4 修订历史记录
Changes from B Revision (November 2016) to C Revision
- Added 将“通过 UL 2367 认证 – 文件编号 E339631”添加到了特性 部分Go
Changes from A Revision (September 2015) to B Revision
Changes from * Revision (October 2013) to A Revision
- 添加了 ESD 额定值 表、详细说明、特性 说明、器件功能模式、应用和实施、电源建议、器件和文档支持 以及机械、封装和可订购信息Go
- 已删除特性“FET 短路检测(TPS24752,TPS24753)”Go
- 已更改应用原理图。已删除 CVIN 和 D1Go
- Deleted devices TPS24752 and TPS24753 from the data sheetGo
- Deleted list item from the Overview section: "Internal MOSFET short detection (TPS24752/3 only)"Go
- Removed notes for pin 30 and 31 from the Functional Block DiagramGo
- Deleted section Fault Detection of Internal Mosfet ShortGo
- Changed Figure 40. Deleted CVIN and D1Go
- Changed text in STEP 3. Choose Output Voltage Rising Time, tON, and Timing Capacitor CT From: "maximum steady state junction temperature (TJDMAX = TA(MAX) + ILIM2 x R(DS)ON)." To: " maximum steady state junction temperature (TJDMAX = TA(MAX) + ILIM2 x R(DS)ON x RθJA)."Go
- Changed Figure 46 and Figure 47. Deleted CVIN and D1Go
- Added text and Figure 48 to System ExamplesGo
- Changed Figure 51Go
- Added Figure 52Go