End equipment such as mixed signal SOC testers, memory testers, battery testers, liquid-crystal display (LCD) testers, benchtop equipment, high-density digital cards, high-density power cards, x-Ray, MRI, and so forth require multiple, fast, simultaneous sampling channels with excellent DC and AC performance but at low power and in small board spaces. The proposed solution in this design uses high-performance SAR ADCs (ADS8910B), precision amplifiers (OPA2625), and a precision voltage reference (REF5050).
Features
- 18 bit 1 MSPS 4 Channel Simultaneous Sampling Data Acquisition system
- 18 bit NMC DNL; +/- 0.5 LSB INL linearity performance for each channel
- 101dB SNR, 124dB THD with 2kHz Sine wave input on each channel
- >110dB Channel to Channel Isolation
- This circuit design is tested and includes Getting Started guide.