SN54ALS873B

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具有三态输出的双路 4 位 D 类锁存器

米6体育平台手机版_好二三四详情

Number of channels 8 Technology family ALS Supply voltage (min) (V) 4.5 Supply voltage (max) (V) 5.5 Input type Bipolar Output type 3-State Clock frequency (max) (MHz) 75 IOL (max) (mA) 12 IOH (max) (mA) -1 Supply current (max) (µA) 31000 Features Flow-through pinout, High speed (tpd 10-50ns) Operating temperature range (°C) -55 to 125 Rating Military
Number of channels 8 Technology family ALS Supply voltage (min) (V) 4.5 Supply voltage (max) (V) 5.5 Input type Bipolar Output type 3-State Clock frequency (max) (MHz) 75 IOL (max) (mA) 12 IOH (max) (mA) -1 Supply current (max) (µA) 31000 Features Flow-through pinout, High speed (tpd 10-50ns) Operating temperature range (°C) -55 to 125 Rating Military
CDIP (JT) 24 221.44 mm² 32 x 6.92 LCCC (FK) 28 130.6449 mm² 11.43 x 11.43
  • 3-State Buffer-Type Outputs Drive Bus Lines Directly
  • Bus-Structured Pinout
  • Package Options Include Plastic Small-Outline (DW) Packages, Ceramic Chip Carriers (FK), and Plastic (NT) and Ceramic (JT) DIPs

 

  • 3-State Buffer-Type Outputs Drive Bus Lines Directly
  • Bus-Structured Pinout
  • Package Options Include Plastic Small-Outline (DW) Packages, Ceramic Chip Carriers (FK), and Plastic (NT) and Ceramic (JT) DIPs

 

These dual 4-bit D-type latches feature 3-state outputs designed specifically for bus driving. These devices are particularly suitable for implementing buffer registers, I/O ports, bidirectional bus drivers, and working registers.

The dual 4-bit latches are transparent D-type latches. While the latch-enable (LE) input is high, the Q outputs follow the data (D) inputs in true form, according to the function table. When LE is low, the outputs are latched. When the clear () input goes low, the Q outputs go low independently of LE. The outputs are in the high-impedance state when the output-enable () input is at a high logic level.

The SN54ALS873B and SN54AS873A are characterized for operation over the full military temperature range of -55°C to 125°C. The SN74ALS873B and SN74AS873A are characterized for operation from 0°C to 70°C.

 

 

These dual 4-bit D-type latches feature 3-state outputs designed specifically for bus driving. These devices are particularly suitable for implementing buffer registers, I/O ports, bidirectional bus drivers, and working registers.

The dual 4-bit latches are transparent D-type latches. While the latch-enable (LE) input is high, the Q outputs follow the data (D) inputs in true form, according to the function table. When LE is low, the outputs are latched. When the clear () input goes low, the Q outputs go low independently of LE. The outputs are in the high-impedance state when the output-enable () input is at a high logic level.

The SN54ALS873B and SN54AS873A are characterized for operation over the full military temperature range of -55°C to 125°C. The SN74ALS873B and SN74AS873A are characterized for operation from 0°C to 70°C.

 

 

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类型 标题 下载最新的英语版本 日期
* 数据表 Dual 4-Bit D-Type Latches With 3-State Outputs 数据表 (Rev. D) 1995年 8月 1日
* SMD SN54ALS873B SMD 84032013A 2016年 6月 21日
应用手册 Power-Up Behavior of Clocked Devices (Rev. B) PDF | HTML 2022年 12月 15日
选择指南 Logic Guide (Rev. AB) 2017年 6月 12日
应用手册 Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) 2015年 12月 2日
选择指南 逻辑器件指南 2014 (Rev. AA) 最新英语版本 (Rev.AB) 2014年 11月 17日
用户指南 LOGIC Pocket Data Book (Rev. B) 2007年 1月 16日
应用手册 Semiconductor Packing Material Electrostatic Discharge (ESD) Protection 2004年 7月 8日
应用手册 TI IBIS File Creation, Validation, and Distribution Processes 2002年 8月 29日
应用手册 Bus-Interface Devices With Output-Damping Resistors Or Reduced-Drive Outputs (Rev. A) 1997年 8月 1日
应用手册 使用逻辑器件进行设计 (Rev. C) 1997年 6月 1日
应用手册 Input and Output Characteristics of Digital Integrated Circuits 1996年 10月 1日
应用手册 Live Insertion 1996年 10月 1日
应用手册 Advanced Schottky (ALS and AS) Logic Families 1995年 8月 1日

设计和开发

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封装 引脚 CAD 符号、封装和 3D 模型
CDIP (JT) 24 Ultra Librarian
LCCC (FK) 28 Ultra Librarian

订购和质量

包含信息:
  • RoHS
  • REACH
  • 器件标识
  • 引脚镀层/焊球材料
  • MSL 等级/回流焊峰值温度
  • MTBF/时基故障估算
  • 材料成分
  • 鉴定摘要
  • 持续可靠性监测
包含信息:
  • 制造厂地点
  • 封装厂地点

支持和培训

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