ZHCSNY0B May   2020  – January 2023 BQ25798

PRODUCTION DATA  

  1. 特性
  2. 应用
  3. 说明
  4. Revision History
  5. 说明(续)
  6. Device Comparison
  7. Pin Configuration and Functions
  8. Specifications
    1. 8.1 Absolute Maximum Ratings
    2. 8.2 ESD Ratings
    3. 8.3 Recommended Operating Conditions
    4. 8.4 Thermal Information
    5. 8.5 Electrical Characteristics
    6. 8.6 Timing Requirements
    7. 8.7 Typical Characteristics
  9. Detailed Description
    1. 9.1 Overview
    2. 9.2 Functional Block Diagram
    3. 9.3 Feature Description
      1. 9.3.1  Device Power-On-Reset
      2. 9.3.2  PROG Pin Configuration
      3. 9.3.3  Device Power Up from Battery without Input Source
      4. 9.3.4  Device Power Up from Input Source
        1. 9.3.4.1 Power Up REGN LDO
        2. 9.3.4.2 Poor Source Qualification
        3. 9.3.4.3 ILIM_HIZ Pin
        4. 9.3.4.4 Default VINDPM Setting
        5. 9.3.4.5 Input Source Type Detection
          1. 9.3.4.5.1 D+/D– Detection Sets Input Current Limit
          2. 9.3.4.5.2 HVDCP Detection Procedure
          3. 9.3.4.5.3 Connector Fault Detection
      5. 9.3.5  Dual-Input Power Mux
        1. 9.3.5.1 ACDRV Turn On Condition
        2. 9.3.5.2 VBUS Input Only
        3. 9.3.5.3 One ACFET-RBFET
        4. 9.3.5.4 Two ACFETs-RBFETs
      6. 9.3.6  Buck-Boost Converter Operation
        1. 9.3.6.1 Force Input Current Limit Detection
        2. 9.3.6.2 Input Current Optimizer (ICO)
        3. 9.3.6.3 Maximum Power Point Tracking for Small PV Panel
        4. 9.3.6.4 Pulse Frequency Modulation (PFM)
        5. 9.3.6.5 Device HIZ State
      7. 9.3.7  USB On-The-Go (OTG)
        1. 9.3.7.1 OTG Mode to Power External Devices
        2. 9.3.7.2 Backup Power Supply Mode
        3. 9.3.7.3 Backup Mode with Dual Input Mux
      8. 9.3.8  Power Path Management
        1. 9.3.8.1 Narrow VDC Architecture
        2. 9.3.8.2 Dynamic Power Management
      9. 9.3.9  Battery Charging Management
        1. 9.3.9.1 Autonomous Charging Cycle
        2. 9.3.9.2 Battery Charging Profile
        3. 9.3.9.3 Charging Termination
        4. 9.3.9.4 Charging Safety Timer
        5. 9.3.9.5 Thermistor Qualification
          1. 9.3.9.5.1 JEITA Guideline Compliance in Charge Mode
          2. 9.3.9.5.2 Cold/Hot Temperature Window in OTG Mode
      10. 9.3.10 Integrated 16-Bit ADC for Monitoring
      11. 9.3.11 Status Outputs ( STAT, and INT)
        1. 9.3.11.1 Charging Status Indicator (STAT Pin)
        2. 9.3.11.2 Interrupt to Host ( INT)
      12. 9.3.12 Ship FET Control
        1. 9.3.12.1 Shutdown Mode
        2. 9.3.12.2 Ship Mode
        3. 9.3.12.3 System Power Reset
      13. 9.3.13 Protections
        1. 9.3.13.1 Voltage and Current Monitoring
          1. 9.3.13.1.1  VAC Over-voltage Protection (VAC_OVP)
          2. 9.3.13.1.2  VBUS Over-voltage Protection (VBUS_OVP)
          3. 9.3.13.1.3  VBUS Under-voltage Protection (POORSRC)
          4. 9.3.13.1.4  System Over-voltage Protection (VSYS_OVP)
          5. 9.3.13.1.5  System Short Protection (VSYS_SHORT)
          6. 9.3.13.1.6  Battery Over-voltage Protection (VBAT_OVP)
          7. 9.3.13.1.7  Battery Over-current Protection (IBAT_OCP)
          8. 9.3.13.1.8  Input Over-current Protection (IBUS_OCP)
          9. 9.3.13.1.9  OTG Over-voltage Protection (OTG_OVP)
          10. 9.3.13.1.10 OTG Under-voltage Protection (OTG_UVP)
        2. 9.3.13.2 Thermal Regulation and Thermal Shutdown
      14. 9.3.14 Serial Interface
        1. 9.3.14.1 Data Validity
        2. 9.3.14.2 START and STOP Conditions
        3. 9.3.14.3 Byte Format
        4. 9.3.14.4 Acknowledge (ACK) and Not Acknowledge (NACK)
        5. 9.3.14.5 Target Address and Data Direction Bit
        6. 9.3.14.6 Single Write and Read
        7. 9.3.14.7 Multi-Write and Multi-Read
    4. 9.4 Device Functional Modes
      1. 9.4.1 Host Mode and Default Mode
      2. 9.4.2 Register Bit Reset
    5. 9.5 Register Map
      1. 9.5.1 I2C Registers
  10. 10Application and Implementation
    1. 10.1 Application Information
    2. 10.2 Typical Application
      1. 10.2.1 Design Requirements
      2. 10.2.2 Detailed Design Procedure
        1. 10.2.2.1 PV Panel Selection
        2. 10.2.2.2 Inductor Selection
        3. 10.2.2.3 Input (VBUS / PMID) Capacitor
        4. 10.2.2.4 Output (VSYS) Capacitor
      3. 10.2.3 Application Curves
  11. 11Power Supply Recommendations
  12. 12Layout
    1. 12.1 Layout Guidelines
    2. 12.2 Layout Example
  13. 13Device and Documentation Support
    1. 13.1 Device Support
      1. 13.1.1 第三方米6体育平台手机版_好二三四免责声明
    2. 13.2 Documentation Support
      1. 13.2.1 Related Documentation
    3. 13.3 接收文档更新通知
    4. 13.4 支持资源
    5. 13.5 Trademarks
    6. 13.6 静电放电警告
    7. 13.7 术语表
  14. 14Mechanical, Packaging, and Orderable Information

Integrated 16-Bit ADC for Monitoring

The device has an integrated 16-bit ADC to provide the user with critical system information for optimizing the behavior of the charger. The ADC is controlled through the ADC Control register. The ADC_EN bit provides the ability to disable the ADC in order to conserve power dissipation. The ADC_RATE bit allows continuous conversion or one-shot behavior. After a 1-shot conversion finishes, the ADC_EN bit is cleared, and must be re-asserted to start a new conversion. The ADC_AVG bit enables or disables (default) averaging. ADC_AVG_INIT starts average using the existing (default) or using a new ADC value.

To enable the ADC, the ADC_EN bit must be set to 1. The ADC is allowed to operate if either VBUS > 3.4 V or VBAT > 2.9 V is valid. If ADC_EN is set to 1 before VBUS or VBAT reaches its valid threshold, then the ADC conversion is postponed until one of the power supplies reaches the threshold. If the charger is in HIZ mode, the ADC still can be enabled by setting ADC_EN = 1. At battery only condition, if the TS_ADC channel is enabled, the ADC only works when battery voltage is higher than 3.2V, otherwise, the ADC works when the battery voltage is higher than 2.9V.

The ADC_SAMPLE bits control the ADC sample speed, with conversion times of tADC_CONV. If the host changes the sample speed in the middle of an ADC conversion, the ADC conversion stops the channel being converted, and that channel is reconverted at the new rate. At that point, some of the ADC register values might have been converted with one sample rate and others with a different sample rate.

By default, all ADC channels are enabled with 1-shot or continuous conversion mode unless the channel is disabled in the ADC_Function_Disable_0 or ADC_Function_Disable_1 register. If an ADC channel is disabled by setting the corresponding register bit, then the value in that register is from the last valid ADC conversion or the default POR value (all zeros.) If an ADC channel is disabled in the middle of an ADC measurement cycle, the device finishes the conversion of that channel. Even though no conversion takes place when all ADC channels are disabled, the ADC circuitry is active and ready to begin conversion as soon as one of the bits in the ADC_Function_Disable_0 or ADC_Function_Disable_1 register is set to 0. In order to achieve the lowest quiescent current when disabling all ADC channels, set EN_ADC to 0 instead of disabling with ADC_Function_Disable_0 and ADC_Function_Disable_1.

The ADC_DONE_STAT and ADC_DONE_FLAG bits are set when a conversion is complete in 1-shot mode only. This event produces an INT pulse, which can be masked with ADC_DONE_MASK. During continuous conversion mode, the ADC_DONE_STAT and ADC_DONE_FLAG bits have no meaning and remain 0.

ADC conversion operates independently of the faults present in the device. ADC conversion continues even after a fault has occurred. ADC readings are only valid for DC states and not for transients.

If the host wants to exit the ADC more gracefully, it is recommended to write ADC_RATE to one-shot in order to force the ADC to stop at the end of a complete cycle of conversions.

ADC Measurement Channels:

  • IBUS (positive in forward converter mode)
  • IBAT (positive for charging)
  • VBUS
  • VPMID
  • VBAT
  • VSYS
  • TS
  • TDIE