SNOK006 April   2024 TPS7H6013-SP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Device Information
    1. 1.1 Product Description
    2. 1.2 Device Details
  5. 2Total Dose Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Description and Facilities
    3. 2.3 Test Setup Details
      1. 2.3.1 Unbiased
      2. 2.3.2 Biased
    4. 2.4 Test Configuration and Condition
  6. 3TID Characterization Test Results
    1. 3.1 TID Characterization Results Summary
    2. 3.2 Data Sheet Electrical Parameters
  7. 4Applicable and Reference Documents
    1. 4.1 Applicable Documents
    2. 4.2 Reference Documents
  8.   A Appendix: HDR TID Report

Abstract

This report discusses the results of the total ionizing dose (TID) testing for the Texas Instruments TPS7H6013-SP radiation hardness-assured 1.3A, 2.5A, half-bridge gate driver. The study was done to determine TID effects at 100krad(Si) High Dose Rate (HDR). The results show that all samples pass within device specified test limits.
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