TPS51020
- Wide Input Voltage Range: 4.5-V to 28-V
- Selectable Dual and DDR Modes
- Selectable Fixed Frequency Voltage Mode
- Advanced Power Good Logic Monitors both Channels
- Selectable Autoskip Mode
- Integrated Boot Strap Diodes
- 180° Phase Shift Between Channels
- Integrated 5-V, 60-mA Regulator
- Input Feedforward Control
- 1% Internal 0.85-V Reference
- RDS(on) Overcurrent Detection (4200 ppm/°C)
- Integrated OVP, UVP and Power Good Timers
- 30-pin TSSOP Package
- APPLICATIONS
- Notebook Computers System Bus and I/O
- DDR I or DDR II Termination
The TPS51020 is a multi-function dual-synchronous step-down controller for notebook system power. The part is specifically designed for high performance, high efficiency applications where the loss associated with a current sense resistor is unacceptable. The TPS51020 utilizes feed forward voltage mode control to attain high efficiency without sacrificing line response. Efficiency at light load conditions can be maintained high as well by incorporating autoskip operation. A selectable, Suspend to RAM (STR) supported, DDR option provides a one chip solution for all switching applications from 5-V/3.3-V supply to a complete DDR termination solution.
技术文档
类型 | 标题 | 下载最新的英语版本 | 日期 | |||
---|---|---|---|---|---|---|
* | 数据表 | Dual, Voltage Mode, DDR Selectable, 数据表 (Rev. C) | 2008年 10月 3日 | |||
用户指南 | TPS51020 降压控制器评估模块用户指南 (Rev. A) | PDF | HTML | 英语版 (Rev.A) | PDF | HTML | 2022年 7月 18日 | |
选择指南 | 电源管理指南 2018 (Rev. K) | 2018年 7月 31日 | ||||
选择指南 | 电源管理指南 2018 (Rev. R) | 2018年 6月 25日 |
设计和开发
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TPS51116EVM-001 — TPS51116 存储器电源解决方案,同步降压控制器评估模块
The TPS51116EVM evaluation module (EVM) is a dual-output converter for DDR and DDRII memory modules. It uses a 10 A synchronous buck converter to provide the core voltage (VDDQ) for DDR memory modules. The EVM is designed to use a 4.5 V to 28 V supply voltage and a 4.75 V to (...)
封装 | 引脚 | CAD 符号、封装和 3D 模型 |
---|---|---|
TSSOP (DBT) | 30 | Ultra Librarian |
订购和质量
- RoHS
- REACH
- 器件标识
- 引脚镀层/焊球材料
- MSL 等级/回流焊峰值温度
- MTBF/时基故障估算
- 材料成分
- 鉴定摘要
- 持续可靠性监测
- 制造厂地点
- 封装厂地点
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