SLVK158A November   2023  – June 2024 TPS7H6003-SP , TPS7H6013-SP , TPS7H6023-SP

PRODUCTION DATA  

  1.   1
  2.   Abstract
  3.   Trademarks
  4. Introduction
  5. Single-Event Effects (SEE)
  6. Device and Test Board Information
  7. Irradiation Facility and Setup
  8. Depth, Range, and LETEFF Calculation
  9. Test Setup and Procedures
  10. Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-up (SEL) Results
    2. 7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  11. Single-Event Transients (SET)
  12. Event Rate Calculations
  13. 10Summary
  14.   A References
  15.   B Revision History

Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results

During the SEB/SEGR characterization, the device was tested at room temperature of approximately 25°C. The device was tested under both the enabled and disabled mode. For the SEB-OFF mode the device was disabled using the EN-pin by forcing 0V while in PWM mode and by holding both inputs low during the IIM mode testing. During the SEB/SEGR testing with the device enabled or disabled, not a single input current event was observed.

The species used for the SEB testing was Homium (165Ho at 15MeV / nucleon). For the 165Ho ion an angle of incidence of 0° was used to achieve an LETEFF = 75MeV × cm2 / mg (for more details, see Ion LETEFF, Depth, and Range in Silicon). The kinetic energy in the vacuum for this ion is 2.474GeV (15-MeV / amu line). Flux of approximately 105 ions / cm2 × s and a fluence of approximately 107 ions / cm2 was used for the run. Run duration to achieve this fluence was approximately two minutes. The four devices (same as used in SEL testing) were powered up and exposed to the heavy-ions using the maximum recommended input voltage and boot voltage of 14V. The ASW (High-Side Driver Signal Return) was set to 150 V. The device was set in both PWM and IIM modes during testing. For more information, see Single-Event Effects section. No SEB/SEGR current events were observed during the 12 runs, indicating that the TPS7H60x3-SP is SEB/SEGR-free up to LETEFF = 75MeV × cm2/ mg and across the full electrical specifications. Summary of TPS7H60x3-SP SEB/SEGR Test Condition and Results shows the SEB/SEGR test conditions and results.

Table 7-2 Summary of TPS7H60x3-SP SEB/SEGR Test Condition and Results
Run Number Unit Number Variant Ion LETEFF (MeV × cm2 / mg) Flux (ions × cm2/ mg) Fluence (number of ions) Enabled Status VIN VBOOT Mode Switching Frequency SEB Event?
10 1 TPS7H6003 165Ho 75 6.11 × 104 9.98 × 106 EN 14 14 PWM 500kHz No
11 1 TPS7H6003 165Ho 75 6.59 × 104 1.00 × 107 EN 14 14 PWM 1MHz No
12 1 TPS7H6003 165Ho 75 6.50 × 104 1.00 × 107 EN 14 14 PWM 2MHz No
13 1 TPS7H6003 165Ho 75 6.44 × 104 1.00 × 107 DIS 14 14 PWM N/A No
14 2 TPS7H6003 165Ho 75 6.09 × 104 1.00 × 107 EN 14 14 IIMENST N/A No
15 2 TPS7H6003 165Ho 75 6.14 × 104 1 × 107 EN 14 14 IIMENST N/A No
16 2 TPS7H6003 165Ho 75 6.26 × 104 1 × 107 DIS 14 14 IIMENST N/A No
17 2 TPS7H6003 165Ho 75 6.49 × 104 9.99 × 106 DIS 14 14 IIMDISST N/A No
18 3 TPS7H6003 165Ho 75 8.27 × 104 1 × 107 EN 14 14 IIMENSW 500kHz No
19 3 TPS7H6003 165Ho 75 7.25 × 104 1 × 107 EN 14 14 IIMDISSW 500kHz No
20 4 TPS7H6003 165Ho 75 5.68 × 104 1 × 107 EN 14 14 IIMDISST N/A No
21 4 TPS7H6003 165Ho 75 6.03 × 104 1 × 107 EN 14 14 IIMDISST N/A No
42 5 TPS7H6013 165Ho 75 8 × 104 1 × 107 EN 14 14 PWM 500kHz No
43 5 TPS7H6013 165Ho 75 7.65 × 104 1 × 107 DIS 14 14 PWM N/A No
44 6 TPS7H6013 165Ho 75 6.38 × 104 1 × 107 EN 14 14 IIMENSW 500kHz No
45 7 TPS7H6013 165Ho 75 7.17 × 104 1 × 107 EN 14 14 IIMDISSW 500kHz No
46 8 TPS7H6023 165Ho 75 6.63 × 104 1 × 107 EN 14 14 PWM 500kHz No
47 8 TPS7H6023 165Ho 75 6.21 × 104 1 × 107 DIS 14 14 PWM N/A No
48 9 TPS7H6023 165Ho 75 6.86 × 104 1 × 107 EN 14 14 IIMENSW 500kHz No
49 10 TPS7H6023 165Ho 75 5.95 × 104 1 × 107 EN 14 14 IIMDISSW 500kHz No

Using the MFTF method described in Single-Event Effects (SEE) Confidence Interval Calculations, the upper-bound cross-section (using a 95% confidence level) is calculated as:

Equation 2. σ S E B   3.08   x   10 - 8   c m 2 / d e v i c e   f o r   L E T E F F   =   75   M e V · c m 2 / m g   a n d   T   =   25 ° C
TPS7H6003-SP SEB On Run 10 (PWM Mode,
                        fsw= 500kHz) Figure 7-6 SEB On Run 10 (PWM Mode, fsw= 500kHz)
TPS7H6003-SP SEB On Run 11 (PWM Mode,
                        fsw = 1MHz) Figure 7-7 SEB On Run 11 (PWM Mode, fsw = 1MHz)
TPS7H6003-SP SEB On Run 12 (PWM Mode,
                        fsw= 2MHz) Figure 7-8 SEB On Run 12 (PWM Mode, fsw= 2MHz)
TPS7H6003-SP SEB Off Run 13 (PWM
                    Mode) Figure 7-9 SEB Off Run 13 (PWM Mode)
TPS7H6003-SP SEB On Run 14 (IIM-Enabled
                    Mode, EN/HI = 14V) Figure 7-10 SEB On Run 14 (IIM-Enabled Mode, EN/HI = 14V)
TPS7H6003-SP SEB Off Run 16 (IIM-Enabled
                    Mode) Figure 7-11 SEB Off Run 16 (IIM-Enabled Mode)
TPS7H6003-SP SEB On Run 21 (IIM-Disabled
                    Mode, PWM/LI = 14V) Figure 7-12 SEB On Run 21 (IIM-Disabled Mode, PWM/LI = 14V)
TPS7H6003-SP SEB Off Run 17 (IIM-Disabled
                    Mode) Figure 7-13 SEB Off Run 17 (IIM-Disabled Mode)