Table 5-24 Slow GPIO Module Characteristics
over operating free-air temperature (unless otherwise noted)(1)(2)(3) PARAMETER | MIN | TYP | MAX | UNIT |
CLGPIO |
Capacitive loading for measurements given in this table(4) |
| | 50 |
pF |
RGPIOPU |
Slow GPIO internal pullup resistor |
13.8 |
20.0 |
31.4 |
kΩ |
RGPIOPD |
Slow GPIO internal pulldown resistor |
13.0 |
20.5 |
35.5 |
kΩ |
ILKG+ |
Slow GPIO input leakage current, 0 V ≤ VIN ≤ VDD, GPIO pins(5) |
| | 3.25 |
nA |
Slow GPIO input leakage current, 0 V < VIN ≤ VDD, GPIO pins configured as ADC or analog comparator inputs |
| | 3.25 |
IINJ- |
DC injection current, VIN ≤ 0 V |
| | 3.42 |
µA |
tGPIOR |
Slow GPIO rise time, 2-mA drive(6) |
| 19.3 |
29.8 |
ns |
tGPIOF |
Slow GPIO fall time, 2-mA drive(7) |
| 12.8 |
21.1 |
ns |
(1) V
DD must be within the range specified in
Section 5.4.
(2) V
IN must be within the range specified in
Section 5.1. Leakage current outside of this maximum voltage is not ensured and can result in permanent damage of the device.
(3) To avoid potential damage to the part, externally limit either the voltage or current on the I/Os other than power and WAKE as listed in this table.
(4) See the individual peripheral sections for specific loading information.
(5) The leakage current is measured with VIN applied to the corresponding pins. The leakage of digital port pins is measured individually. The port pin is configured as an input and the pullup/pulldown resistor is disabled.