SN74LV86A-EP
- Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
- Extended Temperature Performance of –40°C to 105°C
- Enhanced Diminishing Manufacturing Sources (DMS) Support
- Enhanced Product-Change Notification
- Qualification Pedigree
- 2-V to 5.5-V VCC Operation
- Typical VOLP (Output Ground Bounce)
<0.8 V at VCC = 3.3 V, TA = 25°C - Typical VOHV (Output VOH Undershoot)
>2.3 V at VCC = 3.3 V, TA = 25°C - Support Mixed-Mode Voltage Operation on All Ports
Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
The SN74LV86A is a quadruple 2-input exclusive-OR gate designed for 2-V to 5.5-V VCC operation.
This device contains four independent 2-input exclusive-OR gates. It performs the Boolean function Y = A B or Y = A\B + AB\ in positive logic.
A common application is as a true/complement element. If one of the inputs is low, the other input is reproduced in true form at the output. If one of the inputs is high, the signal on the other input is reproduced inverted at the output.
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功能与比较器件相同,且具有相同引脚
技术文档
类型 | 标题 | 下载最新的英语版本 | 日期 | |||
---|---|---|---|---|---|---|
* | 数据表 | SN74LV86A-EP 数据表 (Rev. A) | 2004年 5月 11日 | |||
* | VID | SN74LV86A-EP VID V6204694 | 2016年 6月 21日 | |||
* | 辐射与可靠性报告 | SN74LV86ATPWREP Reliability Report | 2014年 12月 22日 |
设计和开发
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封装 | 引脚 | CAD 符号、封装和 3D 模型 |
---|---|---|
TSSOP (PW) | 14 | Ultra Librarian |
订购和质量
- RoHS
- REACH
- 器件标识
- 引脚镀层/焊球材料
- MSL 等级/回流焊峰值温度
- MTBF/时基故障估算
- 材料成分
- 鉴定摘要
- 持续可靠性监测
- 制造厂地点
- 封装厂地点