Figure 8-4 and Figure 8-5 show rising and falling time and turnon and turnoff propagation delay testing waveform in room temperature for UCC27424-Q1, and waveform measurement data (see the bottom part of the waveform). Each channel, INA/INB/OUTA/OUTB, is labeled and displayed on the left hand of the waveforms.

The load capacitance testing condition is 1.8 nF, V_DD = 12 V, and f = 300 kHz.

HI and LI share one same input from function generator; therefore, besides the propagation delay and rising or falling time, the difference of the propagation delay between HO and LO gives the propagation delay matching data.

Note the linear rise and fall edges of the switching waveforms. This is due to the constant output current characteristic of the driver as opposed to the resistive output impedance of traditional MOSFET-based gate drivers.

CL = 1.8 nF, V_DD = 12 V, f = 300 kHz

Figure 8-4 Rising Time and Turnon Propagation Delay

CL = 1.8 nF, V_DD = 12 V, f = 300 kHz

Figure 8-5 Falling Time and Turnoff Propagation Delay