SLVK162A December 2023 – August 2024 TPS7H6003-SP , TPS7H6013-SP , TPS7H6023-SP
This report presents the effect of neutron displacement damage (NDD) on the TPS7H6003-SP,TPS7H6013-SP and TPS7H6023-SP devices. This platform of devices show a strong degree of hardness to neutron irradiation up to fluence level 1 × 1013 n/cm2.
The neutron irradiation test is a destructive test. Test procedure follows MIL-STD-883 method 1017 as guidance. The purpose of this test is to determine the device susceptibility to non-ionizing energy loss (NIEL) degradation. Objectives of the test are, to detect and measure the degradation of critical device parameters as a function of neutron fluence and to determine if these parameters are within specified limits after exposure to a specified level of neutron fluence.