米6体育平台手机版

ZHCSMX2B June 2007 – July 2021 TRS3221E

PRODUCTION DATA

6.8 Driver Section Switching Characteristics

over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see Figure 9-1)

PARAMETER		TEST CONDITIONS⁽³⁾			MIN	TYP⁽¹⁾	MAX	UNIT
	Maximum data rate	C_L = 1000 pF,	R_L = 3 kΩ, See Figure 7-1	RGT package	250	500		kbit/s
	Maximum data rate	C_L = 1000 pF,	R_L = 3 kΩ, See Figure 7-1	DB or PW package	150	250		kbit/s
t_sk(p)	Pulse skew⁽²⁾	C_L = 1000 pF,	R_L = 3 kΩ Figure 7-2	RGT package		50		ns
t_sk(p)	Pulse skew⁽²⁾	C_L = 150 pF to 2500 pF,	R_L = 3 kΩ to 7 kΩ, See Figure 7-2	DB or PW package		100		ns
SR(tr)	Slew rate, transition region (see Figure 7-1)	V_CC = 3.3 V, R_L = 3 kΩ to 7 kΩ	C_L = 150 pF to 1000 pF		6		30	V/μs
SR(tr)	Slew rate, transition region (see Figure 7-1)	V_CC = 3.3 V, R_L = 3 kΩ to 7 kΩ	C_L = 150 pF to 2500 pF		4		30	V/μs

(1) All typical values are at V_CC = 3.3 V or V_CC = 5 V, and T_A = 25°C.

(2) Pulse skew is defined as |t_PLH – t_PHL| of each channel of the same device.

(3) Test conditions are C1–C4 = 0.1 μF at V_CC = 3.3 V ± 0.3 V; C1 = 0.047 μF, C2–C4 = 0.33 μF at V_CC = 5 V ± 0.5 V.