SN74LV4051A-EP

Name: SN74LV4051A-EP
Brand: TI
SKU: SN74LV4051A-EP
Price: 1.223 USD

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5V 8:1 单通道通用模拟多路复用器（增强型米6体育平台手机版_好二三四）

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数据表

document-pdfAcrobat SN74LV4051A-EP 数据表 (Rev. D) (英语)

SN74LV4051A-EP

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数据表

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米6体育平台手机版_好二三四详情

Configuration

8:1

Number of channels

1

Power supply voltage - single (V)

1.8, 2.5, 3.3, 5

Protocols

Analog

Ron (typ) (Ω)

22

CON (typ) (pF)

23.4

ON-state leakage current (max) (µA)

1

Bandwidth (MHz)

35

Operating temperature range (°C)

-40 to 105

Input/output continuous current (max) (mA)

25

Rating

HiRel Enhanced Product

Drain supply voltage (max) (V)

5.5

Supply voltage (max) (V)

5.5

Configuration

8:1

Number of channels

1

Power supply voltage - single (V)

1.8, 2.5, 3.3, 5

Protocols

Analog

Ron (typ) (Ω)

22

CON (typ) (pF)

23.4

ON-state leakage current (max) (µA)

1

Bandwidth (MHz)

35

Operating temperature range (°C)

-40 to 105

Input/output continuous current (max) (mA)

25

Rating

HiRel Enhanced Product

Drain supply voltage (max) (V)

5.5

Supply voltage (max) (V)

5.5

SOIC (D)

16

59.4 mm² 9.9 x 6

TSSOP (PW)

16

32 mm² 5 x 6.4

Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
Extended Temperature Performance of –40°C to 105°C
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree
2-V to 5.5-V V_CC Operation
Support Mixed-Mode Voltage Operation on All Ports
High On-Off Output-Voltage Ratio
Low Crosstalk Between Switches
Individual Switch Controls
Extremely Low Input Current
Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II
ESD Protection Exceeds JESD 22
- 2000-V Human-Body Model (A114-A)
- 200-V Machine Model (A115-A)
- 1000-V Charged-Device Model (C101)

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
Extended Temperature Performance of –40°C to 105°C
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree
2-V to 5.5-V V_CC Operation
Support Mixed-Mode Voltage Operation on All Ports
High On-Off Output-Voltage Ratio
Low Crosstalk Between Switches
Individual Switch Controls
Extremely Low Input Current
Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II
ESD Protection Exceeds JESD 22
- 2000-V Human-Body Model (A114-A)
- 200-V Machine Model (A115-A)
- 1000-V Charged-Device Model (C101)

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

This 8-channel CMOS analog multiplexer/demultiplexer is designed for 2-V to 5.5-V V_CC operation.

The SN74LV4051A handles both analog and digital signals. Each channel permits signals with amplitudes up to 5.5 V (peak) to be transmitted in either direction.

Applications include signal gating, chopping, modulation or demodulation (modem), and signal multiplexing for analog-to-digital and digital-to-analog conversion systems.

This 8-channel CMOS analog multiplexer/demultiplexer is designed for 2-V to 5.5-V V_CC operation.

The SN74LV4051A handles both analog and digital signals. Each channel permits signals with amplitudes up to 5.5 V (peak) to be transmitted in either direction.

Applications include signal gating, chopping, modulation or demodulation (modem), and signal multiplexing for analog-to-digital and digital-to-analog conversion systems.

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