该 30V、54mΩ N 沟道 FemtoFET™ MOSFET 技术经过设计和优化,能最大限度地减小在许多手持式和移动应用中的空间占用。这项技术能够在替代标准小信号 MOSFET 的同时将封装尺寸减小至少 60%。
TA = 25°C | 典型值 | 单位 | ||
---|---|---|---|---|
VDS | 漏源电压 | 30 | V | |
Qg | 总栅极电荷 (4.5V) | 2.1 | nC | |
Qgd | 栅极电荷(栅极到漏极) | 0.63 | nC | |
RDS(on) | 漏源导通电阻 | VGS = 1.8V | 110 | mΩ |
VGS = 2.5V | 67 | mΩ | ||
VGS = 4.5V | 56 | mΩ | ||
VGS = 8.0V | 54 | mΩ | ||
VGS(th) | 阈值电压 | 0.9 | V |
器件(1) | 数量 | 介质 | 封装 | 配送 |
---|---|---|---|---|
CSD17382F4 | 3000 | 7 英寸卷带 | Femto (0402) 1.0mm × 0.6mm 无引线 SMD | 卷带包装 |
CSD17382F4T | 250 |
TA = 25°C | 值 | 单位 | |
---|---|---|---|
VDS | 漏源电压 | 30 | V |
VGS | 栅源电压 | 10 | V |
ID | 持续漏极电流(1) | 2.3 | A |
IDM | 脉冲漏极电流(2) | 14.8 | A |
PD | 功率耗散(1) | 500 | mW |
ESD 等级 | 人体放电模型 (HBM) | 3000 | V |
组件充电模式 (CDM) | 2000 | V | |
TJ、 Tstg | 工作结温、 贮存温度 | –55 至 150 | °C |
EAS | 雪崩能量,单脉冲 ID = 6.5A, L = 0.1mH,RG = 25Ω | 2.1 | mJ |
Changes from Revision B (October 2021) to Revision C (February 2022)
Changes from Revision A (December 2016) to Revision B (October 2021)
Changes from Revision * (April 2016) to Revision A (December 2016)
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | ||
---|---|---|---|---|---|---|---|
STATIC CHARACTERISTICS | |||||||
BVDSS | Drain-to-source voltage | VGS = 0 V, IDS = 250 μA | 30 | V | |||
IDSS | Drain-to-source leakage current | VGS = 0 V, VDS = 24 V | 1 | µA | |||
IGSS | Gate-to-source leakage current | VDS = 0 V, VGS = 10 V | 5 | µA | |||
VGS(th) | Gate-to-source threshold voltage | VDS = VGS, IDS = 250 μA | 0.7 | 0.9 | 1.2 | V | |
RDS(on) | Drain-to-source on-resistance | VGS = 1.8 V, IDS =0.5 A | 110 | 180 | mΩ | ||
VGS = 2.5 V, IDS =0.5 A | 67 | 82 | mΩ | ||||
VGS = 4.5 V, IDS = 0.5 A | 56 | 67 | mΩ | ||||
VGS = 8.0 V, IDS = 0.5 A | 54 | 64 | mΩ | ||||
gfs | Transconductance | VDS = 3 V, IDS = 0.5 A | 5.9 | S | |||
DYNAMIC CHARACTERISTICS | |||||||
Ciss | Input capacitance | VGS = 0 V, VDS = 15 V, ƒ = 1 MHz | 267 | 347 | pF | ||
Coss | Output capacitance | 31.0 | 40.3 | pF | |||
Crss | Reverse transfer capacitance | 15.0 | 19.5 | pF | |||
RG | Series gate resistance | 220 | Ω | ||||
Qg | Gate charge total (4.5 V) | VDS = 15 V, IDS = 0.5 A | 2.1 | 2.7 | nC | ||
Qgd | Gate charge gate-to-drain | 0.63 | nC | ||||
Qgs | Gate charge gate-to-source | 0.41 | nC | ||||
Qg(th) | Gate charge at Vth | 0.12 | nC | ||||
Qoss | Output charge | VDS = 15 V, VGS = 0 V | 1.53 | nC | |||
td(on) | Turn on delay time | VDS = 15 V, VGS = 4.5 V, IDS = 0.5 A, RG = 0 Ω | 59 | ns | |||
tr | Rise time | 111 | ns | ||||
td(off) | Turn off delay time | 279 | ns | ||||
tf | Fall time | 270 | ns | ||||
DIODE CHARACTERISTICS | |||||||
VSD | Diode forward voltage | ISD = 0.5 A, VGS = 0 V | 0.7 | 1.0 | V |
THERMAL METRIC | TYPICAL VALUES | UNIT | |||
---|---|---|---|---|---|
RθJA | Junction-to-ambient thermal resistance(1) | 85 | °C/W | ||
Junction-to-ambient thermal resistance(2) | 245 | °C/W |