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ZHCSFW7C december 2016 – september 2020 CC2640R2F

PRODUCTION DATA

8.24 Synchronous Serial Interface (SSI)

T_c = 25°C, V_DDS = 3.0 V, unless otherwise noted.

PARAMETER	TEST CONDITIONS	MIN	TYP	MAX	UNIT
S1⁽¹⁾ t_{clk_per} (SSIClk period)	Device operating as SLAVE	12		65024	system clocks
S2⁽¹⁾ t_{clk_high} (SSIClk high time)	Device operating as SLAVE		0.5		t_{clk_per}
S3⁽¹⁾ t_{clk_low} (SSIClk low time)	Device operating as SLAVE		0.5		t_{clk_per}
S1 (TX only)⁽¹⁾ t_{clk_per} (SSIClk period)	One-way communication to SLAVE - Device operating as MASTER	4		65024	system clocks
S1 (TX and RX)⁽¹⁾ t_{clk_per} (SSIClk period)	Normal duplex operation - Device operating as MASTER	8		65024	system clocks
S2⁽¹⁾ t_{clk_high} (SSIClk high time)	Device operating as MASTER		0.5		t_{clk_per}
S3⁽¹⁾ t_{clk_low} (SSIClk low time)	Device operating as MASTER		0.5		t_{clk_per}

(1) Refer to SSI timing diagrams Figure 8-1, Figure 8-2, and Figure 8-3.

Figure 8-1 SSI Timing for TI Frame Format (FRF = 01), Single Transfer Timing Measurement

Figure 8-2 SSI Timing for MICROWIRE Frame Format (FRF = 10), Single Transfer

Figure 8-3 SSI Timing for SPI Frame Format (FRF = 00), With SPH = 1