ZHCSH03C August 2017 – June 2019 TPS1H000-Q1
PRODUCTION DATA.
The DIAG_EN pin enables or disables the diagnostic functions. If multiple devices are used, but the ADC resource is limited in the microcontroller, the microcontroller can use GPIOs to set DIAG_EN high to enable the diagnostics of one device while disabling the diagnostics of the other devices by setting DIAG_EN low. In addition, the device can keep the power consumption to a minimum by setting DIAG_EN and IN low.
Table 2 applies when the DIAG_EN pin is enabled. Table 3 applies when the DIAG_EN pin is disabled.
| CONDITION | IN | OUT | CRITERION | FAULT | FAULT RECOVERY |
|---|---|---|---|---|---|
| Normal | L | L | — | H | — |
| H | H | — | H | ||
| Overload or short to GND | H | L | Current limit triggered. | L | See Table 1. |
| Open load or short to battery | H | H | IOUT < l(ol,on) | L | FAULT clears when IN turns low for a duration longer than tFAULT. OR FAULT clears when the open load is removed. |
| L(1) | H | VVS – VOUT < V(ol,off) | L | FAULT clears when IN is toggling OR FAULT clears when the open load is removed. | |
| Thermal shutdown | H | — | Thermal shutdown triggered | L | FAULT clears when IN turns low for a duration longer than tFAULT. OR FAULT clears when thermal shutdown quits. |
| Thermal swing | H | — | Thermal swing triggered | L | FAULT clears when IN turns low for a duration longer than tFAULT. OR FAULT clears when thermal swing quits. |