米6体育平台手机版_好二三四详情

Technology family GTL Applications GTL Rating Catalog Operating temperature range (°C) -40 to 85
Technology family GTL Applications GTL Rating Catalog Operating temperature range (°C) -40 to 85
SSOP (DL) 56 190.647 mm² 18.42 x 10.35 TSSOP (DGG) 56 113.4 mm² 14 x 8.1
  • Members of Texas Instruments' Widebus™ Family
  • UBT™ Transceivers Combine D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, Clocked, or Clock-Enabled Modes
  • OEC™ Circuitry Improves Signal Integrity and Reduces Electromagnetic Interference
  • Translate Between GTL/GTL+ Signal Levels and LVTTL Logic Levels
  • Support Mixed-Mode (3.3 V and 5 V) Signal Operation on A-Port and Control Inputs
  • Identical to \x9216601 Function
  • Ioff Supports Partial-Power-Down Mode Operation
  • Bus Hold on Data Inputs Eliminates the Need for External Pullup/Pulldown Resistors on A Port
  • Distributed VCC and GND Pins Minimize High-Speed Switching Noise
  • Latch-Up Performance Exceeds 500 mA Per JESD 17

OEC, UBT, and Widebus are trademarks of Texas Instruments.

  • Members of Texas Instruments' Widebus™ Family
  • UBT™ Transceivers Combine D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, Clocked, or Clock-Enabled Modes
  • OEC™ Circuitry Improves Signal Integrity and Reduces Electromagnetic Interference
  • Translate Between GTL/GTL+ Signal Levels and LVTTL Logic Levels
  • Support Mixed-Mode (3.3 V and 5 V) Signal Operation on A-Port and Control Inputs
  • Identical to \x9216601 Function
  • Ioff Supports Partial-Power-Down Mode Operation
  • Bus Hold on Data Inputs Eliminates the Need for External Pullup/Pulldown Resistors on A Port
  • Distributed VCC and GND Pins Minimize High-Speed Switching Noise
  • Latch-Up Performance Exceeds 500 mA Per JESD 17

OEC, UBT, and Widebus are trademarks of Texas Instruments.

The 'GTL16612 devices are 18-bit UBT™ transceivers that provide LVTTL-to-GTL/GTL+ and GTL/GTL+-to-LVTTL signal-level translation. They combine D-type flip-flops and D-type latches to allow for transparent, latched, clocked, and clock-enabled modes of data transfer identical to the '16601 function. The devices provide an interface between cards operating at LVTTL logic levels and a backplane operating at GTL/GTL+ signal levels. Higher-speed operation is a direct result of the reduced output swing (<1 V), reduced input threshold levels, and OEC™ circuitry.

The user has the flexibility of using these devices at either GTL (VTT = 1.2 V and VREF = 0.8 V) or the preferred higher noise margin GTL+ (VTT = 1.5 V and VREF = 1 V) signal levels. GTL+ is the Texas Instruments derivative of the Gunning Transceiver Logic (GTL) JEDEC standard JESD 8-3. The B port normally operates at GTL or GTL+ signal levels, while the A-port and control inputs are compatible with LVTTL logic levels and are 5-V tolerant. VREF is the reference input voltage for the B port.

VCC (5 V) supplies the internal and GTL circuitry while VCC (3.3 V) supplies the LVTTL output buffers.

Data flow in each direction is controlled by output-enable (OEAB\ and OEBA\), latch-enable(LEAB and LEBA), and clock (CLKAB and CLKBA) inputs. The clock can be controlled by the clock-enable (CEAB\ and CEBA\) inputs. For A-to-B data flow, the devices operate in the transparent mode when LEAB is high. When LEAB is low, the A data is latched if CEAB\ is low and CLKAB is held at a high or low logic level. If LEAB is low, the A data is stored in the latch/flip-flop on the low-to-high transition of CLKAB if CEAB\ also is low. When OEAB\ is low, the outputs are active. When OEAB\ is high, the outputs are in the high-impedance state. Data flow for B to A is similar to that for A to B, but uses OEBA\, LEBA, CLKBA, and CEBA\.

These devices are fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.

Active bus-hold circuitry holds unused or undriven LVTTL inputs at a valid logic state. Use of pullup or pulldown resistors with the bus-hold circuitry is not recommended.

The 'GTL16612 devices are 18-bit UBT™ transceivers that provide LVTTL-to-GTL/GTL+ and GTL/GTL+-to-LVTTL signal-level translation. They combine D-type flip-flops and D-type latches to allow for transparent, latched, clocked, and clock-enabled modes of data transfer identical to the '16601 function. The devices provide an interface between cards operating at LVTTL logic levels and a backplane operating at GTL/GTL+ signal levels. Higher-speed operation is a direct result of the reduced output swing (<1 V), reduced input threshold levels, and OEC™ circuitry.

The user has the flexibility of using these devices at either GTL (VTT = 1.2 V and VREF = 0.8 V) or the preferred higher noise margin GTL+ (VTT = 1.5 V and VREF = 1 V) signal levels. GTL+ is the Texas Instruments derivative of the Gunning Transceiver Logic (GTL) JEDEC standard JESD 8-3. The B port normally operates at GTL or GTL+ signal levels, while the A-port and control inputs are compatible with LVTTL logic levels and are 5-V tolerant. VREF is the reference input voltage for the B port.

VCC (5 V) supplies the internal and GTL circuitry while VCC (3.3 V) supplies the LVTTL output buffers.

Data flow in each direction is controlled by output-enable (OEAB\ and OEBA\), latch-enable(LEAB and LEBA), and clock (CLKAB and CLKBA) inputs. The clock can be controlled by the clock-enable (CEAB\ and CEBA\) inputs. For A-to-B data flow, the devices operate in the transparent mode when LEAB is high. When LEAB is low, the A data is latched if CEAB\ is low and CLKAB is held at a high or low logic level. If LEAB is low, the A data is stored in the latch/flip-flop on the low-to-high transition of CLKAB if CEAB\ also is low. When OEAB\ is low, the outputs are active. When OEAB\ is high, the outputs are in the high-impedance state. Data flow for B to A is similar to that for A to B, but uses OEBA\, LEBA, CLKBA, and CEBA\.

These devices are fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.

Active bus-hold circuitry holds unused or undriven LVTTL inputs at a valid logic state. Use of pullup or pulldown resistors with the bus-hold circuitry is not recommended.

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类型 标题 下载最新的英语版本 日期
* 数据表 18-Bit LVTTL-to-GTL/GTL+ Universal Bus Transceivers 数据表 (Rev. K) 2001年 8月 6日
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选择指南 逻辑器件指南 2014 (Rev. AA) 最新英语版本 (Rev.AB) 2014年 11月 17日
选择指南 《高级总线接口逻辑器件选择指南》 英语版 2010年 7月 7日
用户指南 LOGIC Pocket Data Book (Rev. B) 2007年 1月 16日
应用手册 Semiconductor Packing Material Electrostatic Discharge (ESD) Protection 2004年 7月 8日
应用手册 TI IBIS File Creation, Validation, and Distribution Processes 2002年 8月 29日
应用手册 Power-Up 3-State (PU3S) Circuits in TI Standard Logic Devices 2002年 5月 10日
用户指南 GTLP/GTL Logic High-Performance Backplane Drivers Data Book (Rev. A) 2001年 9月 15日
应用手册 GTL/BTL: A Low-Swing Solution for High-Speed Digital Logic (Rev. A) 1997年 3月 1日
应用手册 Understanding Advanced Bus-Interface Products Design Guide 1996年 5月 1日

设计和开发

如需其他信息或资源,请点击以下任一标题进入详情页面查看(如有)。

仿真模型

SN74GTL16612 IBIS Model

SCEM030.ZIP (12 KB) - IBIS Model
仿真模型

SN74GTL16612 IBIS Model

SCEM110.ZIP (12 KB) - IBIS Model
封装 引脚 CAD 符号、封装和 3D 模型
SSOP (DL) 56 Ultra Librarian
TSSOP (DGG) 56 Ultra Librarian

订购和质量

包含信息:
  • RoHS
  • REACH
  • 器件标识
  • 引脚镀层/焊球材料
  • MSL 等级/回流焊峰值温度
  • MTBF/时基故障估算
  • 材料成分
  • 鉴定摘要
  • 持续可靠性监测
包含信息:
  • 制造厂地点
  • 封装厂地点

支持和培训

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