7.5 Electrical Characteristics(1)
Specifications are for TA= 25°C, VDD-GND = 2.5 V, unless otherwise stated.
| PARAMETER |
TEST CONDITIONS |
MIN(2) |
TYP(3) |
MAX(2) |
UNIT |
| POWER SUPPLY |
| IDD |
Supply current(4) |
Operation mode |
|
35 |
50 |
nA |
| Digital conversion of external resistance (Rext) |
|
200 |
400 |
µA |
| TIMER |
| tIP |
Time Interval Period |
1650 selectable Time Intervals |
Minimum time interval |
|
100 |
|
ms |
| Maximum time interval |
|
7200 |
|
s |
| Time Interval Setting Accuracy(7) |
Excluding the precision of Rext |
|
±0.6% |
|
|
| Timer Interval Setting Accuracy over supply voltage |
1.8 V ≤ VDD ≤ 5.5 V |
|
±25 |
|
ppm/V |
| tOSC |
Oscillator Accuracy |
|
–0.5% |
|
0.5% |
|
| Oscillator Accuracy over temperature(5) |
–40°C ≤ TA ≤ 105°C |
|
±100 |
±400 |
ppm/°C |
| Oscillator Accuracy over supply voltage |
1.8 V ≤ VDD ≤ 5.5 V |
|
±0.4 |
|
%/V |
| Oscillator Accuracy over life time(6) |
|
|
0.24% |
|
|
| tDONE |
DONE Pulse width (5) |
|
100 |
|
|
ns |
| tRSTn |
RSTn Pulse width |
|
|
320 |
|
ms |
| tWAKE |
WAKE Pulse width |
|
|
20 |
|
ms |
| t_Rext |
Time to convert Rext |
|
|
100 |
120 |
ms |
| DIGITAL LOGIC LEVELS |
| VIH |
Logic High Threshold DONE pin |
|
0.7 × VDD |
|
|
V |
| VIL |
Logic Low Threshold DONE pin |
|
|
|
0.3 × VDD |
V |
| VOH |
Logic output High Level WAKE pin |
Iout = 100 µA |
VDD – 0.3 |
|
|
V |
| Iout = 1 mA |
VDD – 0.7 |
|
|
V |
| VOL |
Logic output Low Level WAKE pin |
Iout = -100 µA |
|
|
0.3 |
V |
| Iout = –1 mA |
|
|
0.7 |
V |
| VOLRSTn |
RSTn Logic output Low Level |
IOL = –1 mA |
|
|
0.3 |
V |
| IOHRSTn |
RSTn High Level output current |
VOHRSTn = VDD |
|
1 |
|
nA |
| VIHM_RST |
Logic High Threshold DELAY/M_RST pin |
|
1.5 |
|
|
V |
(1) Electrical Characteristics values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating of the device such that TJ = TA. No specification of parametric performance is indicated in the electrical tables under conditions of internal self-heating where TJ > TA. Absolute Maximum Ratings indicate junction temperature limits beyond which the device may be permanently degraded, either mechanically or electrically.
(2) Limits are specified by testing, design, or statistical analysis at 25°C. Limits over the operating temperature range are specified through correlations using statistical quality control (SQC) method.
(3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary over time and will also depend on the application and configuration. The typical values are not tested and are not specified on shipped production material.
(4) The supply current excludes load and pullup resistor current. Input pins are at GND or VDD.
(5) This parameter is specified by design and/or characterization and is not tested in production.
(6) Operational life time test procedure equivalent to 10 years.
(7) The accuracy for time interval settings below 1 second is ±100 ms.