ADS808
- DYNAMIC RANGE:
SNR: 64dB at 10MHz fIN
SFDR: 68dB at 10MHz fIN - PREMIUM TRACK-AND-HOLD:
Low Jitter: 0.25ps rms
Differential or Single-Ended Inputs
Selectable Full-Scale Input Range - FLEXIBLE CLOCKING:
Differential or Single-Ended
Accepts Sine or Square Wave Clocking
Down to 0.5Vp-p
Variable Threshold Level - APPLICATIONS
- BASESTATION WIDEBAND RADIOS:
CDMA, GSM, TDMA, 3G, AMPS, and NMT - TEST INSTRUMENTATION
- CCD IMAGING
- BASESTATION WIDEBAND RADIOS:
PowerPAD is a registered trademark of Texas Instruments.
The ADS808 is a high-dynamic range, 12-bit, 70MHz, pipelined Analog-to-Digital Converter (ADC). It includes a high-bandwidth linear track-and-hold that has a low jitter of only 0.25ps rms, leading to excellent SNR performance. The clock input can accept a low-level differential sine wave or square wave signal down to 0.5Vp-p, further improving the SNR performance. It also accepts a single-ended clock signal and has flexible threshold levels.
The ADS808 has a 2Vp-p differential input range (1Vp-p • 2 inputs) for optimum signal-to-noise ratio. The differential operation gives the lowest even-order harmonic components. A lower input voltage of 1.5Vp-p or 1Vp-p can also be selected using the internal references, further optimizing SFDR. Alternatively, a single-ended input range can be used by tying the IN\ input to the common-mode voltage, if desired.
The ADS808 also provides an over-range flag that indicates when the input signal has exceeded the converter’s full-scale range. This flag can also be used to reduce the gain of the front-end signal conditioning circuitry. It also employs digital error-correction techniques to provide excellent differential linearity for demanding imaging applications. The ADS808 is available in a small TQFP-48 PowerPAD™ thermally enhanced package.
技术文档
类型 | 标题 | 下载最新的英语版本 | 日期 | |||
---|---|---|---|---|---|---|
* | 数据表 | ADS808: 12-Bit, 70MHz Sampling Analog-to-Digital Converter 数据表 (Rev. C) | 2002年 9月 4日 |
订购和质量
- RoHS
- REACH
- 器件标识
- 引脚镀层/焊球材料
- MSL 等级/回流焊峰值温度
- MTBF/时基故障估算
- 材料成分
- 鉴定摘要
- 持续可靠性监测
- 制造厂地点
- 封装厂地点