Home Data converters Digital-to-analog converters (DACs) High-speed DACs (>10 MSPS)
Home
Data converters
Digital-to-analog converters (DACs)
High-speed DACs (>10 MSPS)
NEW

DAC39RFS10-SP

PREVIEW

Radiation-hardness-assured, 300krad, 16-bit, 1-ch, 10.4GSPS 12GHz RF digital-to-analog converter

Order now
Data sheet

DAC39RFS10-SP

PREVIEW
Data sheet Order now

Product details

Resolution (Bits) 16 Number of DAC channels 1 Interface type JESD204B, JESD204C Sample/update rate (Msps) 10400, 20800 Features Ultra High Speed Rating Catalog Interpolation 128x, 12x, 16x, 192x, 1x, 24x, 256x, 2x, 32x, 3x, 48x, 4x, 64x, 6x, 8x, 96x Power consumption (typ) (mW) 2800 SFDR (dB) 85 Architecture Current Source Operating temperature range (°C) 25 to 25 Reference type Ext, Int
Resolution (Bits) 16 Number of DAC channels 1 Interface type JESD204B, JESD204C Sample/update rate (Msps) 10400, 20800 Features Ultra High Speed Rating Catalog Interpolation 128x, 12x, 16x, 192x, 1x, 24x, 256x, 2x, 32x, 3x, 48x, 4x, 64x, 6x, 8x, 96x Power consumption (typ) (mW) 2800 SFDR (dB) 85 Architecture Current Source Operating temperature range (°C) 25 to 25 Reference type Ext, Int
FCBGA (ACL) 256 289 mm² 17 x 17
  • Radiation hardness assured DAC39RFx10-SP:
    • Single event upset (SEU) immune registers
    • Single-event latch up (SEL): 120MeV-cm2/mg
    • RLAT Total ionizing dose (TID): 300krad (Si)
  • Radiation tolerant DAC39RFx10-SEP:
    • Single event upset (SEU) immune registers
    • Single-event latch up (SEL): 43MeV-cm2/mg
    • RLAT Total ionizing dose (TID): 30krad (Si)
  • 16-bit, 10.4 or 20.8GSPS, multi-Nyquist DAC Cores
  • Maximum input data rate:
    • 8-bit, Single channel, DES mode: 20.8GSPS
    • 12-bit, Single channel, DES mode: 15.5GSPS
    • 16-bit, Single channel: 10.4GSPS
    • 8-bit, Dual channel, 10.4GSPS
    • 12-bit, Dual channel: 7.75GSPS/ch
    • 16-bit, Dual channel: 6.2GSPS/ch
  • Output bandwidth (-3dB): 12GHz
  • Performance at fOUT = 2.997GHz, DES2XL mode, DEM/Dither off
    • Noise floor (small signal): –155dBFS/Hz
    • SFDR (-0.1dBFS) : 60dBc
    • IMD3 (-7dBFS each tone) : –62dBc
    • Additive phase noise, 10kHz offset: -138dBc/Hz
  • Four Integrated digital up-converters (DUC)
    • Interpolation: 1x, 2x, 3x, 4x, 6x, 8x, 12x ... 256x
    • Complex baseband DUC for I/Q output
    • Complex to real up conversion for dual channel direct RF sampling
    • 64-bit frequency resolution NCOs
  • JESD204C Interface
    • Up to 16 Lanes at up to 12.8Gbps
    • Class C-S, subclass-1 Compatible
    • Internal AC coupling capacitors
  • SYSREF Windowing for automatic SYSREF timing calibration
  • Space screening and assurance:
    • Meets ASTM E595 outgassing specification
    • One fabrication, assembly, and test site
    • Wafer lot traceability
    • Extended product life cycle
    • Radiation lot acceptance test (RLAT)
    • Production burn-in (DAC39RFx10-SP only)
  • Radiation hardness assured DAC39RFx10-SP:
    • Single event upset (SEU) immune registers
    • Single-event latch up (SEL): 120MeV-cm2/mg
    • RLAT Total ionizing dose (TID): 300krad (Si)
  • Radiation tolerant DAC39RFx10-SEP:
    • Single event upset (SEU) immune registers
    • Single-event latch up (SEL): 43MeV-cm2/mg
    • RLAT Total ionizing dose (TID): 30krad (Si)
  • 16-bit, 10.4 or 20.8GSPS, multi-Nyquist DAC Cores
  • Maximum input data rate:
    • 8-bit, Single channel, DES mode: 20.8GSPS
    • 12-bit, Single channel, DES mode: 15.5GSPS
    • 16-bit, Single channel: 10.4GSPS
    • 8-bit, Dual channel, 10.4GSPS
    • 12-bit, Dual channel: 7.75GSPS/ch
    • 16-bit, Dual channel: 6.2GSPS/ch
  • Output bandwidth (-3dB): 12GHz
  • Performance at fOUT = 2.997GHz, DES2XL mode, DEM/Dither off
    • Noise floor (small signal): –155dBFS/Hz
    • SFDR (-0.1dBFS) : 60dBc
    • IMD3 (-7dBFS each tone) : –62dBc
    • Additive phase noise, 10kHz offset: -138dBc/Hz
  • Four Integrated digital up-converters (DUC)
    • Interpolation: 1x, 2x, 3x, 4x, 6x, 8x, 12x ... 256x
    • Complex baseband DUC for I/Q output
    • Complex to real up conversion for dual channel direct RF sampling
    • 64-bit frequency resolution NCOs
  • JESD204C Interface
    • Up to 16 Lanes at up to 12.8Gbps
    • Class C-S, subclass-1 Compatible
    • Internal AC coupling capacitors
  • SYSREF Windowing for automatic SYSREF timing calibration
  • Space screening and assurance:
    • Meets ASTM E595 outgassing specification
    • One fabrication, assembly, and test site
    • Wafer lot traceability
    • Extended product life cycle
    • Radiation lot acceptance test (RLAT)
    • Production burn-in (DAC39RFx10-SP only)

The DAC39RF10-Sx and ’RFS10-Sx are a family of dual and single channel digital-to-analog converters (DAC) with 16-bit resolution. The devices can be used as non-interpolating or interpolating DACs for either direct RF sampling or complex baseband signal generation. The maximum input data rate is 20.8GSPS for a single channel or 10.4 GSPS for two channels. The devices can generate signals of up to 10, 7.5, and 5GHz signal bandwidth (8, 12, and 16-bit input resolution) at carrier frequencies exceeding 10GHz enabling direct sampling in X-band.

The high sampling rate, output frequency range, 64-bit NCO frequency resolution and any frequency hopping with phase coherence also makes the DAC39RF10-Sx and ’RFS10-Sx capable of arbitrary waveform generation (AWG) and direct digital synthesis (DDS).

A JESD204B and JESD204C compatible serial interface has 16 receiver pairs capable of up to 12.8Gbps. The interface is JESD204B and JESD204C subclass-1 compliant for deterministic latency and multi-device synchronization through the use of SYSREF.

The DAC39RF10-Sx and ’RFS10-Sx are a family of dual and single channel digital-to-analog converters (DAC) with 16-bit resolution. The devices can be used as non-interpolating or interpolating DACs for either direct RF sampling or complex baseband signal generation. The maximum input data rate is 20.8GSPS for a single channel or 10.4 GSPS for two channels. The devices can generate signals of up to 10, 7.5, and 5GHz signal bandwidth (8, 12, and 16-bit input resolution) at carrier frequencies exceeding 10GHz enabling direct sampling in X-band.

The high sampling rate, output frequency range, 64-bit NCO frequency resolution and any frequency hopping with phase coherence also makes the DAC39RF10-Sx and ’RFS10-Sx capable of arbitrary waveform generation (AWG) and direct digital synthesis (DDS).

A JESD204B and JESD204C compatible serial interface has 16 receiver pairs capable of up to 12.8Gbps. The interface is JESD204B and JESD204C subclass-1 compliant for deterministic latency and multi-device synchronization through the use of SYSREF.
filter Find other High-speed DACs (>10 MSPS)
Download View video with transcript Video

Technical documentation

star =Top documentation for this product selected by TI
No results found. Please clear your search and try again.
View all 1
Type Title Date
* Data sheet DAC39RFx10-SP DAC39RFx10-SEP 10.4 or 20.8GSPS, 16-bit, Dual and Single Channel, Multi-Nyquist Digital-to-Analog Converter (DAC) with JESD204C Interface datasheet PDF | HTML 25 Mar 2024

Design & development

For additional terms or required resources, click any title below to view the detail page where available.

Evaluation board

DAC39RF10EVM — DAC39RF10 evaluation module

The DAC39RF10EVM is an evaluation board used to evaluate the DAC39RF10, digital-to-analog converter (DAC) from Texas Instruments.

User guide: PDF | HTML
Not available on TI.com
Simulation model

DAC39RF10 IBIS and IBIS AMI Model: IBIS Models With Hyperlynx and Keysight ADS Example Projects

SBAM511.ZIP (104395 KB) - IBIS Model
Download
Simulation tool

PSPICE-FOR-TI — PSpice® for TI design and simulation tool

PSpice® for TI is a design and simulation environment that helps evaluate functionality of analog circuits. This full-featured, design and simulation suite uses an analog analysis engine from Cadence®. Available at no cost, PSpice for TI includes one of the largest model libraries in the (...)
Request
Package Pins CAD symbols, footprints & 3D models
FCBGA (ACL) 256 Ultra Librarian
TI's Standard Terms and Conditions for Evaluation Items apply.

Ordering & quality

Information included:
  • RoHS
  • REACH
  • Device marking
  • Lead finish/Ball material
  • MSL rating/Peak reflow
  • MTBF/FIT estimates
  • Material content
  • Qualification summary
  • Ongoing reliability monitoring
Information included:
  • Fab location
  • Assembly location

Recommended products may have parameters, evaluation modules or reference designs related to this TI product.

Support & training

TI E2E™ forums with technical support from TI engineers

View all forum topics

Content is provided "as is" by TI and community contributors and does not constitute TI specifications. See terms of use.

If you have questions about quality, packaging or ordering TI products, see TI support. ​​​​​​​​​​​​​​

Videos