4 修订历史记录
Changes from C Revision (November 2016) to D Revision
- Changed 将文档标题从双通道或四通道 24 位同步采样 Δ-Σ ADC 更改为双通道或四通道 24 位 128kSPS 同步采样 Δ-Σ ADCGo
- Changed VAVDD 改为 AVDD,VAVSS 改为 AVSS,VGND 改为 GND,且 VIOVDD 改为 IOVDD(全文通改)Go
- Changed 特性部分Go
- Changed 说明 部分中)Go
- Deleted footnote 2 Go
- Changed AVDD, AVSS, VNCP, and XTAL2 pin descriptions and footnote 1 for clarity Go
- Changed CAP to GND Power supply voltage parameter specifications from GND – 0.3 V to 0.3 V for the minimum specification and from GND + 2.0 V to 2.0 V for the maximum specificationGo
- Changed Analog input voltage parameter descriptions from REFEXT to AVDD to REFEXT and from REFN input to AVSS to REFNGo
- Changed Digital input voltage parameter description to include the names of the digital input pinsGo
- Deleted CMRR footnote from Recommended Operating Conditions tableGo
- Added symbol to Reference input voltage parameterGo
- Changed Offset drift parameter typical specification from 1.2 µV/°C to 2.5 µV/°C and maximum specification from 3 µV/°C to 4 µV/°CGo
- Changed Gain drift parameter typical specification from 0.25 ppm/°C to 0.5 ppm/°C Go
- Deleted separate AVDD PSRR specification for the ADS131A02 Go
- Changed Reference buffer offset parameter typical specification from 170 µV to 250 µVGo
- Changed Reference buffer offset drift parameter typical specification from 1.1 µV/°C to 4 µV/°C and maximum specification from 4.3 µV/°C to 7 µV/°CGo
- Changed Temperature drift parameter typical specification from 4 ppm/°C to 6 ppm/°CGo
- Deleted VNCP parameter minimum specification and changed typical specification from –1.95 V to –2 VGo
- Changed Electrical Characteristics table so all Power-Supply subsections are condensed to one Power-Supply subsectionGo
- Changed free-air to ambient in condition statements of Timing Requirements tablesGo
- Changed location of several interface timing parameters to the Timing Requirements and Switching Characteristics tables from the Detailed Description section Go
- Changed unit from ns to tCLKIN in tc(SC) and tw(SCHL) rows of Timing Requirements: Synchronous Master Interface Mode tableGo
- Added DRDY Synchronization Timing for Synchronous Slave Mode (CLKSRC = 0) to RESET Pin and Command Timing figuresGo
- Changed Clock section for clarification and changed setting of XTAL2 pin Go
- Changed Clock Mode Configurations figure to include load capacitors for clarityGo
- Changed Analog Input section for clarityGo
- Changed Equivalent Analog Input Circuitry figureGo
- Changed Input Overrange and Underrange Detection section for clarityGo
- Changed location of Reference section Go
- Changed External Reference Driver figureGo
- Changed Internal Reference figure Go
- Changed Digital Decimation Filter section for clarityGo
- Deleted figure and table from Reset (RESET) sectionGo
- Changed Fixed versus Dynamic-Frame Mode section for clarityGo
- Added Cyclic Redundancy Check (CRC) section for clarityGo
- Changed CRC with CRC_MODE = 0 and CRC Using the WREGS Command figures to using red shading instead of //ZeroGo
- Changed Data Ready (DRDY) section for clarityGo
- Changed pulldown to pullup in bulleted list of ADC Frame Complete (DONE) section Go
- Changed description of UNLOCK from POR or RESET sectionGo
- Changed description of RREG: Read a Single Register sectionGo
- Changed number of registers written plus one (n+1) to number of registers written minus one in WREGS: Write Multiple Registers sectionGo
- Changed User Register Description section for clarityGo
- Changed Unused Inputs and Outputs section for clarityGo
- Changed title of Multiple Device Configuration section and changed description for clarity Go
- Changed first paragraph of First Device Configured in Asynchronous Interrupt Mode to condense data from last three paragraphs into one Go
- Changed description of First Device Configured in Synchronous Master Mode section to condense all paragraphs into oneGo
- Changed description of All Devices Configured in Synchronous Slave Mode section to condense all paragraphs into one Go
- Changed ADS131A0x Configuration Sequence figureGo
- Changed GND to AVSS in VNCP pin description of Negative Charge Pump sectionGo
- Changed title of Internal Digital LDO sectionGo
- Changed description of Power-Supply Sequencing sectionGo
- Changed Bipolar Analog Power Supply to Unipolar Analog Power Supply with Negative Charge Pump Enabled figuresGo
- Changed first sentence of Layout Example sectionGo
- Changed ADS131A0x Layout Example figure to improve layoutGo
Changes from B Revision (September 2016) to C Revision
- Changed 将文档标题从用于电源监视、控制和保护的模拟前端更改为同步采样 Δ-Σ ADCGo
- Changed 将噪声性能特性 中第二个子项目符号从ENOB 更改为有效分辨率Go
- Changed 有效位数改为有效分辨率(说明部分Go
- Changed format of Absolute Maximum Ratings table; specification values did not changeGo
- Changed title of Multiple Device Effective Resolution Histogram figureGo
- Changed Noise Measurements section Go
Changes from A Revision (March 2016) to B Revision
- 将 ADS131A02 发布为生产数据Go
- Changed AC Performance, PSRR, THD, and SFDR parameters in Electrical Characteristics table: added rows for ADS131A02 and added ADS131A04 to rows specific to that device Go
- Changed title of Figure 31 and Figure 32: added ADS131A04 Go
- Added Figure 33 and Figure 34Go
- Changed Noise Measurements section: changed Equation 1, Equation 2, Table 1, and Table 3Go
- Added footnote to Figure 43Go
- Changed R2 and R3 values in footnote of Figure 44Go
- Changed Cyclic Redundancy Check (CRC) sectionGo
- Changed description of M2 pin functionality in Hamming Code Error Correction sectionGo
- Changed description of M0 pin functionality in SPI Interface sectionGo
- Changed first command status response value in RREGS: Read Multiple Registers sectionGo
- Changed Table 15: changed register bits of row 00h, default setting and register bits of row 01h, and changed bits 2-0 of 11h, 12h, 13h, and 14h rows Go
- Changed ID_MSB: ID Control Register MSB and ID_LSB: ID Control Register LSB registersGo
- Changed bits 2-0 of all ADCx: ADC Channel Digital Gain Configuration RegistersGo
Changes from * Revision (March 2016) to A Revision