SPRZ272N September   2007  – April 2022 SM320F28335-EP , SM320F28335-HT , TMS320F28232 , TMS320F28232-Q1 , TMS320F28234 , TMS320F28234-Q1 , TMS320F28235 , TMS320F28235-Q1 , TMS320F28332 , TMS320F28333 , TMS320F28334 , TMS320F28335 , TMS320F28335-Q1

 

  1. 1Usage Notes and Advisories Matrices
    1. 1.1 Usage Notes Matrix
    2. 1.2 Advisories Matrix
  2. 2Nomenclature, Package Symbolization, and Revision Identification
    1. 2.1 Device and Development Support Tool Nomenclature
    2. 2.2 Devices Supported
    3. 2.3 Package Symbolization and Revision Identification
    4. 2.4 Silicon Change Overview
  3. 3Silicon Revision A Usage Notes and Advisories
    1. 3.1 Silicon Revision A Usage Notes
      1. 3.1.1 PIE: Spurious Nested Interrupt After Back-to-Back PIEACK Write and Manual CPU Interrupt Mask Clear Usage Note
      2. 3.1.2 Caution While Using Nested Interrupts
      3. 3.1.3 Watchdog: Watchdog Issues Reset After Bad Key is Written
      4. 3.1.4 McBSP: XRDY Bit can Hold the Not-Ready Status (0) if New Data is Written to the DX1 Register Without First Verifying if the XRDY Bit is in its Ready State (1)
      5. 3.1.5 Maximum Flash Program Time and Erase Time in Revision O of the TMS320F2833x, TMS320F2823x Real-Time Microcontrollers Data Sheet
    2. 3.2 Silicon Revision A Advisories
      1.      Advisory
      2.      Advisory
      3.      Advisory
      4.      Advisory
      5.      Advisory
      6.      Advisory
      7.      Advisory
      8.      Advisory
      9.      Advisory
      10.      Advisory
      11.      Advisory
      12.      Advisory
      13.      Advisory
  4. 4Silicon Revision 0 Usage Notes and Advisories
    1. 4.1 Silicon Revision 0 Usage Notes
    2. 4.2 Silicon Revision 0 Advisories
      1.      Advisory
      2.      Advisory
      3.      Advisory
  5. 5Documentation Support
  6. 6Trademarks
  7. 7Revision History

Advisory

ADC: Simultaneous Sampling Latency

Revision(s) Affected

0, A

Details

When the ADC conversions are initiated in simultaneous mode, the first sample pair will not give correct conversion results.

Workaround(s)

1. If the ADC is used with a sampling window ≤ 160 nS, then the first sample pair must be discarded and a second sample of the same pair must be taken. For instance, if the sequencer is set to sample channel A0:B0/A1:B1/A2:B2 in that order, then load the sequencer with A0:B0/A0:B0/A1:B1/A2:B2 and only use the last three conversions.

2. If the ADC is used with a sampling window greater than 160 ns, there is no issue.
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