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开关与多路复用器
数字多路复用器和编码器

SN74HC253-EP

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具有 3 态输出的双通道 4 线至 1 线数据选择器/多路复用器（增强型米6体育平台手机版_好二三四）

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SN74HC253-EP

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米6体育平台手机版_好二三四详情

Technology family HC Function Digital Multiplexer Configuration 4:1 Number of channels 2 Operating temperature range (°C) -40 to 125 Rating HiRel Enhanced Product
Technology family HC Function Digital Multiplexer Configuration 4:1 Number of channels 2 Operating temperature range (°C) -40 to 125 Rating HiRel Enhanced Product
SOIC (D) 16 59.4 mm² 9.9 x 6
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –40°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • 3-State Version of ’HC153
  • Wide Operating Voltage Range of 2 V to 6 V
  • High-Current Inverting Outputs Drive Up To 15 LSTTL Loads
  • Low Power Consumption, 80-µA Max ICC
  • Typical tpd = 9 ns
  • ±6-mA Output Drive at 5 V
  • Low Input Current of 1 µA Max
  • Permit Multiplexing From n Lines to One Line
  • Perform Parallel-to-Serial Conversion

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –40°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • 3-State Version of ’HC153
  • Wide Operating Voltage Range of 2 V to 6 V
  • High-Current Inverting Outputs Drive Up To 15 LSTTL Loads
  • Low Power Consumption, 80-µA Max ICC
  • Typical tpd = 9 ns
  • ±6-mA Output Drive at 5 V
  • Low Input Current of 1 µA Max
  • Permit Multiplexing From n Lines to One Line
  • Perform Parallel-to-Serial Conversion

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

Each data selector/multiplexer contains inverters and drivers to supply full binary decoding data selection to the AND-OR gates. Separate output-control inputs are provided for each of the two 4-line sections.

The 3-state outputs can interface with and drive data lines of bus-organized systems. With all but one of the common outputs disabled (in the high-impedance state), the low impedance of the single enabled output drives the bus line to a high or low logic level. Each output has its own output-enable (OE)\ input. The outputs are disabled when their respective OE\ is high.

Each data selector/multiplexer contains inverters and drivers to supply full binary decoding data selection to the AND-OR gates. Separate output-control inputs are provided for each of the two 4-line sections.

The 3-state outputs can interface with and drive data lines of bus-organized systems. With all but one of the common outputs disabled (in the high-impedance state), the low impedance of the single enabled output drives the bus line to a high or low logic level. Each output has its own output-enable (OE)\ input. The outputs are disabled when their respective OE\ is high.
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类型 标题 下载最新的英语版本 日期
* 数据表 SN74HC253-EP 数据表 2004年 1月 6日
* VID SN74HC253-EP VID V6204699 2016年 6月 21日
应用手册 Implications of Slow or Floating CMOS Inputs (Rev. E) 2021年 7月 26日
选择指南 Logic Guide (Rev. AB) 2017年 6月 12日
应用手册 Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) 2015年 12月 2日
选择指南 逻辑器件指南 2014 (Rev. AA) 最新英语版本 (Rev.AB) 2014年 11月 17日
用户指南 LOGIC Pocket Data Book (Rev. B) 2007年 1月 16日
应用手册 Semiconductor Packing Material Electrostatic Discharge (ESD) Protection 2004年 7月 8日
用户指南 Signal Switch Data Book (Rev. A) 2003年 11月 14日
应用手册 TI IBIS File Creation, Validation, and Distribution Processes 2002年 8月 29日
应用手册 CMOS Power Consumption and CPD Calculation (Rev. B) 1997年 6月 1日
应用手册 使用逻辑器件进行设计 (Rev. C) 1997年 6月 1日
应用手册 Input and Output Characteristics of Digital Integrated Circuits 1996年 10月 1日
应用手册 Live Insertion 1996年 10月 1日
应用手册 SN54/74HCT CMOS Logic Family Applications and Restrictions 1996年 5月 1日
应用手册 Using High Speed CMOS and Advanced CMOS in Systems With Multiple Vcc 1996年 4月 1日

设计和开发

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封装 引脚 CAD 符号、封装和 3D 模型
SOIC (D) 16 Ultra Librarian
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包含信息：
  • RoHS
  • REACH
  • 器件标识
  • 引脚镀层/焊球材料
  • MSL 等级/回流焊峰值温度
  • MTBF/时基故障估算
  • 材料成分
  • 鉴定摘要
  • 持续可靠性监测
包含信息：
  • 制造厂地点
  • 封装厂地点

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