ZHCSUL6 February   2024 ADC12DL1500 , ADC12DL2500 , ADC12DL500

PRODUCTION DATA  

  1.   1
  2. 1 特性
  3. 2 应用
  4. 3 说明
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  ESD Ratings
    3. 5.3  Recommended Operating Conditions
    4. 5.4  Thermal Information
    5. 5.5  Electrical Characteristics: DC Specifications
    6. 5.6  Electrical Characteristics: Power Consumption
    7. 5.7  Electrical Characteristics: AC Specifications (Dual-Channel Mode)
    8. 5.8  Electrical Characteristics: AC Specifications (Single-Channel Mode)
    9. 5.9  Timing Requirements
    10. 5.10 Switching Characteristics
    11. 5.11 Timing Diagrams
    12. 5.12 Typical Characteristics - ADC12DL500
    13. 5.13 Typical Characteristics - ADC12DL1500 (1GSPS)
    14. 5.14 Typical Characteristics - ADC12DL1500 (1.5GSPS)
    15. 5.15 Typical Characteristics - ADC12DL2500 (2GSPS)
    16. 5.16 Typical Characteristics - ADC12DL2500 (2.5GSPS)
  7. 6 Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1 Analog Inputs
        1. 6.3.1.1 Analog Input Protection
        2. 6.3.1.2 Full-Scale Voltage (VFS) Adjustment
        3. 6.3.1.3 Analog Input Offset Adjust
      2. 6.3.2 ADC Core
        1. 6.3.2.1 ADC Theory of Operation
        2. 6.3.2.2 ADC Core Calibration
        3. 6.3.2.3 ADC Overrange Detection
        4. 6.3.2.4 Code Error Rate (CER)
        5. 6.3.2.5 Internal Dither
      3. 6.3.3 Timestamp
      4. 6.3.4 Clocking
        1. 6.3.4.1 Noiseless Aperture Delay Adjustment (tAD Adjust)
        2. 6.3.4.2 Aperture Delay Ramp Control (TAD_RAMP)
        3. 6.3.4.3 SYSREF Capture for Multi-Device Synchronization and Deterministic Latency
          1. 6.3.4.3.1 SYSREF Position Detector and Sampling Position Selection (SYSREF Windowing)
          2. 6.3.4.3.2 Automatic SYSREF Calibration
      5. 6.3.5 LVDS Digital Interface
        1. 6.3.5.1 Multi-Device Synchronization and Deterministic Latency Using Strobes
          1. 6.3.5.1.1 Dedicated Strobe Pins
          2. 6.3.5.1.2 Reduced Width Interface With Dedicated Strobe Pins
          3. 6.3.5.1.3 LSB Replacement With a Strobe
          4. 6.3.5.1.4 Strobe Over All Data Pairs
      6. 6.3.6 Alarm Monitoring
        1. 6.3.6.1 Clock Upset Detection
      7. 6.3.7 Temperature Monitoring Diode
      8. 6.3.8 Analog Reference Voltage
    4. 6.4 Device Functional Modes
      1. 6.4.1 Dual-Channel Mode (Non-DES Mode)
      2. 6.4.2 Internal Dither Modes
      3. 6.4.3 Single-Channel Mode (DES Mode)
      4. 6.4.4 LVDS Output Driver Modes
      5. 6.4.5 LVDS Output Modes
        1. 6.4.5.1 Staggered Output Mode
        2. 6.4.5.2 Aligned Output Mode
        3. 6.4.5.3 Reducing the Number of Strobes
        4. 6.4.5.4 Reducing the Number of Data Clocks
        5. 6.4.5.5 Scrambling
        6. 6.4.5.6 Digital Interface Test Patterns and LVSD SYNC Functionality
          1. 6.4.5.6.1 Active Pattern
          2. 6.4.5.6.2 Synchronization Pattern
          3. 6.4.5.6.3 User-Defined Test Pattern
      6. 6.4.6 Power-Down Modes
      7. 6.4.7 Calibration Modes and Trimming
        1. 6.4.7.1 Foreground Calibration Mode
      8. 6.4.8 Offset Calibration
      9. 6.4.9 Trimming
    5. 6.5 Programming
      1. 6.5.1 Using the Serial Interface
        1. 6.5.1.1 SCS
        2. 6.5.1.2 SCLK
        3. 6.5.1.3 SDI
        4. 6.5.1.4 SDO
        5. 6.5.1.5 80
        6. 6.5.1.6 Streaming Mode
        7. 6.5.1.7 82
  8. 7 Application and Implementation
    1. 7.1 Application Information
    2. 7.2 Typical Applications
      1. 7.2.1 Reconfigurable Dual-Channel 2.5GSPS or Single-Channel 5GSPS Oscilloscope
        1. 7.2.1.1 Design Requirements
          1. 7.2.1.1.1 Input Signal Path
          2. 7.2.1.1.2 Clocking
          3. 7.2.1.1.3 ADC12DLx500
        2. 7.2.1.2 Application Curves
    3. 7.3 Initialization Set Up
    4. 7.4 Power Supply Recommendations
      1. 7.4.1 Power Sequencing
    5. 7.5 Layout
      1. 7.5.1 Layout Guidelines
      2. 7.5.2 Layout Example
  9. 8 Register Maps
    1. 8.1 SPI_REGISTER_MAP Registers
  10. 9 Device and Documentation Support
    1. 9.1 Device Support
      1. 9.1.1 Development Support
    2. 9.2 接收文档更新通知
    3. 9.3 支持资源
    4. 9.4 Trademarks
    5. 9.5 静电放电警告
    6. 9.6 术语表
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information

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6.4.2 Internal Dither Modes

Dither can be disabled by setting ADC_DITH_EN to 0 in the ADC_DITH register, which can result in a slight improvement in SNR. The amount of dither can be increased by setting ADC_DITH_AMP to 1. The increased dither can result in further spurious improvements, but can also result in a reduction in SNR. Certain dither values, caused by device-to-device variations, can result in rounding errors that can either reduce SNR or reduce fixed spur performance (DC, fS / 4, and fS / 2 spurs). The choice of tradeoff can be made by setting ADC_DITH_ERR to 0 to degrade SNR and 1 to degrade the DC, fS / 4 (single-channel mode only), and fS / 2 spurs.
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