SSZT207 December 2020 ISO7741-Q1 , LMG3425R030 , TMS320F2800137 , TMS320F280025C , TMS320F280039C , TMS320F28379D
Gallium nitride (GaN) field-effect transistors (FETs) provide drastically improved switching losses and higher power density over silicon-carbide and silicon-based FETs, respectively. These traits can be particularly helpful in high-switching-frequency applications such as digital power converters, where they can help reduce the size of the magnetics.
Designers in the power electronics industry need new technologies and methods to increase performance in GaN systems. C2000™ real-time microcontrollers (MCUs) can help address design challenges when developing modern power-conversion systems using GaN technology.
A reinforced digital isolator helps suppress transient noise and protects the C2000 MCU. The C2000 MCU provides precise control output using its high-resolution PWM and configurable logic block and enhanced-capture modules to capture all of the GaN FET’s safety, temperature and error-reporting features without the use of external glue logic. The integrated driver in a 600-V GaN FET reduces system design concerns caused by inductive ringing. Combining these devices eliminates the need for external components, reducing overall costs.
Learn more about the advanced features of TI’s GaN FETs in the technical article, “How GaN FETs with integrated drivers and self-protection will enable the next generation of industrial power designs.”