ZHCSJ76A March 2018 – April 2019 DRV8343-Q1
PRODUCTION DATA.
The gate drivers implement adjustable VDS voltage monitors to detect overcurrent or short-circuit conditions on the external power MOSFETs. When the monitored voltage is greater than the VDS trip point (VVDS_OCP) for longer than the deglitch time (tOCP), an overcurrent condition is detected and action is taken according to the device VDS fault mode.
The high-side VDS monitors measure the voltage between the VDRAIN and SHx pins.The low-side VDS monitors measure the voltage between the DLx and SLx pins. If the current sense amplifier is unused, tie the SP pins to the common ground point of the external half-bridges.
For the SPI devices, the reference point of the low-side VDS monitor can be changed between the SPx and SNx pins if desired with the LS_REF register setting.
The VVDS_OCP threshold is programmable from 0.06 V to 1.88 V. For additional information on the VDS monitor levels, see the Register Maps section for SPI devices and in the Pin Diagrams section hardware interface device.