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数模转换器 (DAC)
高速 DAC (> 10MSPS)

DAC5672-EP

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双通道 14 位 200Msps 数模转换器（增强型米6体育平台手机版_好二三四）

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DAC5672-EP

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米6体育平台手机版_好二三四详情

Resolution (Bits) 14 Number of DAC channels 2 Interface type Parallel CMOS Sample/update rate (Msps) 200 Features Low Power Rating HiRel Enhanced Product Interpolation 1x Power consumption (typ) (mW) 330 SFDR (dB) 84 Architecture Current Source Operating temperature range (°C) -55 to 125 Reference type Int
Resolution (Bits) 14 Number of DAC channels 2 Interface type Parallel CMOS Sample/update rate (Msps) 200 Features Low Power Rating HiRel Enhanced Product Interpolation 1x Power consumption (typ) (mW) 330 SFDR (dB) 84 Architecture Current Source Operating temperature range (°C) -55 to 125 Reference type Int
TQFP (PFB) 48 81 mm² 9 x 9
  • Controlled Baseline
    • One Assembly
    • One Test Site
    • One Fabrication Site
  • Extended Temperature Performance of -55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree(1)
  • 14-Bit Dual Transmit Digital-to-Analog Converter (DAC)
  • 200-MSPS Update Rate
  • Single Supply: 3 V to 3.6 V
  • High Spurious-Free Dynamic Range (SFDR): 84 dBc at 5 MHz
  • High Third-Order Two-Tone Intermodulation (IMD3): 79 dBc at 15.1 MHz and 16.1 MHz
  • WCDMA Adjacent Channel Leakage Ratio (ACLR): 78 dB at Baseband
  • WCDMA ACLR: 73 dB at 30.72 MHz
  • Independent or Single Resistor Gain Control
  • Dual or Interleaved Data
  • On-Chip 1.2-V Reference
  • Low Power: 330 mW
  • Power-Down Mode: 9 mW
  • Package: 48-Pin Thin-Quad Flat Pack (TQFP)
  • APPLICATIONS
    • Cellular Base Transceiver Station Transmit Channel
      • CDMA: W-CDMA, CDMA2000, IS-95
      • TDMA: GSM, IS-136, EDGE/UWC-136
    • Medical/Test Instrumentation
    • Arbitrary Waveform Generators (ARB)
    • Direct Digital Synthesis (DDS)
    • Cable Modem Termination System (CMTS)

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
  • Controlled Baseline
    • One Assembly
    • One Test Site
    • One Fabrication Site
  • Extended Temperature Performance of -55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree(1)
  • 14-Bit Dual Transmit Digital-to-Analog Converter (DAC)
  • 200-MSPS Update Rate
  • Single Supply: 3 V to 3.6 V
  • High Spurious-Free Dynamic Range (SFDR): 84 dBc at 5 MHz
  • High Third-Order Two-Tone Intermodulation (IMD3): 79 dBc at 15.1 MHz and 16.1 MHz
  • WCDMA Adjacent Channel Leakage Ratio (ACLR): 78 dB at Baseband
  • WCDMA ACLR: 73 dB at 30.72 MHz
  • Independent or Single Resistor Gain Control
  • Dual or Interleaved Data
  • On-Chip 1.2-V Reference
  • Low Power: 330 mW
  • Power-Down Mode: 9 mW
  • Package: 48-Pin Thin-Quad Flat Pack (TQFP)
  • APPLICATIONS
    • Cellular Base Transceiver Station Transmit Channel
      • CDMA: W-CDMA, CDMA2000, IS-95
      • TDMA: GSM, IS-136, EDGE/UWC-136
    • Medical/Test Instrumentation
    • Arbitrary Waveform Generators (ARB)
    • Direct Digital Synthesis (DDS)
    • Cable Modem Termination System (CMTS)

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

The DAC5672 is a monolithic, dual-channel, 14-bit, high-speed digital-to-analog converter (DAC) with on-chip voltage reference.

Operating with update rates of up to 200 MSPS, the DAC5672 offers exceptional dynamic performance, tight gain, and offset matching characteristics that make it suitable in either I/Q baseband or direct IF communication applications.

Each DAC has a high-impedance, differential-current output, suitable for single-ended or differential analog-output configurations. External resistors allow scaling the full-scale output current for each DAC separately or together, typically between 2 mA and 20 mA. An accurate on-chip voltage reference is temperature compensated and delivers a stable 1.2-V reference voltage. Optionally, an external reference may be used.

The DAC5672 has two 14-bit parallel input ports with separate clocks and data latches. For flexibility, the DAC5672 also supports multiplexed data for each DAC on one port when operating in the interleaved mode.

The DAC5672 has been specifically designed for a differential transformer-coupled output with a 50- doubly-terminated load. For a 20-mA full-scale output current, both a 4:1 impedance ratio (resulting in an output power of 4 dBm) and 1:1 impedance ratio transformer (-2 dBm output power) are supported.

The DAC5672 is available in a 48-pin thin quad flat pack (TQFP) package. Pin compatibility between family members provides 12-bit (DAC5662) and 14-bit (DAC5672) resolution. Furthermore, the DAC5672 is pin compatible to the DAC2904 and AD9767 dual DACs. The device is characterized for operation over the military temperature range of -55°C to 125°C.

The DAC5672 is a monolithic, dual-channel, 14-bit, high-speed digital-to-analog converter (DAC) with on-chip voltage reference.

Operating with update rates of up to 200 MSPS, the DAC5672 offers exceptional dynamic performance, tight gain, and offset matching characteristics that make it suitable in either I/Q baseband or direct IF communication applications.

Each DAC has a high-impedance, differential-current output, suitable for single-ended or differential analog-output configurations. External resistors allow scaling the full-scale output current for each DAC separately or together, typically between 2 mA and 20 mA. An accurate on-chip voltage reference is temperature compensated and delivers a stable 1.2-V reference voltage. Optionally, an external reference may be used.

The DAC5672 has two 14-bit parallel input ports with separate clocks and data latches. For flexibility, the DAC5672 also supports multiplexed data for each DAC on one port when operating in the interleaved mode.

The DAC5672 has been specifically designed for a differential transformer-coupled output with a 50- doubly-terminated load. For a 20-mA full-scale output current, both a 4:1 impedance ratio (resulting in an output power of 4 dBm) and 1:1 impedance ratio transformer (-2 dBm output power) are supported.

The DAC5672 is available in a 48-pin thin quad flat pack (TQFP) package. Pin compatibility between family members provides 12-bit (DAC5662) and 14-bit (DAC5672) resolution. Furthermore, the DAC5672 is pin compatible to the DAC2904 and AD9767 dual DACs. The device is characterized for operation over the military temperature range of -55°C to 125°C.
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类型 标题 下载最新的英语版本 日期
* 数据表 DAC5672-EP 数据表 (Rev. A) 2006年 10月 10日
* VID DAC5672-EP VID V6206639 2016年 6月 21日
应用手册 High Speed, Digital-to-Analog Converters Basics (Rev. A) 2012年 10月 23日
应用手册 所选封装材料的热学和电学性质 2008年 10月 16日
应用手册 高速数据转换 英语版 2008年 10月 16日
应用手册 CDCE72010 as a Clocking Solution for High-Speed Analog-to-Digital Converters 2008年 6月 8日
应用手册 Phase Noise Performance and Jitter Cleaning Ability of CDCE72010 2008年 6月 2日

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  • REACH
  • 器件标识
  • 引脚镀层/焊球材料
  • MSL 等级/回流焊峰值温度
  • MTBF/时基故障估算
  • 材料成分
  • 鉴定摘要
  • 持续可靠性监测
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