SLAS590P March   2009  – September 2020

PRODUCTION DATA  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
  4. 4 Functional Block Diagrams
  5. 5 Revision History
  6. 6 Device Comparison
    1. 6.1 Related Products
  7. 7 Terminal Configuration and Functions
    1. 7.1 Pin Diagrams
    2. 7.2 Signal Descriptions
  8. 8 Specifications
    1. 8.1  Absolute Maximum Ratings
    2. 8.2  ESD Ratings
    3. 8.3  Recommended Operating Conditions
    4. 8.4  Active Mode Supply Current Into VCC Excluding External Current
    5. 8.5  Low-Power Mode Supply Currents (Into VCC) Excluding External Current
    6. 8.6  Thermal Resistance Characteristics
    7. 8.7  Schmitt-Trigger Inputs – General-Purpose I/O (P1.0 to P1.7, P2.0 to P2.7, P3.0 to P3.7, P4.0 to P4.7, P5.0 to P5.7, P6.0 to P6.7, P7.0 to P7.7, P8.0 to P8.2, PJ.0 to PJ.3, RST/NMI)
    8. 8.8  Inputs – Ports P1 and P2 (P1.0 to P1.7, P2.0 to P2.7)
    9. 8.9  Leakage Current – General-Purpose I/O (P1.0 to P1.7, P2.0 to P2.7, P3.0 to P3.7, P4.0 to P4.7) (P5.0 to P5.7, P6.0 to P6.7, P7.0 to P7.7, P8.0 to P8.2, PJ.0 to PJ.3, RST/NMI)
    10. 8.10 Outputs – General-Purpose I/O (Full Drive Strength) (P1.0 to P1.7, P2.0 to P2.7, P3.0 to P3.7, P4.0 to P4.7, P5.0 to P5.7, P6.0 to P6.7, P7.0 to P7.7, P8.0 to P8.2, PJ.0 to PJ.3)
    11. 8.11 Outputs – General-Purpose I/O (Reduced Drive Strength) (P1.0 to P1.7, P2.0 to P2.7, P3.0 to P3.7, P4.0 to P4.7, P5.0 to P5.7, P6.0 to P6.7, P7.0 to P7.7, P8.0 to P8.2, PJ.0 to PJ.3)
    12. 8.12 Output Frequency – General-Purpose I/O (P1.0 to P1.7, P2.0 to P2.7, P3.0 to P3.7, P4.0 to P4.7, P5.0 to P5.7, P6.0 to P6.7, P7.0 to P7.7, P8.0 to P8.2, PJ.0 to PJ.3)
    13. 8.13 Typical Characteristics – Outputs, Reduced Drive Strength (PxDS.y = 0)
    14. 8.14 Typical Characteristics – Outputs, Full Drive Strength (PxDS.y = 1)
    15. 8.15 Crystal Oscillator, XT1, Low-Frequency Mode
    16. 8.16 Crystal Oscillator, XT2
    17. 8.17 Internal Very-Low-Power Low-Frequency Oscillator (VLO)
    18. 8.18 Internal Reference, Low-Frequency Oscillator (REFO)
    19. 8.19 DCO Frequency
    20. 8.20 PMM, Brownout Reset (BOR)
    21. 8.21 PMM, Core Voltage
    22. 8.22 PMM, SVS High Side
    23. 8.23 PMM, SVM High Side
    24. 8.24 PMM, SVS Low Side
    25. 8.25 PMM, SVM Low Side
    26. 8.26 Wake-up Times From Low-Power Modes and Reset
    27. 8.27 Timer_A
    28. 8.28 Timer_B
    29. 8.29 USCI (UART Mode) Clock Frequency
    30. 8.30 USCI (UART Mode)
    31. 8.31 USCI (SPI Master Mode) Clock Frequency
    32. 8.32 USCI (SPI Master Mode)
    33. 8.33 USCI (SPI Slave Mode)
    34. 8.34 USCI (I2C Mode)
    35. 8.35 12-Bit ADC, Power Supply and Input Range Conditions
    36. 8.36 12-Bit ADC, Timing Parameters
    37. 8.37 12-Bit ADC, Linearity Parameters Using an External Reference Voltage or AVCC as Reference Voltage
    38. 8.38 12-Bit ADC, Linearity Parameters Using the Internal Reference Voltage
    39. 8.39 12-Bit ADC, Temperature Sensor and Built-In VMID
    40. 8.40 REF, External Reference
    41. 8.41 REF, Built-In Reference
    42. 8.42 Comparator_B
    43. 8.43 Ports PU.0 and PU.1
    44. 8.44 USB Output Ports DP and DM
    45. 8.45 USB Input Ports DP and DM
    46. 8.46 USB-PWR (USB Power System)
    47. 8.47 USB-PLL (USB Phase-Locked Loop)
    48. 8.48 Flash Memory
    49. 8.49 JTAG and Spy-Bi-Wire Interface
  9. 9 Detailed Description
    1. 9.1  CPU
    2. 9.2  Operating Modes
    3. 9.3  Interrupt Vector Addresses
    4. 9.4  Memory Organization
    5. 9.5  Bootloader (BSL)
      1. 9.5.1 USB BSL
      2. 9.5.2 UART BSL
    6. 9.6  JTAG Operation
      1. 9.6.1 JTAG Standard Interface
      2. 9.6.2 Spy-Bi-Wire Interface
    7. 9.7  Flash Memory
    8. 9.8  RAM
    9. 9.9  Peripherals
      1. 9.9.1  Digital I/O
      2. 9.9.2  Port Mapping Controller
      3. 9.9.3  Oscillator and System Clock
      4. 9.9.4  Power-Management Module (PMM)
      5. 9.9.5  Hardware Multiplier
      6. 9.9.6  Real-Time Clock (RTC_A)
      7. 9.9.7  Watchdog Timer (WDT_A)
      8. 9.9.8  System Module (SYS)
      9. 9.9.9  DMA Controller
      10. 9.9.10 Universal Serial Communication Interface (USCI)
      11. 9.9.11 TA0
      12. 9.9.12 TA1
      13. 9.9.13 TA2
      14. 9.9.14 TB0
      15. 9.9.15 Comparator_B
      16. 9.9.16 ADC12_A
      17. 9.9.17 CRC16
      18. 9.9.18 Voltage Reference (REF) Module
      19. 9.9.19 Universal Serial Bus (USB)
      20. 9.9.20 Embedded Emulation Module (EEM)
      21. 9.9.21 Peripheral File Map
    10. 9.10 Input/Output Diagrams
      1. 9.10.1  Port P1 (P1.0 to P1.7) Input/Output With Schmitt Trigger
      2. 9.10.2  Port P2 (P2.0 to P2.7) Input/Output With Schmitt Trigger
      3. 9.10.3  Port P3 (P3.0 to P3.7) Input/Output With Schmitt Trigger
      4. 9.10.4  Port P4 (P4.0 to P4.7) Input/Output With Schmitt Trigger
      5. 9.10.5  Port P5 (P5.0 and P5.1) Input/Output With Schmitt Trigger
      6. 9.10.6  Port P5 (P5.2 and P5.3) Input/Output With Schmitt Trigger
      7. 9.10.7  Port P5 (P5.4 and P5.5) Input/Output With Schmitt Trigger
      8. 9.10.8  Port P5 (P5.6 and P5.7) Input/Output With Schmitt Trigger
      9. 9.10.9  Port P6 (P6.0 to P6.7) Input/Output With Schmitt Trigger
      10. 9.10.10 Port P7 (P7.0 to P7.3) Input/Output With Schmitt Trigger
      11. 9.10.11 Port P7 (P7.4 to P7.7) Input/Output With Schmitt Trigger
      12. 9.10.12 Port P8 (P8.0 to P8.2) Input/Output With Schmitt Trigger
      13. 9.10.13 Port PU (PU.0/DP, PU.1/DM, PUR) USB Ports
      14. 9.10.14 Port PJ (PJ.0) JTAG Pin TDO, Input/Output With Schmitt Trigger or Output
      15. 9.10.15 Port PJ (PJ.1 to PJ.3) JTAG Pins TMS, TCK, TDI/TCLK, Input/Output With Schmitt Trigger or Output
    11. 9.11 Device Descriptors (TLV)
  10. 10Device and Documentation Support
    1. 10.1  Getting Started and Next Steps
    2. 10.2  Device Nomenclature
    3. 10.3  Tools and Software
    4. 10.4  Documentation Support
    5. 10.5  Related Links
    6. 10.6  Support Resources
    7. 10.7  Trademarks
    8. 10.8  Electrostatic Discharge Caution
    9. 10.9  Export Control Notice
    10. 10.10 Glossary
  11. 11Mechanical, Packaging, and Orderable Information

5 Revision History

Changes from revision O to revision P

Changes from May 1, 2019 to September 11, 2020

  • Updated the numbering for sections, tables, figures, and cross-references throughout the documentGo
  • Added nFBGA package (ZXH) information throughout documentGo
  • Added note about status change for all orderable part numbers in the ZQE package in Table 3-1 Go
  • Added note (1) in Section 8.6, Thermal Resistance Characteristics Go
  • Changed the MAX value of the IERASE and IMERASE, IBANK parameters in Section 8.48, Flash Memory Go

Changes from revision N to revision O

Changes from September 21, 2018 to April 30, 2019

  • Updated Section 1, Features Go
  • Updated Section 3, Description Go
  • Removed the YFF package option for the MSP430F5526 and MSP430F5524 in Section 4, Functional Block Diagrams Go
  • Removed the YFF package option for the MSP430F5526 and MSP430F5524 in Section 6, Device Comparison Go
  • Removed the YFF package option for the MSP430F5526 and MSP430F5524 in Figure 7-6, 64-Pin YFF Package – MSP430F5528IYFF Go

Changes from revision M to revision N

Changes from November 3, 2015 to September 20, 2018

  • Changed entry for Body Size of DSBGA package in Device Information table Go
  • Added Section 6.1, Related Products Go
  • Removed D and E dimension lines from the YFF pinout (for package dimensions, see the Mechanical Data in Section 11) Go
  • Added typical conditions statements at the beginning of Section 8, Specifications Go
  • Changed the MIN value of the V(DVCC_BOR_hys) parameter from 60 mV to 50 mV in Section 8.20, PMM, Brownout Reset (BOR) Go
  • Updated notes (1) and (2) and added note (3) in Section 8.26, Wake-up Times From Low-Power Modes and Reset Go
  • Removed ADC12DIV from the formula for the TYP value in the second row of the tCONVERT parameter in Section 8.36, 12-Bit ADC, Timing Parameters, because ADC12CLK is after divisionGo
  • Added second row for tEN_CMP with Test Conditions of "CBPWRMD = 10" and MAX value of 100 µs in Section 8.42, Comparator_B Go
  • Renamed FCTL4.MGR0 and MGR1 bits in the fMCLK,MGR parameter in Section 8.48, Flash Memory, to be consistent with header files Go
  • Throughout document, changed all instances of "bootstrap loader" to "bootloader"Go
  • Added YFF pin numbers to Table 9-11, TA0 Signal Connections Go
  • Added YFF pin numbers to Table 9-12, TA1 Signal Connections Go
  • Added YFF pin numbers to Table 9-13, TA2 Signal Connections Go
  • Replaced former section Development Tools Support with Section 10.3, Tools and Software Go
  • Changed format and added content to Section 10.4, Documentation Support Go

Changes from revision L to revision M

Changes from June 17, 2013 to November 2, 2015

  • Added Device Information tableGo
  • Added Section 4 and moved all functional block diagrams to itGo
  • Added Section 6 and moved Table 6-1 table to itGo
  • Added Section 8.2, ESD Ratings Go
  • Moved Section 8.6, Thermal Resistance Characteristics Go
  • Changed the TYP value of CL,eff with Test Conditions of "XTS = 0, XCAPx = 0" from 2 pF to 1 pFGo
  • Corrected MRG0 and MRG1 bit names in fMCLK,MRG parameter descriptionGo
  • Corrected spelling of NMIIFG in Table 9-9, System Module Interrupt Vector Registers Go
  • Corrected register names (added "USB" prefix as necessary) in Table 9-45, USB Control Registers Go
  • Changed P5.3 schematic (added P5SEL.2 and XT2BYPASS inputs, AND gate, and OR gate after P5SEL.3)Go
  • Changed P5SEL.3 column from X to 0 for "P5.3 (I/O)" rowsGo
  • Changed P5.5 schematic (change input from P5SEL.5 to P5SEL.4 and added P5SEL.5 input and the following OR gate)Go
  • Changed P5SEL.5 column from X to 0 for "P5.5 (I/O)" rowsGo
  • Added Section 11, Mechanical, Packaging, and Orderable Information Go

The following table lists the changes to this data sheet from the initial release through revision L.

REVISION DESCRIPTION
SLAS590L June 2013

Production release of F5226 and F5224 in YFF package.

Section 1, Added note regarding pullup resistor on RST/NMI/SBWTDIO pin.

Figure 1-6, Added ball-side view and changed top-side view.
SLAS590K February 2013 Section 1, Changed IERASE and IMERASE values.
SLAS590J December 2012

Section 1, Added TYP test conditions

Section 1, Added note (1)

Section 1, Restored Flash erase currents to previous values (changed from TBD).
SLAS590I August 2012

Changed MSP430F5528IYFF to Production Data.

Section 1, Changed PUR pin description.

Section 1, Added note regarding PUR pin.

Table 1-1, Changed SYSRSTIV interrupt event with value 1Ch to Reserved.

Section 1, Added note regarding interaction between minimum VCC and SVSH.

Section 1, Changed tSENSOR(sample) MIN to 100 µs, and changed note (2).
SLAS590H February 2012

Corrected lost and corrupted symbols throughout. Affected symbols include: Δ θ Ω → ≥ ≤ ≠

Changed ACLK signal description in Section 1.

Changed note on Section 1.

Changed notes regarding UCA0CLK and UCB0CLK function on Table 1-1 and Table 1-1.
SLAS590G November 2011

Changed limits for wake-up time, LPM3/4 current, reference current, ADC12 maximum frequency, ADC linearity — see the following tables:
Section 1
Section 1
Section 1
Section 1
Section 1
Section 1
Section 1

Changed notes regarding crystal capacitance in Section 1

SLAS590F November 2011

Corrected terminal assignments for YFF package in Section 1 and Section 1

SLAS590E April 2011

Updated YFF and ZQE pinout drawings.

Changed Tstg maximum to 150°C in Section 1.

Changed fXT2,HF,SW MIN to 0.7 MHz in Section 1.
SLAS590D April 2010 Production data release
SLAS590C January 2010 Changes throughout for updated preview
SLAS590B July 2009 Changes throughout for updated preview
SLAS590A May 2009 Changes throughout for XMS430F5529 sampling
SLAS590 September 2008 Limited product preview release

Changes from Revision () to Revision ()
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