SFFS626 February 2024 TPS1HTC30-Q1
The failure mode distribution estimation for the TPS1HTC30-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity, and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures resulting from misuse or overstress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
| VOUT open (HiZ) | 20 |
| VOUT stuck on (VS) | 10 |
| VOUT functional, not in specification voltage or timing | 50 |
| Diagnostics not in specification | 10 |
| Protection function fails to trip | 10 |