ZHCSDD8D October 2014 – December 2019 TPS1H100-Q1
PRODUCTION DATA.
Short-circuit reliability is critical for smart high-side power switch devices. The AEC-Q100-012 standard is used to determine the reliability of the devices when operating in a continuous short-circuit condition. Different grade levels are specified according to the pass cycles. This device is qualified with the highest level, Grade A, 1 million times short-to-GND certification.
Three test modes are defined in the AEC Q100-012 standard. See Table 3 for cold repetitive short-circuit test – long pulse, cold repetitive short-circuit test – short pulse, and hot repetitive short-circuit test.
| Test Items | Test Condition | Test Cycles |
|---|---|---|
| Cold repetitive short-circuit test – short pulse | –40°C, 10-ms pulse, cool down | 1M |
| Cold repetitive short-circuit test – long pulse | –40°C, 300-ms pulse, cool down | 1M |
| Hot repetitive short-circuit test | 25°C, continuous short | 1M |
Different grade levels are specified according to the pass cycles. The TPS1H100-Q1 device gets the certification of Grade A level, 1 million short-to-GND cycles, which is the highest test standard in the market.
| Grade | Number of Cycles | Lots,Samples Per Lot | Number of Fails |
|---|---|---|---|
| A | >1000000 | 3, 10 | 0 |
| B | >300000 to 1000000 | 3, 10 | 0 |
| C | >100000 to 300000 | 3, 10 | 0 |
| D | >30000 to 100000 | 3, 10 | 0 |
| E | >10000 to 30000 | 3, 10 | 0 |
| F | >3000 to 10000 | 3, 10 | 0 |
| G | >1000 to 3000 | 3, 10 | 0 |
| H | 300 to 1000 | 3, 10 | 0 |
| O | <300 | 3, 10 | 0 |