ZHCSII0A July   2018  – November 2018 ADS1219

PRODUCTION DATA.  

  1. 特性
  2. 应用
  3. 说明
    1.     Device Images
      1.      电压、电流和温度监控应用
  4. 修订历史记录
  5. Pin Configuration and Functions
    1.     Pin Functions
  6. Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics
    6. 6.6 I2C Timing Requirements
    7. 6.7 I2C Switching Characteristics
    8. 6.8 Typical Characteristics
  7. Parameter Measurement Information
    1. 7.1 Noise Performance
  8. Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 Multiplexer
      2. 8.3.2 Rail-to-Rail Input Buffers and Programmable Gain Stage
      3. 8.3.3 Voltage Reference
      4. 8.3.4 Modulator and Internal Oscillator
      5. 8.3.5 Digital Filter
      6. 8.3.6 Conversion Times
      7. 8.3.7 Offset Calibration
    4. 8.4 Device Functional Modes
      1. 8.4.1 Power-Up and Reset
        1. 8.4.1.1 Power-On Reset
        2. 8.4.1.2 RESET Pin
        3. 8.4.1.3 Reset by Command
      2. 8.4.2 Conversion Modes
        1. 8.4.2.1 Single-Shot Conversion Mode
        2. 8.4.2.2 Continuous Conversion Mode
      3. 8.4.3 Power-Down Mode
    5. 8.5 Programming
      1. 8.5.1 I2C Interface
        1. 8.5.1.1 I2C Address
        2. 8.5.1.2 Serial Clock (SCL) and Serial Data (SDA)
        3. 8.5.1.3 Data Ready (DRDY)
        4. 8.5.1.4 Interface Speed
        5. 8.5.1.5 Data Transfer Protocol
        6. 8.5.1.6 I2C General Call (Software Reset)
        7. 8.5.1.7 Timeout
      2. 8.5.2 Data Format
      3. 8.5.3 Commands
        1. 8.5.3.1 Command Latching
        2. 8.5.3.2 RESET (0000 011x)
        3. 8.5.3.3 START/SYNC (0000 100x)
        4. 8.5.3.4 POWERDOWN (0000 001x)
        5. 8.5.3.5 RDATA (0001 xxxx)
        6. 8.5.3.6 RREG (0010 0rxx)
        7. 8.5.3.7 WREG (0100 00xx dddd dddd)
      4. 8.5.4 Reading Data and Monitoring for New Conversion Results
    6. 8.6 Register Map
      1. 8.6.1 Configuration and Status Registers
      2. 8.6.2 Register Descriptions
        1. 8.6.2.1 Configuration Register (address = 0h) [reset = 00h]
          1. Table 10. Configuration Register Field Descriptions
        2. 8.6.2.2 Status Register (address = 1h) [reset = 00h]
          1. Table 11. Status Register Field Descriptions
  9. Application and Implementation
    1. 9.1 Application Information
      1. 9.1.1 Interface Connections
      2. 9.1.2 Connecting Multiple Devices on the Same I2C Bus
      3. 9.1.3 Unused Inputs and Outputs
      4. 9.1.4 Analog Input Filtering
      5. 9.1.5 External Reference and Ratiometric Measurements
      6. 9.1.6 Establishing Proper Limits on the Absolute Input Voltage
      7. 9.1.7 Pseudo Code Example
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
        1. 9.2.2.1 Voltage Monitoring
        2. 9.2.2.2 High-Side Current Measurement
        3. 9.2.2.3 Thermistor Measurement
        4. 9.2.2.4 Register Settings
      3. 9.2.3 Application Curve
  10. 10Power Supply Recommendations
    1. 10.1 Power-Supply Sequencing
    2. 10.2 Power-Supply Decoupling
  11. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  12. 12器件和文档支持
    1. 12.1 器件支持
      1. 12.1.1 第三方米6体育平台手机版_好二三四免责声明
    2. 12.2 文档支持
      1. 12.2.1 相关文档
    3. 12.3 接收文档更新通知
    4. 12.4 社区资源
    5. 12.5 商标
    6. 12.6 静电放电警告
    7. 12.7 术语表
  13. 13机械、封装和可订购信息

Noise Performance

Delta-sigma (ΔΣ) analog-to-digital converters (ADCs) are based on the principle of oversampling. The input signal of a ΔΣ ADC is sampled at a high frequency (modulator frequency) and subsequently filtered and decimated in the digital domain to yield a conversion result at the respective output data rate. The ratio between modulator frequency and output data rate is called oversampling ratio (OSR). By increasing the OSR, and thus reducing the output data rate, the noise performance of the ADC can be optimized. In other words, the input-referred noise drops when reducing the output data rate because more samples of the internal modulator are averaged to yield one conversion result. Increasing the gain also reduces the input-referred noise, which is particularly useful when measuring low-level signals.

Table 1 and Table 2 summarize the device noise performance. Data are representative of typical noise performance at TA = 25°C using the internal 2.048-V reference. Data shown are the result of averaging readings from a single device over a time period of approximately 0.75 seconds and are measured with the inputs internally shorted together. Table 1 lists the input-referred noise in units of μVRMS for the conditions shown. Values in µVPP are shown in parenthesis. Table 2 lists the corresponding data in effective resolution calculated from μVRMS values using Equation 1. Noise-free resolution calculated from peak-to-peak noise values using Equation 2 are shown in parenthesis.

The input-referred noise only changes marginally when using an external low-noise reference, such as the REF5020. Use Equation 1 and Equation 2 to calculate effective resolution numbers and noise-free resolution when using a reference voltage other than 2.048 V:

Equation 1. Effective Resolution = ln [2 · VREF / (Gain · VRMS-Noise)] / ln(2)
Equation 2. Noise-Free Resolution = ln [2 · VREF / (Gain · VPP-Noise)] / ln(2)

Table 1. Noise in μVRMS (μVPP)
at AVDD = 3.3 V and Internal VREF = 2.048 V

DATA RATE
(SPS)
GAIN
1 4
20 5.04 (19.71) 1.57 (5.68)
90 8.75 (42.59) 2.13 (10.52)
330 18.58 (106.06) 4.54 (26.30)
1000 36.98 (221.61) 9.27 (55.07)

Table 2. Effective Resolution From RMS Noise (Noise-Free Resolution From Peak-to-Peak Noise)
at AVDD = 3.3 V and Internal VREF = 2.048 V

DATA RATE
(SPS)
GAIN
1 4
20 19.63 (17.66) 19.32 (17.46)
90 18.84 (16.55) 18.87 (16.57)
330 17.75 (15.24) 17.78 (15.25)
1000 16.76 (14.17) 16.75 (14.18)