4 修订历史记录
Changes from * Revision (August 2017) to A Revision
- Added 向功能方框图 图像添加了基准探测块Go
- Added External Reference Monitor section in Electrical Characteristics tableGo
- Added Reference monitor circuit row to IAVDD parameter in Additional Analog Supply Currents Per Function (AVDD = 3.3 V) sectionGo
- Added with low reference voltage level detection to Two sets of buffered external reference inputs bullet in Overview sectionGo
- Added discussion on how external reference inputs can be monitored in Overview section Go
- Added reference detection block to Functional Block Diagram imageGo
- Deleted last sentence from Burn-Out Current Sources sectionGo
- Changed Status Register sectionGo
- Added External Reference Monitor sectionGo
- Deleted sentence discussing global chop from Offset Calibration section Go
- Changed description for filter reset for clarificationGo
- Changed bit 0 from 0 to FL_REF in register 01h and changed bit 6 from 0 to FL_REF_EN in register 05h in Configuration Register Map tableGo
- Changed bit 0 from 0 to FL_REF and added FL_REF to field descriptions table in Device Status RegisterGo
- Changed bit 6 from 0 to FL_REF_EN and added FL_REF_EN to field descriptions table in Reference Control RegisterGo
- Changed bit setting description for bits 4 and 5 in Reference Control Register for clarificationGo