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SCLS464A September 2002 – January 2015 CD74HC4051-EP

PRODUCTION DATA.

封装选项

请参考 PDF 数据表获取器件具体的封装图。

机械数据 (封装 | 引脚)

D|16

散热焊盘机械数据 (封装 | 引脚)

订购信息

1 Features

Controlled Baseline
- One Assembly and Test Site, One Fabrication Site
Extended Temperature Performance of –55°C to 125°C
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product Change Notification
Qualification Pedigree⁽¹⁾
Wide Analog Input Voltage Range of ±5 V Max
Low ON-Resistance
- 70 Ω Typical (V_CC – V_EE = 4.5 V)
- 40 Ω Typical (V_CC – V_EE = 9 V)
Low Crosstalk Between Switches
Fast Switching and Propagation Speeds
Break-Before-Make Switching
Operation Control Voltage = 2 V to 6 V
Switch Voltage = 0 V to 10 V
High Noise Immunity N_IL = 30%, N_IH = 30% of V_CC, V_CC = 5 V ⁽¹⁾

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

2 Applications

Supports Defense and Aerospace Applications

3 Description

The CD74HC4051-EP is a digitally controlled analog switch that uses silicon gate CMOS technology to achieve operating speeds similar to LSTTL, with the low power consumption of standard CMOS integrated circuits.

This analog multiplexer and demultiplexer controls analog voltages that may vary across the voltage supply range (that is, V_CC to V_EE). These bidirectional switches allow the use of any analog input as an output and vice versa. The switches have low ON-resistance and low OFF leakages. In addition, the device has an enable control (E) that, when high, disables all switches to their OFF state.

Device Information⁽¹⁾

PART NUMBER	PACKAGE	BODY SIZE (NOM)
CD74HC4051-EP	SOIC (16)	4.00 mm × 10.00 mm

For all available packages, see the orderable addendum at the end of the data sheet.

Functional Block Diagram

4 Revision History

Changes from * Revision (September 2002) to A Revision

Added ESD Ratings table, Feature Description section, Device Functional Modes, Application and Implementation section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and Mechanical, Packaging, and Orderable Information section. Go