , TMS320F28375S , TMS320F28375S-Q1 , TMS320F28376S , TMS320F28377S , TMS320F28377S-Q1 , TMS320F28378S , TMS320F28379S
As described in Section 14.11.1, trip zone inputs (TZ1, TZ2, and TZ3) and CMPSSx signals from the analog comparator (COMP) module can be selected using the DCTRIPSEL bits to generate the Digital Compare A High and Low (DCAH/L) and Digital Compare B High and Low (DCBH/L) signals. Then, the configuration of the TZDCSEL register qualifies the actions on the selected DCAH/L and DCBH/L signals, which generate the DCAEVT1/2 and DCBEVT1/2 events (Event Qualification A and B).
The DCAEVT1/2 and DCBEVT1/2 events can then be filtered to provide a filtered version of the event signals (DCEVTFILT) or the filtering can be bypassed. Filtering is discussed further in Event Filtering. Either the DCAEVT1/2 and DCBEVT1/2 event signals or the filtered DCEVTFILT event signals can generate a force to the trip zone module, a TZ interrupt, an ADC SOC, or a PWM sync signal.
The priority of conflicting actions on the TZCTL, TZCTL2, TZCTLDCA and TZCTLDCB registers is as follows (highest priority overrides lower priority):
Output EPWMxA:
Output EPWMxB:
Figure 14-51 and Figure 14-52 show how the DCAEVT1, DCAEVT2, or DCEVTFLT signals are processed to generate the digital compare A event force, interrupt, soc, and sync signals.
Figure 14-53 and Figure 14-54 show how the DCBEVT1, DCBEVT2, or DCEVTFLT signals are processed to generate the digital compare B event force, interrupt, soc, and sync signals.