SFFS115 March 2021 DRV8889-Q1
This section provides Functional Safety Failure In Time (FIT) rates for DRV8889-Q1 and DRV8889A-Q1 based on two different industry-wide used reliability standards:
FIT IEC TR 62380 / ISO 26262 | FIT (Failures Per 109 Hours) |
---|---|
Total Component FIT Rate | 23 |
Die FIT Rate | 7 |
Package FIT Rate | 16 |
FIT IEC TR 62380 / ISO 26262 | FIT (Failures Per 109 Hours) |
---|---|
Total Component FIT Rate |
21 |
Die FIT Rate |
9 |
Package FIT Rate |
12 |
The failure rate and mission profile information in Table 2-1 and Table 2-2 comes from the Reliability data handbook IEC TR 62380 / ISO 26262 part 11:
Table | Category | Lambda ref FIT | Theta vj |
---|---|---|---|
5 | CMOS/BICMOS ASICs Analog & Mixed =<50V supply | 60 FIT | 70°C |
The Reference FIT Rate and Reference Virtual TJ (junction temperature) in Table 2-3 come from the Siemens Norm SN 29500-2 tables 1 through 5. Failure rates under operating conditions are calculated from the reference failure rate and virtual junction temperature using conversion information in SN 29500-2 section 4.