THS4513
- Fully-Differential Architecture
- Centered Input Common-Mode Range
- Minimum Gain of 1 V/V (0 dB)
- Bandwidth: 1600 MHz
- Slew Rate: 5100 V/µs
- 1% Settling Time: 2.9 ns
- HD2: –75 dBc at 70 MHz
- HD3: –86 dBc at 70 MHz
- OIP2: 77 dBm at 70 MHz
- OIP3: 42 dBm at 70 MHz
- Input Voltage Noise: 2.2 nV/√Hz (f > 10 MHz)
- Noise Figure: 19.8 dB
- Output Common-Mode Control
- Power Supply:
- Voltage: 3 V (±1.5 V) to 5 V (±2.5 V)
- Current: 37.7 mA
- Power-Down Capability: 0.65 mA
- APPLICATIONS
- 5-V Data Acquisition Systems, High Linearity ADC Amplifier
- Wireless Communication
- Medical Imaging
- Test and Measurement
All trademarks are the property of their respective owners.
The THS4513 is a wideband, fully-differential op amp designed for 3.3-V to 5-V data acquisition systems. It has very low noise at 2.2 nV/√Hz, and extremely low harmonic distortion of –75 dBc HD2 and –86 dBc HD3 at 70 MHz with 2-VPP output, G = 0 dB, and 200- load. Slew rate is very high at 5100 V/μs and with settling time of 2.9 ns to 1% (2-V step), it is ideal for pulsed applications. It is designed for a minimum gain of 0 dB.
To allow for dc-coupling to analog-to-digital converters (ADCs), its unique output common-mode control circuit maintains the output common-mode voltage within 5-mV offset (typ) from the set voltage, when set within 0.5 V of midsupply, with less than 4-mV differential offset voltage. The common-mode set point is set to midsupply by internal circuitry, which may be overdriven from an external source.
The input and output are optimized for best performance with their common-mode voltages set to midsupply. Along with high performance at low power-supply voltage, this design makes it ideal for extremely high-performance, single-supply 5-V data acquisition systems.
The THS4513 is offered in a quad, leadless QFN-16 package (RGT), and is characterized for operation over the full industrial temperature range from –40°C to +85°C.
技术文档
类型 | 标题 | 下载最新的英语版本 | 日期 | |||
---|---|---|---|---|---|---|
* | 数据表 | Wideband, Low-Noise, Low-Distortion, Fully-Differential Amplifier. 数据表 (Rev. E) | 2013年 1月 29日 | |||
电子书 | The Signal e-book: 有关运算放大器设计主题的博客文章汇编 | 英语版 | 2018年 1月 31日 | |||
应用手册 | Fully-Differential Amplifiers (Rev. E) | 2016年 9月 19日 | ||||
模拟设计期刊 | Low-power, high-intercept interface to the ADS5424, 105-MSPS converter | 2005年 10月 10日 | ||||
模拟设计期刊 | Analysis of fully differential amplifiers | 2005年 3月 11日 | ||||
模拟设计期刊 | Fully differential amplifiers applications:Line termination,driving high-speed.. | 2005年 3月 2日 | ||||
应用手册 | Noise Analysis for High Speed Op Amps (Rev. A) | 2005年 1月 17日 |
设计和开发
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THS4508EVM — THS4508 评估模块
THS4508EVM is an evaluation Module for the RGT (16 pin leadless QFN) package.
The THS4508EVM is designed to demonstrate the functionality and versatility of the device. The EVM is ready for power, signal source, and test instruments. The EVM is configured for a gain of 10 dB and 50 ohm input and (...)
THS4511EVM — THS4511 评估模块
THS4511EVM is an evaluation Module for the RGT (16 pin leadless QFN) package.
The THS4511EVM is designed to demonstrate the functionality and versatility of the device. The EVM is ready for power, signal source, and test instruments. The EVM is configured for a gain of 0 dB and 50 ohm input and (...)
THS4513EVM — THS4513 评估模块
THS4513EVM is an evaluation Module for the RGT (16 pin leadless QFN) package.
The THS4513EVM is designed to demonstrate the functionality and versatility of the device. The EVM is ready for power, signal source, and test instruments. The EVM is configured for a gain of 0dB and 50 ohm input and (...)
THS4520EVM — THS4520 评估模块
THS4520EVM is an evaluation Module for the RGT (16 pin leadless QFN) package.
The THS4520EVM is designed to demonstrate the functionality and versatility of the device. The EVM is ready for power, signal source, and test instruments. The EVM is configured for a gain of 0 dB and 50 Ω (...)
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封装 | 引脚 | CAD 符号、封装和 3D 模型 |
---|---|---|
VQFN (RGT) | 16 | Ultra Librarian |
订购和质量
- RoHS
- REACH
- 器件标识
- 引脚镀层/焊球材料
- MSL 等级/回流焊峰值温度
- MTBF/时基故障估算
- 材料成分
- 鉴定摘要
- 持续可靠性监测
- 制造厂地点
- 封装厂地点