This reference design discusses the use of the TSW3085EVM with the TSW3100 pattern generator to test adjacent channel power ratio (ACPR) and error vector magnitude (EVM) measurements of LTE baseband signals. By using the TSW3100 LTE GUI, patterns are loaded into the TSW3085EVM which is comprised of the DAC3482, TRF3705, and LMK04806.
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The TSW3085 Evalutaion Module is a circuit board that allows system designers to evaluate the combined performance of Texas Instruments' transmit signal chain with the LMK04806B (formally National Semiconductor) low noise clock generator/jitter cleaner. For ease of use as a complete RF transmit (...)
| Type | Title | Date | ||
|---|---|---|---|---|
| User guide | TSW3085EVM ACPR and EVM Measurements (TIDA-00076 Reference Guide) | Dec. 29, 2011 |
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