SNVA967C June 2020 – April 2021 LM34966-Q1 , LM5156 , LM5156-Q1 , LM51561 , LM51561-Q1 , LM51561H , LM51561H-Q1 , LM5156H , LM5156H-Q1
The failure mode distribution estimation for LM5156, LM5156-Q1, LM51561, LM51561-Q1, LM5156H, LM5156H-Q1, LM51561H, LM51561H-Q1, and LM34966-Q1 (WSON and HTSSOP packages) in Table 4-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
| No Output Voltage | 60% |
| Output not in specification – voltage or timing | 30% |
| Gate Driver stuck on | 5% |
| Power Good – False Trip or Failure to Trip | 5% |