10 Revision History
Changes from Revision E (August 2023) to Revision F (October 2024)
- 更新了整个文档中的表、图和交叉参考的编号格式Go
- Updated Thermal Characteristics, Safety Limiting Values, and Thermal
Derating Curves to provide more accurate system-level thermal
calculationsGo
- Updated electrical and switching characteristics to match device
performanceGo
- Updated maximum power dissipation in the power ratings sectionGo
- Updated distance through isolation, while maintaining all other insulation specifications.Go
- Updated table entriesGo
- Updated the input leakage current for ENx pins throughout the electrical characteristic sectionsGo
- Updated maximum total current consumption values throughout the supply current characteristics sectionsGo
- Updated maximum propagation delay specifications throughout the switching characteristics sectionsGo
- Updated the TDDB plot and the projected lifetimeGo
Changes from Revision D (October 2020) to Revision E (August 2023)
- 将整个文档中的标准名称从“DIN V VDE V 0884-11:2017-01”更改为“DIN EN IEC 60747-17 (VDE 0884-17)”Go
- 通篇删除了所有标准名称中的标准版本和年份参考Go
- Added VTEST conditions for VIOTM, updated DBQ package throughout the document, and updated method b1 conditionGo
- Changed working voltage lifetime margin from: 87.5% to: 50%, minimum
required insulation lifetime from: 37.5 years to: 30 years and insulation
lifetime per TDDB from: 135 years to: 169 years per DIN EN IEC 60747-17 (VDE
0884-17)Go
- Changed Figure 8-8 per DIN EN
IEC 60747-17 (VDE 0884-17Go