SFFS112 April 2021 TPS25850-Q1 , TPS25858-Q1
1 Overview
This document contains information for TPS25850-Q1 and TPS25858-Q1 (VQFN-HR package) to aid in a functional safety system design. Information provided are:
- Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
- Component failure modes and their distribution (FMD) based on the primary function of the device
Figure 1-1 shows the device functional block diagram for reference.
Figure 1-1 Functional Block
DiagramTPS25850-Q1 and TPS25858-Q1 were developed using a quality-managed development process, but were not developed in accordance with the IEC 61508 or ISO 26262 standards.