ZHCSKH4A October   2006  – November 2019 SN65LBC174A-EP

PRODUCTION DATA.  

  1. 1特性
  2. 2应用
  3. 3说明
    1.     Device Images
      1.      逻辑图（正逻辑）
  4. 4修订历史记录
  5. 5说明 （续）
    1. 5.1 Pin Configuration and Functions
      1.      Pin Functions
    2. 5.2 Specifications
      1. 5.2.1 Absolute Maximum Ratings
      2. 5.2.2 ESD Ratings
      3. 5.2.3 Recommended Operating Conditions
      4. 5.2.4 Thermal Information
      5. 5.2.5 Electrical Characteristics
      6. 5.2.6 Switching Characteristics
      7. 5.2.7 Typical Characteristics
    3. 5.3 Parameter Measurement Information
    4. 5.4 Detailed Description
      1. 5.4.1 Overview
      2. 5.4.2 Functional Block Diagram
      3. 5.4.3 Feature Description
      4. 5.4.4 Device Functional Modes
    5. 5.5 Application and Implementation
      1. 5.5.1 Application Information
      2. 5.5.2 Typical Application
        1. 5.5.2.1 Design Requirements
        2. 5.5.2.2 Detailed Design Procedure
        3. 5.5.2.3 Application Curve
    6. 5.6 Power Supply Recommendations
    7. 5.7 Layout
      1. 5.7.1 Layout Guidelines
      2. 5.7.2 Layout Example
  6. 6器件和文档支持
    1. 6.1 接收文档更新通知
    2. 6.2 支持资源
    3. 6.3 商标
    4. 6.4 静电放电警告
    5. 6.5 Glossary
  7. 7机械、封装和可订购信息

封装选项

机械数据 (封装 | 引脚)
散热焊盘机械数据 (封装 | 引脚)
订购信息

5.2.1 Absolute Maximum Ratings(1)

over operating free-air temperature range (unless otherwise noted)
MIN MAX UNIT
VCC Supply voltage(2) –0.3 6 V
Voltage at any bus (dc) –10 15 V
Voltage at any bus (transient pulse through 100 Ω, See Figure 14) –30 30 V
VI Input voltage at any A or EN terminal –0.5 VCC + 0.5 V
Tstg Storage temperature(3) –65 150 °C
Lead temperature 1.6 mm (1/16 in) from case for 10 s 260 °C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltage values, except differential I/O bus voltages, are with respect to GND.
(3) Long-term high-temperature storage and/or extended use at maximum recommended operating conditions may result in a reduction of overall device life.
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