ZHCSD71A November 2014 – January 2015 DAC39J84
PRODUCTION DATA.
PIN | I/O | DESCRIPTION | |
---|---|---|---|
NAME | NUMBER | ||
ALARM | L8 | O | CMOS output for ALARM condition. The ALARM output functionality is defined through the config7 register. Default polarity is active high, but can be changed to active high via config0 alarm_out_pol control bit. If not used it can be left open. |
AMUX0 | H3 | I/O | Analog test pin for SerDes, Lane 0 to Lane 3. It can be left open if not used. |
AMUX1 | E3 | I/O | Analog test pin for SerDes, Lane 4 to Lane 7. It can be left open if not used. |
ATEST | K9 | I/O | Analog test pin for DAC, references and PLL. It can be left open if not used. |
DACCLKP | A10 | I | Positive LVPECL clock input for DAC core with Vcm = 0.5V. It can be PLL reference clock or external DAC sampling rate clock. If not used, DACCLK is self-biased with 100mV differential at Vcm = 0.5V. |
DACCLKN | A9 | I | Complementary LVPECL clock input for DAC core. (see the DACCLKP description) |
EXTIO | F10 | I/O | Used as external reference input when internal reference is disabled through config27 extref_ena = ‘1’. Used as internal reference output when config27 extref_ena = ‘0’ (default). Requires a 0.1 μF decoupling capacitor to analog GND when used as reference output. It can be left open if not used. |
GND | A12, F12, G12, M12, A11, B11, C11, D11, E11, F11, G11, H11, J11, K11, L11, M11, C8, D8, E8, F8, G8, H8, J8, E7, F7, G7, H7, E6, F6, G6, H6, A5, B5, E5, F5, G5, H5, A4, B4, M4, B3, C3, L3, B2, C2, D2, E2, H2, J2, K2, L2 | I | These pins are ground for all supplies. |
IFORCE | C5 | I/O | Analog test pin for on chip parametric. It can be left open if not used. |
IOUTAP | B12 | O | A-Channel DAC current output. Must be tied to GND if not used. |
IOUTAN | C12 | O | A-Channel DAC complementary current output. Must be tied to GND if not used. |
IOUTBP | E12 | O | B-Channel DAC current output. Must be tied to GND if not used. |
IOUTBN | D12 | O | B-Channel DAC complementary current output. Must be tied to GND if not used. |
IOUTCP | H12 | O | C-Channel DAC current output. Must be tied to GND if not used. |
IOUTCN | J12 | O | C-Channel DAC complementary current output. Must be tied to GND if not used. |
IOUTDP | L12 | O | D-Channel DAC current output. Must be tied to GND if not used. |
IOUTDN | K12 | O | D-Channel DAC complementary current output. Must be tied to GND if not used. |
LPF | C9 | I/O | External PLL loop filter connection. It can be left open if not used. |
RBIAS | G10 | O | Full-scale output current bias. Change the full-scale output current through coarse_dac(3:0). Expected to be 1.92kΩ to GND. |
RESETB | K8 | I | Active low input for chip RESET, which resets all the programming registers to their default state. Internal pull-up. It can be left open if not used. |
RX0P | G1 | I | CML SerDes interface lane 0 input, positive, expected to be AC coupled. It can be left open if not used. |
RX0N | H1 | I | CML SerDes interface lane 0 input, negative, expected to be AC coupled. It can be left open if not used. |
RX1P | K1 | I | CML SerDes interface lane 1 input, positive, expected to be AC coupled. It can be left open if not used. |
RX1N | J1 | I | CML SerDes interface lane 1 input, negative, expected to be AC coupled. It can be left open if not used. |
RX2P | L1 | I | CML SerDes interface lane 2 input, positive, expected to be AC coupled. It can be left open if not used. |
RX2N | M1 | I | CML SerDes interface lane 2 input, negative, expected to be AC coupled. It can be left open if not used. |
RX3P | M3 | I | CML SerDes interface lane 3 input, positive, expected to be AC coupled. It can be left open if not used. |
RX3N | M2 | I | CML SerDes interface lane 3 input, negative, expected to be AC coupled. It can be left open if not used. |
RX4P | F1 | I | CML SerDes interface lane 4 input, positive, expected to be AC coupled. It can be left open if not used. |
RX4N | E1 | I | CML SerDes interface lane 4 input, negative, expected to be AC coupled. It can be left open if not used. |
RX5P | C1 | I | CML SerDes interface lane 5 input, positive, expected to be AC coupled. It can be left open if not used. |
RX5N | D1 | I | CML SerDes interface lane 5 input, negative, expected to be AC coupled. It can be left open if not used. |
RX6P | B1 | I | CML SerDes interface lane 6 input, positive, expected to be AC coupled. It can be left open if not used. |
RX6N | A1 | I | CML SerDes interface lane 6 input, negative, expected to be AC coupled. It can be left open if not used. |
RX7P | A3 | I | CML SerDes interface lane 7 input, positive, expected to be AC coupled. It can be left open if not used. |
RX7N | A2 | I | CML SerDes interface lane 7 input, negative, expected to be AC coupled. It can be left open if not used. |
SYSREFP | A7 | I | LVPECL SYSREF positive input with Vcm = 0.5V. This positive/negative pair is captured with the rising edge of DACCLKP/N. It is used for JESD204B Subclass 1 deterministic latency and multiple DAC synchronization, which can be periodic or pulsed. If not used, it is self-biased with 100mV differential at Vcm = 0.5V. |
SYSREFN | A6 | I | LVPECL SYSREF negative input with Vcm = 0.5V. (See the SYSREFP description) |
SCLK | L9 | I | Serial interface clock. Internal pull-down. It can be left open if not used. |
SDENB | M9 | I | Active low serial data enable, always an input to the DAC39J84. Internal pull-up. It can be left open if not used. |
SDIO | L10 | I/O | Serial interface data. Bi-directional in 3-pin mode (default) and 4-pin mode. Internal pull-down. It can be left open if not used. |
SDO | M10 | O | Uni-directional serial interface data in 4-pin mode. The SDO pin is tri-stated in 3-pin interface mode (default). It can be left open if not used. |
SLEEP | M8 | I | Active high asynchronous hardware power-down input. Internal pull-down. It can be left open if not used. |
SYNCBP | B7 | O | Synchronization request to transmitter, LVDS positive output. It can be left open if not used. |
SYNCBN | B6 | O | Synchronization request to transmitter, LVDS negative output. It can be left open if not used. |
SYNC_N_AB | L6 | O | Synchronization request to transmitter, CMOS output. Defaults to link 0, but can be programmable for any link. It can be left open if not used. |
SYNC_N_CD | L7 | O | Synchronization request to transmitter, CMOS output. Defaults to link 1, but can be programmable for any link. It can be left open if not used. |
TCLK | K4 | I | JTAG test clock. It can be left open if not used. |
TDI | L5 | I | JTAG test data in. It can be left open if not used. |
TDO | M5 | O | JTAG test data out. It can be left open if not used. |
TMS | L4 | I | JTAG test mode select. It can be left open if not used. |
TRSTB | J3 | I | JTAG test reset. Must be tied to GND to hold the JTAG state machine status reset if the JTAG port is not used. |
TXENABLE | K5 | I | To enable analog output data transmission, set sif_txenable in register config3 to “1” or pull CMOS TXENABLE pin to high. Transmit enable active high input. Internal pull-down. To disable analog output, set sif_txenable to “0” and pull CMOS TXENABLE pin to low. The DAC output is forced to midscale. It can be left open if not used. |
TESTMODE | K3 | O | This pin is used for factory testing. Internal pull-down. It can be left open if not used. |
VDDADAC33 | D10, E10, H10, J10, | I | Analog supply voltage. (3.3V) |
VDDAPLL18 | B10, B9 | I | PLL analog supply voltage. (1.8V) |
VDDAREF18 | C10, K10 | I | Analog reference supply voltage (1.8V) |
VDDCLK09 | A8, B8 | I | Internal clock buffer supply voltage (0.9V). It is recommended to isolate this supply from VDDDIG09. |
VDDDAC09 | D9, E9, F9, G9, H9, J9 | I | DAC core supply voltage. (0.9V). It is recommended to isolate this supply from VDDDIG09. |
VDDDIG09 | J7, J6, D5, J5, D4, E4, F4, G4, H4, J4, D3 | I | Digital supply voltage. (0.9V). It is recommended to isolate this supply from VDDCLK09 and VDDDAC09. |
VDDIO18 | K7, K6 | I | Supply voltage for all digital I/O and CMOS I/O. (1.8V) |
VDDR18 | F2, G2 | I | Supply voltage for SerDes (1.8V) |
VDDS18 | C7, C6 | I | Supply voltage for LVDS SYNCBP/N (1.8V) |
VDDT09 | F3, G3 | I | Supply voltage for SerDes termination (0.9V) |
VQPS18 | D7, D6 | I | Fuse supply voltage. This supply pin is also used for factory fuse programming. Connect to 1.8V. |
VSENSE | C4 | I/O | Analog test pin for on chip parametric. It can be left open if not used. |