米6体育平台手机版

ZHCSE44C august 2015 – may 2023 ISO5852S

PRODUCTION DATA

7.1 Absolute Maximum Ratings

Over operating free-air temperature range (unless otherwise noted)⁽¹⁾

			MIN	MAX	UNIT
V_CC1	Supply-voltage input side		GND1 – 0.3	6	V
V_CC2	Positive supply-voltage output side	(V_CC2 – GND2)	–0.3	35	V
V_EE2	Negative supply-voltage output side	(V_EE2 – GND2)	–17.5	0.3	V
V_(SUP2)	Total-supply output voltage	(V_CC2 – V_EE2)	–0.3	35	V
V_(OUTH)	Positive gate-driver output voltage		V_EE2 – 0.3	V_CC2 + 0.3	V
V_(OUTL)	Negative gate-driver output voltage		V_EE2 – 0.3	V_CC2 + 0.3	V
I_(OUTH₎	Gate-driver high output current	Maximum pulse width = 10 μs, Maximum duty cycle = 0.2%)		2.7	A
I_(OUTL)	Gate-driver low output current	Maximum pulse width = 10 μs, Maximum duty cycle = 0.2%)		5.5	A
V_(LIP)	Voltage at IN+, IN–, FLT, RDY, RST		GND1 – 0.3	V_CC1 + 0.3	V
I_(LOP)	Output current of FLT, RDY			10	mA
V_(DESAT)	Voltage at DESAT		GND2 – 0.3	V_CC2 + 0.3	V
V_(CLAMP)	Clamp voltage		V_EE2 – 0.3	V_CC2 + 0.3	V
T_J	Junction temperature		–40	150	°C
T_STG	Storage temperature		–65	150	°C

(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.