Home Power management Power stages Gallium nitride (GaN) power stages

LMG3522R030

ACTIVE

650-V 30-mΩ GaN FET with integrated driver, protection and temperature reporting

Product details

VDS (max) (V) 650 RDS(on) (mΩ) 30 ID (max) (A) 55 Features Cycle-by-cycle overcurrent protection, Latched overcurrent protection, Overtemperature protection, PWM temperature reporting, Top-side cooled Rating Catalog Operating temperature range (°C) -40 to 150
VDS (max) (V) 650 RDS(on) (mΩ) 30 ID (max) (A) 55 Features Cycle-by-cycle overcurrent protection, Latched overcurrent protection, Overtemperature protection, PWM temperature reporting, Top-side cooled Rating Catalog Operating temperature range (°C) -40 to 150
VQFN (RQS) 52 144 mm² 12 x 12
  • 650V GaN-on-Si FET with integrated gate driver
    • Integrated high precision gate bias voltage
    • 200V/ns FET hold-off
    • 2MHz switching frequency
    • 20V/ns to 150V/ns slew rate for optimization of switching performance and EMI mitigation
    • Operates from 7.5V to 18V supply
  • Robust protection
    • Cycle-by-cycle overcurrent and latched short-circuit protection with < 100ns response
    • Withstands 720V surge while hard-switching
    • Self-protection from internal overtemperature and UVLO monitoring
  • Advanced power management
    • Digital temperature PWM output
    • LMG3526R030 includes zero-voltage detection (ZVD) feature that facilitates soft-switching converters
  • Top-side cooled 12mm × 12mm VQFN package separates electrical and thermal paths for lowest power loop inductance
  • 650V GaN-on-Si FET with integrated gate driver
    • Integrated high precision gate bias voltage
    • 200V/ns FET hold-off
    • 2MHz switching frequency
    • 20V/ns to 150V/ns slew rate for optimization of switching performance and EMI mitigation
    • Operates from 7.5V to 18V supply
  • Robust protection
    • Cycle-by-cycle overcurrent and latched short-circuit protection with < 100ns response
    • Withstands 720V surge while hard-switching
    • Self-protection from internal overtemperature and UVLO monitoring
  • Advanced power management
    • Digital temperature PWM output
    • LMG3526R030 includes zero-voltage detection (ZVD) feature that facilitates soft-switching converters
  • Top-side cooled 12mm × 12mm VQFN package separates electrical and thermal paths for lowest power loop inductance

The LMG352xR030 GaN FET with integrated driver and protection is targeted at switch-mode power converters and enables designers to achieve new levels of power density and efficiency.

The LMG352xR030 integrates a silicon driver that enables switching speed up to 150V/ns. TI’s integrated precision gate bias results in higher switching SOA compared to discrete silicon gate drivers. This integration, combined with TI’s low-inductance package, delivers clean switching and minimal ringing in hard-switching power supply topologies. Adjustable gate drive strength allows control of the slew rate from 20V/ns to 150V/ns, which can be used to actively control EMI and optimize switching performance. The LMG3526R030 includes the zero-voltage detection (ZVD) feature which provides a pulse output from the ZVD pin when zero-voltage switching is realized.

Advanced power management features include digital temperature reporting and fault detection. The temperature of the GaN FET is reported through a variable duty cycle PWM output, which simplifies managing device loading. Faults reported include overcurrent, short-circuit, overtemperature, VDD UVLO, and high-impedance RDRV pin.

The LMG352xR030 GaN FET with integrated driver and protection is targeted at switch-mode power converters and enables designers to achieve new levels of power density and efficiency.

The LMG352xR030 integrates a silicon driver that enables switching speed up to 150V/ns. TI’s integrated precision gate bias results in higher switching SOA compared to discrete silicon gate drivers. This integration, combined with TI’s low-inductance package, delivers clean switching and minimal ringing in hard-switching power supply topologies. Adjustable gate drive strength allows control of the slew rate from 20V/ns to 150V/ns, which can be used to actively control EMI and optimize switching performance. The LMG3526R030 includes the zero-voltage detection (ZVD) feature which provides a pulse output from the ZVD pin when zero-voltage switching is realized.

Advanced power management features include digital temperature reporting and fault detection. The temperature of the GaN FET is reported through a variable duty cycle PWM output, which simplifies managing device loading. Faults reported include overcurrent, short-circuit, overtemperature, VDD UVLO, and high-impedance RDRV pin.

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Technical documentation

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Type Title Date
* Data sheet LMG352xR030 650 V 30 mΩ GaN FET With Integrated Driver, Protection, and Temperature Reporting datasheet (Rev. A) PDF | HTML 23 May 2024
Application note Implementation of Single-Phase Off-Grid Inverter With Digital Control Using PLECS Simulation PDF | HTML 15 Apr 2024
Technical article 高轉換速率的負載暫態測試 PDF | HTML 20 Mar 2024
Technical article 높은 회전율로 부하 과도 테스트 PDF | HTML 20 Mar 2024
Analog Design Journal 以高密度、GaN 最佳化 PFC 轉換器解決 AC 壓降復原問題 PDF | HTML 18 Mar 2024
Analog Design Journal 고밀도 GaN 최적화 PFC 컨버터에서 AC 드롭아웃 복구 문제 해결 PDF | HTML 18 Mar 2024
Technical article Load transient testing with high slew rates PDF | HTML 19 Dec 2023
Analog Design Journal Solving AC dropout recovery in a high-density GaN-optimized PFC converter PDF | HTML 19 Sep 2023
Technical article The benefits of GaN for battery test systems PDF | HTML 07 Oct 2022

Design & development

For additional terms or required resources, click any title below to view the detail page where available.

Daughter card

LMG3522EVM-042 — LMG3522R030-Q1 automotive 650-V 30-mΩ GaN FET with integrated driver daughter card

LMG3522EVM-042 configures two LMG3522R030 GaN FETs in a half bridge with the cycle-by-cycle over current protection, latched short circuit protection function and all the necessary auxiliary peripheral circuitry. This EVM is designed to work in conjunction with larger systems.

User guide: PDF
Not available on TI.com
Simulation model

LMG3522R030 PSpice Model

SNOM770.ZIP (644 KB) - PSpice Model
CAD/CAE symbol

LMG3522R030 Step File

SNOR033.ZIP (701 KB)
Calculation tool

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Calculation tool

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Supported products & hardware

Supported products & hardware

Products
Gallium nitride (GaN) power stages
LMG3410R050 600-V 50-mΩ GaN with integrated driver and protection LMG3410R070 600-V 70mΩ GaN with integrated driver and protection LMG3410R150 600-V 150-mΩ GaN with integrated driver and overcurrent protection LMG3411R050 600-V 50mΩ GaN with integrated driver and cycle-by-cycle overcurrent protection LMG3411R070 600-V 70-mΩ GaN with integrated driver and cycle-by-cycle overcurrent protection LMG3411R150 600-V 150-mΩ GaN with integrated driver and cycle-by-cycle overcurrent protection LMG3422R030 600-V 30-mΩ GaN FET with integrated driver, protection and temperature reporting LMG3422R050 600-V 50-mΩ GaN FET with integrated driver, protection and temperature reporting LMG3522R030 650-V 30-mΩ GaN FET with integrated driver, protection and temperature reporting LMG3522R030-Q1 Automotive 650-V 30-mΩ GaN FET with integrated driver, protection and temperature reporting LMG3526R030 650-V 30-mΩ GaN FET with integrated driver, protection and zero-voltage detection
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PMP23249 — 650-V 30-mΩ GaN FET daughter card reference design

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VQFN (RQS) 52 Ultra Librarian

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