ZHCSD14G October   2014  – March 2017 ISO7842

PRODUCTION DATA.  

  1. 特性
  2. 应用
  3. 说明
  4. 修订历史记录
  5. Pin Configuration and Functions
  6. Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information
    5. 6.5  Power Ratings
    6. 6.6  Insulation Specifications
    7. 6.7  Safety-Related Certifications
    8. 6.8  Safety Limiting Values
    9. 6.9  Electrical Characteristics-5-V Supply
    10. 6.10 Supply Current Characteristics-5-V Supply
    11. 6.11 Electrical Characteristics—3.3-V Supply
    12. 6.12 Supply Current Characteristics—3.3-V Supply
    13. 6.13 Electrical Characteristics—2.5-V Supply
    14. 6.14 Supply Current Characteristics—2.5-V Supply
    15. 6.15 Switching Characteristics—5-V Supply
    16. 6.16 Switching Characteristics—3.3-V Supply
    17. 6.17 Switching Characteristics—2.5-V Supply
    18. 6.18 Insulation Characteristics Curves
    19. 6.19 Typical Characteristics
  7. Parameter Measurement Information
  8. Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 Electromagnetic Compatibility (EMC) Considerations
    4. 8.4 Device Functional Modes
      1. 8.4.1 Device I/O Schematics
  9. Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
      3. 9.2.3 Application Curve
  10. 10Power Supply Recommendations
  11. 11Layout
    1. 11.1 Layout Guidelines
      1. 11.1.1 PCB Material
    2. 11.2 Layout Example
  12. 12器件和文档支持
    1. 12.1 文档支持
      1. 12.1.1 相关文档
    2. 12.2 相关链接
    3. 12.3 接收文档更新通知
    4. 12.4 社区资源
    5. 12.5 商标
    6. 12.6 静电放电警告
    7. 12.7 Glossary
  13. 13机械、封装和可订购信息

Specifications

Absolute Maximum Ratings

See (1)
MIN MAX UNIT
VCC1,
VCC2
Supply voltage(2) –0.5 6 V
Voltage INx –0.5 VCCX + 0.5(3) V
OUTx –0.5 VCCX + 0.5(3)
ENx –0.5 VCCX + 0.5(3)
IO Output current –15 15 mA
Surge immunity 12.8 kV
Tstg Storage temperature –65 150 °C
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
All voltage values except differential I/O bus voltages are with respect to the local ground terminal (GND1 or GND2) and are peak voltage values.
Maximum voltage must not exceed 6 V

ESD Ratings

VALUE UNIT
V(ESD) Electrostatic discharge Human body model (HBM), per ANSI/ESDA/JEDEC JS-001, all pins(1) ±6000 V
Charged device model (CDM), per JEDEC specification JESD22-C101, all pins(2) ±1500
JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.

Recommended Operating Conditions

MIN NOM MAX UNIT
VCC1, VCC2 Supply voltage 2.25 5.5 V
IOH High-level output current VCCO(2) = 5 V –4 mA
VCCO(2) = 3.3 V –2
VCCO(2) = 2.5 V –1
IOL Low-level output current VCCO(2) = 5 V 4 mA
VCCO(2) = 3.3 V 2
VCCO(2) = 2.5 V 1
VIH High-level input voltage 0.7 × VCCI (2) VCCI (2) V
VIL Low-level input voltage 0 0.3 × VCCI(2) V
DR Signaling rate 0 100 Mbps
TJ Junction temperature(1) –55 150 °C
TA Ambient temperature –55 25 125 °C
To maintain the recommended operating conditions for TJ, see Thermal Information.
VCCI = Input-side VCC; VCCO = Output-side VCC.

Thermal Information

ISO7842 UNIT
THERMAL METRIC(1) DW (SOIC) DWW (SOIC)
16 Pins 16 Pins
RθJA Junction-to-ambient thermal resistance 78.9 78.9 °C/W
RθJC(top) Junction-to-case(top) thermal resistance 41.6 41.1 °C/W
RθJB Junction-to-board thermal resistance 43.6 49.5 °C/W
ψJT Junction-to-top characterization parameter 15.5 15.2 °C/W
ψJB Junction-to-board characterization parameter 43.1 48.8 °C/W
RθJC(bottom) Junction-to-case(bottom) thermal resistance N/A N/A °C/W
For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application report.

Power Ratings

VCC1 = VCC2 = 5.5 V, TJ = 150°C, CL = 15 pF, input a 50 MHz 50% duty cycle square wave
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
PD Maximum power dissipation by ISO7842x 200 mW
PD1 Maximum power dissipation by side-1 of ISO7842x 100 mW
PD2 Maximum power dissipation by side-2 of ISO7842x 100 mW

Insulation Specifications

PARAMETER TEST CONDITIONS SPECIFICATION UNIT
DW DWW
GENERAL
CLR External clearance(1) Shortest pin-to-pin distance through air >8 >14.5 mm
CPG External creepage(1) Shortest pin-to-pin distance across the package surfaceHigh Voltage Feature Description >8 >14.5 mm
DTI Distance through the insulation Minimum internal gap (internal clearance) >21 >21 μm
CTI Comparative tracking index DIN EN 60112 (VDE 0303-11); IEC 60112; UL 746A >600 >600 V
Material group I I
Overvoltage category per IEC 60664-1 Rated mains voltage ≤ 600 VRMS I–IV I–IV
Rated mains voltage ≤ 1000 VRMS I–III I–IV
DIN V VDE V 0884-10 (VDE V 0884-10):2006-12(2)
VIORM Maximum repetitive peak isolation voltage 2121 2828 VPK
VIOWM Maximum isolation working voltage AC voltage (sine wave); Time dependent dielectric breakdown (TDDB) Test, see Figure 1 and Figure 2 1500 2000 VRMS
DC voltage 2121 2828 VDC
VIOTM Maximum transient isolation voltage VTEST = VIOTM
t = 60 s (qualification)
t= 1 s (100% production)
8000 8000 VPK
VIOSM Maximum surge isolation voltage(3) Test method per IEC 60065, 1.2/50 µs waveform,
VTEST = 1.6 × VIOSM = 12800 VPK (qualification)
8000 8000 VPK
qpd Apparent charge(4) Method a: After I/O safety test subgroup 2/3,
Vini = VIOTM, tini = 60 s;
Vpd(m) = 1.2 × VIORM = 2545 VPK (DW) and 3394 VPK (DWW), tm = 10 s
≤5 ≤5 pC
Method a: After environmental tests subgroup 1,
Vini = VIOTM, tini = 60 s;
Vpd(m) = 1.6 × VIORM = 3394 VPK (DW) and 4525 VPK (DWW), tm = 10 s
≤5 ≤5
Method b1: At routine test (100% production) and preconditioning (type test)
Vini = VIOTM, tini = 1 s;
Vpd(m) = 1.875 × VIORM = 3977 VPK (DW) and 5303 VPK (DWW), tm = 1 s
≤5 ≤5
CIO Barrier capacitance, input to output(5) VIO = 0.4 × sin (2πft), f = 1 MHz 2 2 pF
RIO Isolation resistance, input to output(5) VIO = 500 V, TA = 25°C >1012 >1012 Ω
VIO = 500 V, 100°C ≤ TA ≤ 125°C >1011 >1011
VIO = 500 V at TS = 150°C >109 >109
Pollution degree 2 2
Climatic category 55/125/21 55/125/21
UL 1577
VISO Withstand isolation voltage VTEST = VISO = 5700 VRMS, t = 60 s (qualification),
VTEST = 1.2 × VISO = 6840 VRMS, t = 1 s (100% production)
5700 5700 VRMS
Creepage and clearance requirements should be applied according to the specific equipment isolation standards of an application. Care should be taken to maintain the creepage and clearance distance of a board design to ensure that the mounting pads of the isolator on the printed-circuit board do not reduce this distance. Creepage and clearance on a printed-circuit board become equal in certain cases. Techniques such as inserting grooves, ribs, or both on a printed circuit board are used to help increase these specifications.
This coupler is suitable for safe electrical insulation only within the safety ratings. Compliance with the safety ratings shall be ensured by means of suitable protective circuits.
Testing is carried out in air or oil to determine the intrinsic surge immunity of the isolation barrier.
Apparent charge is electrical discharge caused by a partial discharge (pd).
All pins on each side of the barrier tied together creating a two-pin device.

Safety-Related Certifications

Certifications for the DW package are complete. DWW package certifications are complete for UL, VDE and TUV and planned for CSA and CQC.
VDE CSA UL CQC TUV
Certified according to DIN V VDE V 0884-10 (VDE V 0884-10):2006-12 and DIN EN 60950-1 (VDE 0805 Teil 1):2011-01 Approved under CSA Component Acceptance Notice 5A, IEC 60950-1 and IEC 60601-1 Certified according to UL 1577 Component Recognition Program Certified according to GB 4943.1-2011 Certified according to
EN 61010-1:2010 (3rd Ed) and
EN 60950-1:2006/A11:2009/A1:2010/
A12:2011/A2:2013
Reinforced insulation
Maximum transient isolation voltage, 8000 VPK;
Maximum repetitive peak isolation voltage, 2121 VPK (DW), 2828 VPK (DWW);
Maximum surge isolation voltage, 8000 VPK
Reinforced insulation per CSA 60950-1-07+A1+A2 and IEC 60950-1 2nd Ed., 800 VRMS (DW package) and 1450 VRMS (DWW package) max working voltage (pollution degree 2, material group I);
2 MOPP (Means of Patient Protection) per CSA 60601-1:14 and IEC 60601-1 Ed. 3.1, 250 VRMS (354 VPK) max working voltage (DW package)
Single protection, 5700 VRMS Reinforced Insulation, Altitude ≤ 5000 m, Tropical Climate, 250 VRMS maximum working voltage 5700 VRMS Reinforced insulation per
EN 61010-1:2010 (3rd Ed) up to working voltage of 600 VRMS (DW package) and 1000 VRMS (DWW package)
5700 VRMS Reinforced insulation per
EN 60950-1:2006/A11:2009/A1:2010/
A12:2011/A2:2013 up to working voltage of 800 VRMS (DW package) and 1450 VRMS (DWW package)
Certificate number: 40040142 Master contract number: 220991 File number: E181974 Certificate number: CQC15001121716 Client ID number: 77311

Safety Limiting Values

Safety limiting intends to minimize potential damage to the isolation barrier upon failure of input or output circuitry. A failure of the I/O can allow low resistance to ground or the supply and, without current limiting, dissipate sufficient power to overheat the die and damage the isolation barrier potentially leading to secondary system failures.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
IS Safety input, output, or supply current RθJA = 78.9°C/W, VI = 5.5 V, TJ = 150°C, TA = 25°C 288 mA
RθJA = 78.9°C/W, VI = 3.6 V, TJ = 150°C, TA = 25°C 440
RθJA = 78.9°C/W, VI = 2.75 V, TJ = 150°C, TA = 25°C 576
PS Safety input, output, or total power RθJA = 78.9°C/W, TJ = 150°C, TA = 25°C 1584 mW
TS Maximum safety temperature 150 °C

The maximum safety temperature is the maximum junction temperature specified for the device. The power dissipation and junction-to-air thermal impedance of the device installed in the application hardware determines the junction temperature. The assumed junction-to-air thermal resistance in the Thermal Information is that of a device installed on a high-K test board for leaded surface-mount packages. The power is the recommended maximum input voltage times the current. The junction temperature is then the ambient temperature plus the power times the junction-to-air thermal resistance.

Electrical Characteristics–5-V Supply

VCC1 = VCC2 = 5 V ±10% (over recommended operating conditions unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
VOH High-level output voltage IOH = –4 mA; see Figure 11 VCCO(1) – 0.4 VCCO(1) – 0.2 V
VOL Low-level output voltage IOL = 4 mA; see Figure 11 0.2 0.4 V
VI(HYS) Input threshold voltage hysteresis 0.1 × VCCI (1) V
IIH High-level input current VIH = VCCI(1) at INx or ENx 10 μA
IIL Low-level input current VIL = 0 V at INx or ENx -10
CMTI Common-mode transient immunity VI = VCCI(1) or 0 V, VCM = 1500 V; see Figure 14 100 kV/μs
CI Input capacitance VI = VCC/2 + 0.4 × sin (2πft), f = 1 MHz, VCC = 5 V 2 pF
VCCI = Input-side VCC; VCCO = Output-side VCC.

Supply Current Characteristics–5-V Supply

VCC1 = VCC2 = 5 V ±10% (over recommended operating conditions unless otherwise noted)
PARAMETER TEST CONDITIONS SUPPLY CURRENT MIN TYP MAX UNIT
ISO7842DW AND ISO7842FDW
Supply current Disable EN1 = EN2 = 0V, VI = 0 V (ISO7842F), VI = VCCI(1) (ISO7842) ICC1, ICC2 1 1.5 mA
EN1 = EN2 = 0 V, VI = VCCI(1) (ISO7842F), VI = 0 V (ISO7842) ICC1, ICC2 3.4 4.8 mA
DC signal VI = 0 V (ISO7842F), VI = VCCI(1) (ISO7842) ICC1, ICC2 2 2.7 mA
VI = VCCI(1) (ISO7842F), VI = 0 V (ISO7842) ICC1, ICC2 4.4 6.1 mA
All channels switching with square wave clock input;
CL = 15 pF
1 Mbps ICC1, ICC2 3.3 4.6 mA
10 Mbps ICC1, ICC2 4.2 5.6 mA
100 Mbps ICC1, ICC2 13.7 16.6 mA
ISO7842DWW AND ISO7842FDWW
Supply current Disable EN1 = EN2 = 0V, VI = 0 V (ISO7842F), VI = VCCI(1) (ISO7842) ICC1, ICC2 1 1.5 mA
EN1 = EN2 = 0 V, VI = VCCI(1) (ISO7842F), VI = 0 V (ISO7842) ICC1, ICC2 3.4 4.8 mA
DC signal VI = 0 V (ISO7842F), VI = VCCI(1) (ISO7842) ICC1, ICC2 2 2.8 mA
VI = VCCI(1) (ISO7842F), VI = 0 V (ISO7842) ICC1, ICC2 4.4 6.3 mA
All channels switching with square wave clock input;
CL = 15 pF
1 Mbps ICC1, ICC2 3.4 4.7 mA
10 Mbps ICC1, ICC2 4.3 5.9 mA
100 Mbps ICC1, ICC2 14 17.3 mA
VCCI = Input-side VCC; VCCO = Output-side VCC.

Electrical Characteristics—3.3-V Supply

VCC1 = VCC2 = 3.3 V ±10% (over recommended operating conditions unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
VOH High-level output voltage IOH = –2 mA; see Figure 11 VCCO(1) – 0.4 VCCO(1) – 0.2 V
VOL Low-level output voltage IOL = 2 mA; see Figure 11 0.2 0.4 V
VI(HYS) Input threshold voltage hysteresis 0.1 × VCCI(1) V
IIH High-level input current VIH = VCCI(1) at INx or ENx 10 μA
IIL Low-level input current VIL = 0 V at INx or ENx –10 μA
CMTI Common-mode transient immunity VI = VCCI(1) or 0 V, VCM = 1500 V; see Figure 14 100 kV/μs
VCCI = Input-side VCC; VCCO = Output-side VCC.

Supply Current Characteristics—3.3-V Supply

VCC1 = VCC2 = 3.3 V ±10% (over recommended operating conditions unless otherwise noted)
PARAMETER TEST CONDITIONS SUPPLY CURRENT MIN TYP MAX UNIT
ISO7842DW AND ISO7842FDW
Supply current Disable EN1 = EN2 = 0 V, VI = 0 V (ISO7842F), VI = VCCI(1) (ISO7842) ICC1, ICC2 1 1.5 mA
EN1 = EN2 = 0 V, VI = VCCI(1) (ISO7842F), VI = 0 V (ISO7842) ICC1, ICC2 3.4 4.8 mA
DC signal VI = 0 V (ISO7842F), VI = VCCI(1) (ISO7842) ICC1, ICC2 2 2.7 mA
VI = VCCI(1) (ISO7842F), VI = 0 V (ISO7842) ICC1, ICC2 4.4 6.1 mA
All channels switching with square wave clock input;
CL = 15 pF
1 Mbps ICC1, ICC2 3.3 4.5 mA
10 Mbps ICC1, ICC2 4 5.2 mA
100 Mbps ICC1, ICC2 10.8 12.9 mA
ISO7842DWW and ISO7842FDWW
Supply current Disable EN1 = EN2 = 0 V, VI = 0 V (ISO7842F), VI = VCCI(1) (ISO7842) ICC1, ICC2 1 1.5 mA
EN1 = EN2 = 0 V, VI = VCCI(1) (ISO7842F), VI = 0 V (ISO7842) ICC1, ICC2 3.4 4.8 mA
DC signal VI = 0 V (ISO7842F), VI = VCCI(1) (ISO7842) ICC1, ICC2 2 2.8 mA
VI = VCCI(1) (ISO7842F), VI = 0 V (ISO7842) ICC1, ICC2 4.4 6.3 mA
All channels switching with square wave clock input;
CL = 15 pF
1 Mbps ICC1, ICC2 3.4 4.7 mA
10 Mbps ICC1, ICC2 4.1 5.5 mA
100 Mbps ICC1, ICC2 11 13.6 mA
VCCI = Input-side VCC; VCCO = Output-side VCC.

Electrical Characteristics—2.5-V Supply

VCC1 = VCC2 = 2.5 V ±10% (over recommended operating conditions unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
VOH High-level output voltage IOH = –1 mA; see Figure 11 VCCO(1) – 0.4 VCCO(1) – 0.2 V
VOL Low-level output voltage IOL = 1 mA; see Figure 11 0.2 0.4 V
VI(HYS) Input threshold voltage hysteresis 0.1 × VCCI(1) V
IIH High-level input current VIH = VCCI(1) at INx or ENx 10 μA
IIL Low-level input current VIL = 0 V at INx or ENx –10 μA
CMTI Common-mode transient immunity VI = VCCI(1) or 0 V, VCM = 1500 V; see Figure 14 100 kV/μs
VCCI = Input-side VCC; VCCO = Output-side VCC.

Supply Current Characteristics—2.5-V Supply

VCC1 = VCC2 = 2.5 V ±10% (over recommended operating conditions unless otherwise noted)
PARAMETER TEST CONDITIONS SUPPLY CURRENT MIN TYP MAX UNIT
ISO7842DW AND ISO7842FDW
Supply current Disable EN1 = EN2 = 0 V, VI = 0 V (ISO7842F), VI = VCCI(1) (ISO7842) ICC1, ICC2 1 1.5 mA
EN1 = EN2 = 0 V, VI = VCCI(1) (ISO7842F), VI = 0 V (ISO7842) ICC1, ICC2 3.4 4.8 mA
DC signal VI = 0 V (ISO7842F), VI = VCCI(1) (ISO7842) ICC1, ICC2 2 2.7 mA
VI = VCCI(1) (ISO7842F), VI = 0 V (ISO7842) ICC1, ICC2 4.4 6.1 mA
All channels switching with square wave clock input;
CL = 15 pF
1 Mbps ICC1, ICC2 3.2 4.5 mA
10 Mbps ICC1, ICC2 3.7 5.1 mA
100 Mbps ICC1, ICC2 8.9 10.8 mA
ISO7842DWW AND ISO7842FDWW
Supply current Disable EN1 = EN2 = 0 V, VI = 0 V (ISO7842F), VI = VCCI(1) (ISO7842) ICC1, ICC2 1 1.5 mA
EN1 = EN2 = 0 V, VI = VCCI(1) (ISO7842F), VI = 0 V (ISO7842) ICC1, ICC2 3.4 4.8 mA
DC signal VI = 0 V (ISO7842F), VI = VCCI(1) (ISO7842) ICC1, ICC2 2 2.8 mA
VI = VCCI(1) (ISO7842F), VI = 0 V (ISO7842) ICC1, ICC2 4.4 6.3 mA
All channels switching with square wave clock input;
CL = 15 pF
1 Mbps ICC1, ICC2 3.3 4.6 mA
10 Mbps ICC1, ICC2 3.8 5.3 mA
100 Mbps ICC1, ICC2 9 11.5 mA
VCCI = Input-side VCC; VCCO = Output-side VCC.

Switching Characteristics—5-V Supply

VCC1 = VCC2 = 5 V ±10% (over recommended operating conditions unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
tPLH, tPHL Propagation delay time See Figure 11 6 11 16 ns
PWD Pulse width distortion(1) |tPHL – tPLH| 0.55 4.1 ns
tsk(o) Channel-to-channel output skew time(2) Same-direction channels 2.5 ns
tsk(pp) Part-to-part skew time(3) 4.5 ns
tr Output signal rise time See Figure 11 1.7 3.9 ns
tf Output signal fall time 1.9 3.9 ns
tPHZ Disable propagation delay, high-to-high impedance output See Figure 12 12 20 ns
tPLZ Disable propagation delay, low-to-high impedance output 12 20 ns
tPZH Enable propagation delay, high impedance-to-high output for ISO7842 10 20 ns
Enable propagation delay, high impedance-to-high output for ISO7842F 2 2.5 μs
tPZL Enable propagation delay, high impedance-to-low output for ISO7842 2 2.5 μs
Enable propagation delay, high impedance-to-low output for ISO7842F 10 20 ns
tfs Default output delay time from input power loss Measured from the time VCC goes below 1.7 V. See Figure 13 0.2 9 μs
tie Time interval error 216 – 1 PRBS data at 100 Mbps 0.90 ns
Also known as pulse skew.
tsk(o) is the skew between outputs of a single device with all driving inputs connected together and the outputs switching in the same direction while driving identical loads.
tsk(pp) is the magnitude of the difference in propagation delay times between any terminals of different devices switching in the same direction while operating at identical supply voltages, temperature, input signals and loads.

Switching Characteristics—3.3-V Supply

VCC1 = VCC2 = 3.3 V ±10% (over recommended operating conditions unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
tPLH, tPHL Propagation delay time See Figure 11 6 10.8 16 ns
PWD Pulse width distortion(1) |tPHL – tPLH| 0.7 4.2 ns
tsk(o) Channel-to-channel output skew time(2) Same-direction channels 2.2 ns
tsk(pp) Part-to-part skew time(3) 4.5 ns
tr Output signal rise time See Figure 11 0.8 3 ns
tf Output signal fall time 0.8 3 ns
tPHZ Disable propagation delay, high-to-high impedance output See Figure 12 17 32 ns
tPLZ Disable propagation delay, low-to-high impedance output 17 32 ns
tPZH Enable propagation delay, high impedance-to-high output for ISO7842 17 32 ns
Enable propagation delay, high impedance-to-high output for ISO7842F 2 2.5 μs
tPZL Enable propagation delay, high impedance-to-low output for ISO7842 2 2.5 μs
Enable propagation delay, high impedance-to-low output for ISO7842F 17 32 ns
tfs Default output delay time from input power loss Measured from the time VCC goes below 1.7 V. See Figure 13 0.2 9 μs
tie Time interval error 216 – 1 PRBS data at 100 Mbps 0.91 ns
Also known as Pulse Skew.
tsk(o) is the skew between outputs of a single device with all driving inputs connected together and the outputs switching in the same direction while driving identical loads.
tsk(pp) is the magnitude of the difference in propagation delay times between any terminals of different devices switching in the same direction while operating at identical supply voltages, temperature, input signals and loads.

Switching Characteristics—2.5-V Supply

VCC1 = VCC2 = 2.5 V ±10% (over recommended operating conditions unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
tPLH, tPHL Propagation delay time See Figure 11 7.5 11.7 17.5 ns
PWD Pulse width distortion(1) |tPHL – tPLH| 0.66 4.2 ns
tsk(o) Channel-to-channel output skew time(2) Same-direction Channels 2.2 ns
tsk(pp) Part-to-part skew time(3) 4.5 ns
tr Output signal rise time See Figure 11 1 3.5 ns
tf Output signal fall time 1.2 3.5 ns
tPHZ Disable propagation delay, high-to-high impedance output See Figure 12 22 45 ns
tPLZ Disable propagation delay, low-to-high impedance output 22 45 ns
tPZH Enable propagation delay, high impedance-to-high output for ISO7842 18 45 ns
Enable propagation delay, high impedance-to-high output for ISO7842F 2 2.5 μs
tPZL Enable propagation delay, high impedance-to-low output for ISO7842 2 2.5 μs
Enable propagation delay, high impedance-to-low output for ISO7842F 18 45 ns
tfs Default output delay time from input power loss Measured from the time VCC goes below 1.7 V. See Figure 13 0.2 9 μs
tie Time interval error 216 – 1 PRBS data at 100 Mbps 0.91 ns
Also known as pulse skew.
tsk(o) is the skew between outputs of a single device with all driving inputs connected together and the outputs switching in the same direction while driving identical loads.
tsk(pp) is the magnitude of the difference in propagation delay times between any terminals of different devices switching in the same direction while operating at identical supply voltages, temperature, input signals and loads.

Insulation Characteristics Curves

ISO7842 ISO7842F tddb_curve_reinforced_dw.gif
TA upto 150°C Operating lifetime = 135 years
Stress-voltage frequency = 60 Hz
Isolation working voltage = 1500 VRMS
Figure 1. Reinforced Isolation Capacitor Life Time Projection for Devices in DW Package
ISO7842 ISO7842F tddb_curve_reinforced_dww.gif
TA upto 150°C Operating lifetime = 34 years
Stress-voltage frequency = 60 Hz
Isolation working voltage = 2000 VRMS
Figure 2. Reinforced Isolation Capacitor Life Time Projection for Devices in DWW Package
ISO7842 ISO7842F D014_SLLSEJ0.gif Figure 3. Thermal Derating Curve for Limiting Current per VDE
ISO7842 ISO7842F D015_SLLSEJ0.gif Figure 4. Thermal Derating Curve for Limiting Power per VDE

Typical Characteristics

ISO7842 ISO7842F D001_SLLSEJ0.gif
TA = 25°C CL = 15 pF
Figure 5. Supply Current vs Data Rate (With 15-pF Load)
ISO7842 ISO7842F D003_SLLSEJ0.gif
TA = 25°C
Figure 7. High-Level Output Voltage vs High-level Output Current
ISO7842 ISO7842F D005_SLLSEJ0.gif
Figure 9. Power Supply Undervoltage Threshold vs Free-Air Temperature
ISO7842 ISO7842F D002_SLLSEJ0.gif
TA = 25°C CL = No Load
Figure 6. Supply Current vs Data Rate (With No Load)
ISO7842 ISO7842F D004_SLLSEJ0.gif
TA = 25°C
Figure 8. Low-Level Output Voltage vs Low-Level Output Current
ISO7842 ISO7842F D006_SLLSEJ0.gif
Figure 10. Propagation Delay Time vs Free-Air Temperature