4 修订历史记录
Changes from A Revision (December 2016) to B Revision
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更正了输入错误;在特性 部分中将部件号从 TLV314、TLV2314 和 TLV4314 更改为 TLV316-Q1、TLV2316-Q1 和 TLV4316-Q1Go
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Changed values in the Thermal Information: TLV4316-Q1 table to align with JEDEC standards.Go
Changes from * Revision (November 2016) to A Revision
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Changed CDM ESD 分类等级 C6 至 C5(位于 特性 部分)Go
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Deleted 器件信息表Go
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Deleted the DCK (SC70) package from the TLV316-Q1 pinout diagram in the Pin Configurations and Functions section Go
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Deleted the DCK (SC70) pinout information from the Pin Functions: TLV316-Q1 table in the Pin Configurations and Functions section Go
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Deleted D (SOIC) package from the TLV2316-Q1 pinout diagram in the Pin Configurations and Functions section Go
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Deleted the D (SOIC) package from TLV4316-Q1 pinout diagram in the Pin Configurations and Functions sectionGo
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Changed the ESD Ratings table from commercial to automotive specifications Go
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Changed the CDM ESD rating from ±1500 to ±750 in the ESD Ratings table Go
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Deleted the DCK (SC70) package from the Thermal Information: TLV316-Q1 table in the Specifications sectionGo
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Changed the formatting of all Thermal Information table notes Go
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Deleted the D (SOIC) package from the Thermal Information: TLV2316-Q1 table in the Specifications sectionGo
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Deleted the D (SOIC) package from the Thermal Information: TLV4316-Q1 table in the Specifications section Go
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Deleted the static literature number in the SBOA128 application note reference in the EMI Susceptibility and Input Filtering sectionGo
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Deleted the static literature number in document reference in the Layout Guidelines section Go
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Changed the layout example image (Figure 41) in Layout Example sectionGo
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Deleted 相关文档部分Go