ZHCSMR1C october 2019 – september 2021 UCC5870-Q1
PRODUCTION DATA
The device integrates extensive error detection and monitoring features. These features allow the design of a robust system that protects against a variety of system related failure modes. When one of the monitored warnings or faults occurs, if unmasked, the nFLT1 output (for faults) or the nFLT2 output (for warnings) pulls low. All of the fault and warning bits have corresponding configuration bits that allow the user to mask the error or fault from showing up on the nFLT* output. The naming convention is straightforward. The mask bit is in a CFG* register and is named the same as the fault with the addition of an "_P". For example, a power FET short circuit current fault is indicated in the register bit STATUS3[SC_FAULT] (STATUS3)and the mask bit is CFG9[SC_FAULT_P] (CFG9). Throughout this document, the different warning/error bit locations are indicated in the functional description of the block where the warning/fault is monitored. When masked, the nFLT* indication does not occur, but the STATUS* bits still indicate the warning/fault condition. The device classifies error events into two categories, Warnings and Faults, and takes different device actions depending on the error classification.
The Warning error class is used to report non-critical fault conditions. Warning errors are only reported with no action taken to affect the gate driver output or any other block. When a warning condition occurs, it is reported in on of the STATUS* registers and, if unmasked, the nFLT2 output is driven low. The nFLT2 indication for warning is cleared by a successful SPI read of the corresponding status register. Once cleared, warning indication is not repeated until the warning condition is removed and reapplied. For example, in an over temperature warning condition, after reading/clearing the bit the temperature must cool down to the normal operating range and then heat up again to the over temperature warning threshold for the error flag to be reasserted. The status bit always indicates the current state of the warning, and is not cleared until the error condition is removed.
The Fault error class is used to report critical fault conditions. Fault errors have the ability to shut down the gate driver when they occur. When a fault condition occurs, it is reported in one of the STATUS* registers and, if unmasked, the nFLT1 output is driven low. Many faults have a corresponding configuration bit that enables the user to select the functional safe state of the driver when that fault occurs when the fault is not masked. These bits are in the CFG* registers, with bit names that start with "FS_STATE_". Throughout this document, the FS_STATE locations are indicated in the functional description of the block where the fault is monitored. The available options for the output state, depending on the fault, are PL (OUTL pulled low), PH (OUTH pulled high), or no action (gate driver output ignores the fault and continues normal operation). Faults are cleared when the condition is removed, and the CONTROL2[CLR_STAT_REG] bit (CONTROL2) is written. Fault indication reasserts as long as the fault condition exists and is unmasked. Table 7-1 provides an extensive list and details for the available faults and warnings.
NAME(1) | INDICATOR BIT | DRIVER OUTPUT (Default Action and Control bit) |
SPI | nFLT1 (Default Action and Control bit) |
nFLT2 | Recovery operation |
---|---|---|---|---|---|---|
UVLO of VCC1 fault | STATUS2[UVLO1_FAULT] = 1 | PL CFG3[FS_STATE_UVLO1_FAULT] |
D (Not latched. SPI is re-enabled if VCC1 voltage is above the UV threshold) | Assert CFG2[UVLO1_FAULT_P] |
- | System (MCU) to re-configure the device. Rewrite all SPI configurable registers. |
OVLO of VCC1 fault | STATUS2[OVLO1_FAULT] = 1 | PL CFG3[FS_STATE_OVLO1_FAULT] |
D(Not latched. SPI is re-enabled if VCC1 voltage is below the OV threshold) | Assert CFG2[OVLO1_FAULT_P] |
- | System (MCU or other controller) to cycle VCC1 and re-configure the device. Rewrite all SPI configurable registers. |
UVLO of VCC2 fault | STATUS3[UVLO2_FAULT] = 1 | PL CFG11[FS_STATE_UVLO2] |
E | Assert CFG9[UVLO23_FAULT_P] |
- | System (MCU) to re-configure the device. Rewrite all SPI configurable registers. |
OVLO of VCC2 fault | STATUS3[OVLO2_FAULT] = 1 | PL CFG11[FS_STATE_OVLO2] |
E | Assert CFG9[OVLO23_FAULT_P] |
- | System (MCU or other controller) to cycle VCC2 and re-configure the device. Rewrite all SPI configurable registers. |
UVLO of VEE2 fault | STATUS3[UVLO3_FAULT] = 1 | PL CFG11[FS_STATE_UVLO3] |
E | Assert CFG9[UVLO23_FAULT_P] |
- | CLR_STAT_REG=1 |
OVLO of VEE2 fault | STATUS3[OVLO3_FAULT] = 1 | PL CFG11[FS_STATE_OVLO3] |
E | Assert CFG9[OVLO23_FAULT_P] |
- | CLR_STAT_REG=1 |
Driver IC over temperature warning | STATUS1[GD_TWN_PRI_FAULT] = 1 (primary) STATUS4[GD_TWN_SEC_FAULT] = 1 (secondary) |
NA | E | - | Assert CFG2[GD_TWN_PRI_FAULT_P] |
- |
Driver IC over temperature shutdown fault (secondary) | STATUS4[GD_TSD_SEC_FAULT] = 1 Additionally, the STATUS2[CLK_MON_PRI_FAULT] 1 and STATUS2[INT_COMM_PRI_FAULT] indicate faults |
PL | E | Assert CFG9[GD_TSD_FAULT_P] |
- | System to cycle VCC2 power and re-configure the device after allowing the device to cool. Rewrite all SPI configurable registers. |
Driver IC over temperature shutdown fault (primary) | - | PL | D | - | - | System to re-configure the device. Rewrite all SPI configurable registers. |
Power transistor over current fault | STATUS3[OC_FAULT] = 1 | PL CFG10[FS_STATE_OCP] |
E | Assert CFG9[OC_FAULT_P] |
- | CLR_STAT_REG=1 |
Power transistor short circuit fault | STATUS3[SC_FAULT] = 1 or STATUS3[DESAT_FAULT] = 1 | PL CFG10[FS_STATE_DESAT_SCP] |
E | Assert CFG9[SC_FAULT_P] |
- | CLR_STAT_REG=1 |
Power transistor over temperature fault | STATUS3[PS_TSD_FAULT] = 1 | PL CFG10[FS_STATE_PS_TSD] |
E | Assert CFG9[PS_TSD_FAULT_P] |
- | CLR_STAT_REG=1 |
Gate voltage monitor fault | STATUS3[GM_FAULT] = 1 | HiZ CFG10[FS_STATE_GM] |
E | Assert CFG9[GM_FAULT_P] |
Not Asserted CFG9[GM_FAULT_P] |
CLR_STAT_REG=1 |
PWM shoot through fault and STP diagnostic | STATUS2[STP_FAULT] = 1 | PL CFG3[FS_STATE_STP_FAULT] |
E | Assert CFG2[STP_FAULT_P] |
- | CLR_STAT_REG=1 |
Clock monitor fault (primary) | STATUS4[CLK_MON_SEC_FAULT] = 1 | PL CFG11[FS_STATE_CLK_MON_SEC_FAULT] |
D(Not latched. SPI is re-enabled if the clock recovers) | Assert CFG2[CLK_MON_SEC_FAULT_P] |
- | System (MCU or other controller) to cycle VCC1 and re-configure the device. Rewrite all SPI configurable registers. |
Clock monitor fault (secondary) | STATUS2[CLK_MON_PRI_FAULT] = 1 | PL | E | Assert CFG2[CLK_MON_PRI_FAULT_P] |
- | System (MCU or other controller) to cycle VCC2 and re-configure the device. Rewrite all SPI configurable registers. |
Internal regulator UVLO fault | STATUS2[INT_REG_PRI_FAULT] = 1 (priamry) STATUS3[INT_REG_SEC_FAULT] = 1 (secondary) |
PL CFG3[FS_STATE_INT_REG_PRI_FAULT] (primary) CFG10[FS_STATE_INT_REG_SEC_FAULT] (secondary) |
E | Assert CFG2[INT_REG_PRI_FAULT_P] |
- | System (MCU or other controller) to cycle VCC1/VCC2 and re-configure the device. Rewrite all SPI configurable registers. |
Internal regulator OVLO fault | STATUS2[INT_REG_PRI_FAULT] = 1 (primary) STATUS3[INT_REG_SEC_FAULT] = 1 (secondary) |
PL CFG3[FS_STATE_INT_REG_PRI_FAULT] (primary) CFG10[FS_STATE_INT_REG_SEC_FAULT] (secondary) |
E | Assert CFG2[INT_REG_PRI_FAULT_P] |
- | System (MCU or other controller) to cycle VCC1/VCC2 and re-configure the device. Rewrite all SPI configurable registers. |
VREG1 OVLO fault | - | Results in a secondary internal communication fault. See the internal communication fault line for behavior | D | Assert | - | System (MCU or other controller) to cycle VCC1 and re-configure the device. Rewrite all SPI configurable registers. |
VREG2 OVLO fault | - | Results in ia primary internal communication fault. See the internal communication fault line for behavior | E | Results in a primary internal communication fault. See the internal communication fault line for behavior | - | System (MCU or other controller) to cycle VCC2 and re-configure the device. Rewrite all SPI configurable registers. |
SPI clock fault | STATUS2[SPI_FAULT] = 1 | NA CFG3[FS_STATE_SPI_FAULT] |
E | Not Asserted CFG2[SPI_FAULT_P] |
Assert CFG2[SPI_FAULT_P] |
System (MCU or other controller) to cycle VCC1 and re-configure the device. Rewrite all SPI configurable registers. |
SPI address fault | STATUS2[SPI_FAULT] = 1 | NA CFG3[FS_STATE_SPI_FAULT] |
E | Not Asserted CFG2[SPI_FAULT_P] |
Assert CFG2[SPI_FAULT_P] |
System (MCU or other controller) to cycle VCC1 and re-configure the device. Rewrite all SPI configurable registers. |
SPI CRC fault | STATUS2[SPI_FAULT] = 1 | NA CFG3[FS_STATE_SPI_FAULT] |
E | Not Asserted CFG2[SPI_FAULT_P] |
Assert CFG2[SPI_FAULT_P] |
System (MCU or other controller) to cycle VCC1 and re-configure the device. Rewrite all SPI configurable registers. |
Configuration register CRC fault | STATUS2[CFG_CRC_PRI_FAULT] = 1 (primary) STATUS4[CFG_CRC_SEC_FAULT] = 1 (secondary) |
PL CFG3[FS_STATE_CFG_CRC_PRI_FAULT] (primary) CFG10[FS_STATE_CFG_CRC_SEC_FAULT] (secondary) |
E | Assert CFG2[CFG_CRC_PRI_FAULT_P] (primary) CFG9[CFG_CRC_SEC_FAULT_P] (secondary) |
- | System (MCU or other controller) to cycle VCC1/VCC2 and re-configure the device. Rewrite all SPI configurable registers. |
TRIM CRC fault | STATUS2[TRIM_CRC_PRI_FAULT] = 1 (primary) TRIM_CRC_SEC_FAULT = 1 (secondary) |
PL Always PL (primary) CFG11[FS_STATE_TRIM_CRC_SEC_FAULT] (secondary) |
E | Assert CFG2[CFG_CRC_PRI_FAULT_P] (primary) CFG9[CFG_CRC_SEC_FAULT_P] (secondary) |
Assert CFG2[CFG_CRC_PRI_FAULT_P] (primary) CFG9[CFG_CRC_SEC_FAULT_P] (secondary) |
System (MCU or other controller) to cycle VCC1/VCC2 and re-configure the device. Rewrite all SPI configurable registers. |
Clock monitor BIST fault | STATUS2[BIST_PRI_FAULT] = 1 (primary) STATUS4[BIST_SEC_FAULT] = 1 (secondary) |
PL | E | Assert CFG2[BIST_PRI_FAULT_P] (primary) CFG9[BIST_SEC_FAULT_P] (secondary) |
Assert CFG2[BIST_PRI_FAULT_P] (primary) CFG9[BIST_SEC_FAULT_P] (secondary) |
System (MCU or other controller) to cycle VCC1/VCC2 and re-configure the device. Rewrite all SPI configurable registers. |
Analog BIST fault | STATUS2[BIST_PRI_FAULT] = 1 (primary) STATUS4[BIST_SEC_FAULT] = 1 (secondary) |
PL | E | Assert CFG2[BIST_PRI_FAULT_P] (primary) CFG9[BIST_SEC_FAULT_P] (secondary) |
Assert CFG2[BIST_PRI_FAULT_P] (primary) CFG9[BIST_SEC_FAULT_P] (secondary) |
System (MCU or other controller) to cycle VCC1/VCC2 and re-configure the device. Rewrite all SPI configurable registers. |
Internal Communication fault (primary) | STATUS2[INT_COMM_PRI_FAULT]=1 | PL CFG3[FS_STATE_INT_COMM_PRI_FAULT] |
E | Not Asserted CFG2[INT_COMM_PRI_FAULT_P] |
- | System (MCU or other controller) to cycle VCC1/VCC2 and re-configure the device. Rewrite all SPI configurable registers. |
Internal Communication fault (secondary) | STATUS3[INT_COMM_SEC_FAULT]=1 | PL CFG10[FS_STATE_INT_COMM_SEC_FAULT] |
E | Asserted CFG9[INT_COMM_SEC_FAULT_P] |
- | System (MCU or other controller) to cycle VCC1/VCC2 and re-configure the device. Rewrite all SPI configurable registers. |
PWM check fault | STATUS1[PWM_COMP_CHK_FAULT] = 1 | PL CFG3[FS_STATE_PWM_CHK] |
E | Assert CFG2[PWM_CHK_FAULT_P] |
- | |
VREF UV/OV fault | STATUS5[ADC_FAULT] = 1 | NACFG7[FS_STATE_ADC_FAULT] | E | Not Asserted CFG7[ADC_FAULT_P] |
- | System (MCU or other controller) to cycle VREF bias and write CLR_STAT_REG=1 |
VCE over voltage fault | STATUS3[VCEOV_FAULT] = 1 | STO | E | - | - | - |
VREG1 overcurrent fault | STATUS2[VREG1_ILIMIT_FAULT] = 1 | NA | E Very likely that this fault causes a VREG1 UV which disbles SPI |
Assert CFG2[VREG1_ILIMIT_FAULT_P] |
- | System (MCU or other controller) to cycle VCC1 and re-configure the device. Rewrite all SPI configurable registers. |
VREG2 overcurrent fault | STATUS3[VREG2_ILIMIT_FAULT] = 1 | NA | E | Assert CFG9[VREG2_ILIMIT_FAULT_P] |
- | System (MCU or other controller) to cycle VCC2 and re-configure the device. Rewrite all SPI configurable registers. |
VREF overcurrent fault | STATUS5[ADC_FAULT] = 1 | NA | E | Assert CFG7[ADC_FAULT_P] |
- | System (MCU or other controller) to cycle VREF bias and write CLR_STAT_REG=1 |