高精度实验室系列：模数转换器 (ADC)

SPI communication basics (modes)

SPI communications timing

I2C introduction: The protocol

Introduction to I2C: Example

Introduction to I2C: Reserved addresses

Introduction to I2C: Advanced topics

ADC DC specifications: INL, DNL, Cin, leakage, Vref

交流和直流规格：失调电压误差、增益误差、CMRR、PSRR、SNR 和 THD

SAR and delta-sigma: Basic operation

Digital filters and latency

SAR and delta-sigma: Noise and drive considerations

Choosing SAR or delta-sigma

SAR ADC 输入类型

使用运算放大器时确定 SAR ADC 的线性范围

Hands-on experiment: Crossover distortion on ADC drive

使用仪表放大器时确定 SAR ADC 的线性范围

使用全差分放大器驱动 SAR ADC

ADC 系统误差分析背后的统计数据

了解和校准 ADC 系统的失调电压和增益

使用 SPICE Monte Carlo 工具进行统计误差分析

Introduction to noise in ADC systems

Types of noise in ADCs

ADC 噪声测量、方法和参数

System noise performance for low-speed delta-sigma ADCs

Analyzing and calculating noise bandwidth in ADC systems – multi-stage filters

Analyzing and calculating noise bandwidth in ADC systems – the digital filter

Gain impact on noise, ADC FSR and dynamic range

Calculating amplifier + ADC total noise: design examples

Introduction to reference noise in ADC systems

Reference noise affect on signal chain performance

Reducing reference noise ADC systems: ratiometric, internal, external

计算 ADC 系统的总噪声

Hands-on experiment: ADC noise

频域简介

快速傅里叶变换 (FFT) 和窗口化

通过相干采样和滤波改善 SNR 和 THD

混叠和抗混叠滤波器

Hands-on experiment: Aliasing and anti-aliasing filters

SAR ADC 前端元件选择简介

选择并验证驱动器放大器

构建 SAR ADC 模型

优化 ADC 驱动器上的 Rfilt 和 Cfilt 值

Hands-on experiment: Amplifier settling and charge bucket filter design

R-C 元件选择背后的数学理论

Driving SAR ADC without amplifiers

Voltage reference overview for ADC

Overview of reference drive topologies

SAR reference input: The CDAC

Understanding the SAR reference input model

Developing the SAR reference input model

Hands-on experiment: Reference drive

SAR ADC power scaling

Hands-on experiment: System power scaling

EOS and ESD on ADC

External EOS protection devices

Import diode's PSpice model into TINA

Protecting low voltage ADC from high voltage amp

Protecting low voltage ADC: Improved solution

Protecting ADC with TVS diode

Protecting ADC with TVS diode: Improved solution

Protecting Delta-Sigma ADC: RTD Overview

Protecting Delta-Sigma ADC: Input Protection Circuit Operation

保护 Δ-Σ 元件选型

利用 TVS 保护 Δ-Σ：性能影响

保护 Δ-Σ ADC：特殊输入范围

简介 - 实现良好 EMC 的 PCB 设计

PCB 布迹作为波导

PCB 堆叠对性能的影响

PCB 布线阻抗匹配

PCB 布局上的串扰

Data integrity issues

Decoupling capacitors

Electromagnetic compatibility testing methods and standards

Comparing high-speed analog-to-digital (ADC) and digital-to-analog (DAC) converter architectures

Jitter's impact on signal-to-noise ratio (SNR) for high-speed analog-to-digital converters (ADCs)

Understanding signal to noise ratio and noise spectral density in high speed data converters

Bandwidth vs. frequency: Subsampling concepts

Sampling vs. data rate, decimation (DDC) and interpolation (DUC) in high-speed data converters

Understanding sampling, Nyquist zones, harmonics and spurious performance in high-speed ADCs

High-speed data converter signal processing: Real and complex modulation

Introduction To RTDs

RTD Measurement Circuits

Challenges with 3-wire RTD systems

Measuring multiple RTDs with a multiplexed ADC & intro to conversion latency

Designing software versus hardware configurable multi-RTD measurement systems